Automated control thread determination based upon post-process consideration
View Patent ↗A method, apparatus, and a system for determining a control thread based upon a process result are provided. At least one post-process parameter is received. The post parameter relates to a first workpiece upon which a plurality of processes have been performed by a plurality of processing tools. A combination of at least a portion of the plurality of processing tools is selected based upon the post-process parameter.
1. A method, comprising:
receiving at least one post-process parameter relating to a first workpiece upon which a plurality of processes have been respectively performed by a plurality of processing tools; and
selecting a combination of at least a portion of said plurality of processing tools based upon said post-process parameter.
2. The method of claim 1 , further comprising processing a second workpiece based upon said combination of said plurality of processing tools.
3. The method of claim 2 , further comprising processing a subsequent workpiece.
4. The method of claim 1 , wherein providing said first workpiece comprises providing a semiconductor wafer.
5. The method of claim 1 , further comprising correlating said post process parameter to said combination of tools used to process said first workpiece.
6. The method of claim 1 , wherein receiving said post-process parameter relating to said first workpiece comprises receiving an end of line parameter.
7. The method of claim 1 , wherein receiving said post-process parameter relating to said first workpiece comprises receiving a yield parameter.
8. The method of claim 1 , wherein receiving said yield parameter further comprise receiving at least one of a sort yield parameter and a class yield parameter.
9. The method of claim 1 , wherein receiving said post-process parameter relating to said workpiece comprises receiving a performance parameter.
10. The method of claim 1 , wherein selecting said combination of said at least a portion of said plurality of processing tools comprises selecting a control thread.
11. The method of claim 1 , wherein selecting said combination of said at least a portion of said plurality of processing tools comprises performing a statistical analysis.
12. A method, comprising:
performing a plurality of processes upon a workpiece;
receiving an end of line parameter relating to said workpiece; and
determining a combination of at least two processing tools based upon said end of line parameter.
13. The method of claim 12 , wherein receiving said end of line parameter relating to said workpiece further comprises receiving at least one of a yield parameter and a performance parameter.
14. A method, comprising:
performing a plurality of processes upon a first workpiece using a first combination of tools;
acquiring a first end of line parameter relating to said first workpiece;
performing a plurality of processes upon a second workpiece using upon a second combination of tools;
acquiring a second end of line parameter relating to said second workpiece;
selecting at least one of said first and second combination of tools for processing an additional workpiece based upon said first and second end of line parameters.
15. The method of claim 14 , further comprising processing additional workpieces.
16. A method, comprising:
performing a plurality of processes upon a first workpiece using a first combination of tools;
acquiring a first end of line parameter relating to said first workpiece;
performing a plurality of processes upon a second workpiece using upon a second combination of tools;
acquiring a second end of line parameter relating to said second workpiece;
determining a third combination of tools for processing a third workpiece based upon said first and second end of line parameters.
17. The method of claim 16 , further comprising processing additional workpieces.
18. The method of claim 15 , wherein determining said third combination of tools further comprises performing a statistical analysis to provide a predetermined third end of line parameter.
19. A method, comprising:
processing a first workpiece based upon a first control thread;
acquiring a first end of line parameter relating to said first workpiece;
processing a second workpiece based upon a second control thread;
acquiring a second end of line parameter relating to said second workpiece;
comparing said first and second end of line parameters; and
selecting at least one of said first control thread and said second control thread for processing additional workpieces based upon said comparing of said first and second end of line parameters.
20. The method of claim 19 , further comprising processing additional workpieces.
21. The method of claim 19 , wherein selecting at least one of said first control thread and said second control thread further comprises performing a statistical analysis based upon a comparison of at least one of a yield and parameter and a performance parameter.
22. A system, comprising:
a plurality of processing tools for processing a first workpiece based upon a first control thread, and processing a second workpiece based upon a second control thread;
a device for determining at least one of a first end of line parameter relating to said first workpiece and a second end of line parameter relating to said second workpiece and
a controller to select at least one of said first control thread and said second control thread based upon a comparison of said first end of line parameter and said second end of line parameter.
23. The system of claim 22 , wherein said processing tool being adopted to process a subsequent workpiece.
24. The system of claim 23 , further comprising a statistical analysis unit to perform a statistical analysis to generate a third control thread to process said subsequent workpiece.
25. The system of claim 22 , wherein said first and second end of line parameter is at least one of a yield parameter and a performance parameter.
26. The system of claim 22 , said controller being further adapted to determine a baseline end of line parameter based upon a baseline tool combination.
27. The system of claim 22 , wherein said first workpiece is a semiconductor wafer and said second workpiece is a semiconductor wafer.
28. An apparatus, comprising:
a controller to select at least one of said first control thread used to process a first workpiece and a second control thread used to process a second workpiece, said controller to select in response to a comparison of a first end of line parameter associated with said first workpiece and a second end of line parameter associated with said second workpiece.
29. The apparatus of claim 28 , said controller being capable of performing a statistical analysis to generate a third control thread for processing a third workpiece.
30. The apparatus of claim 28 , wherein said first workpiece is a semiconductor wafer and said second workpiece is a semiconductor wafer.
31. An apparatus, comprising:
means for receiving at least one post-process parameter relating to a first workpiece upon which a plurality of processes has been performed by a plurality of processing tools; and
means for selecting a combination of said plurality of processing tools based upon said post-process parameter.
32. A computer readable program storage device encoded with instructions that, when executed by a computer, performs a method, comprising:
receiving at least one post-process parameter relating to a first workpiece upon which a plurality of processes has been performed by a plurality of processing tools; and
selecting a combination of said plurality of processing tools based upon said post-process parameter.
33. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 31 , further comprising correlating said post process parameter to said combination of tools used to process said first workpiece.
34. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 31 , wherein receiving said post-process parameter relating to said first workpiece further comprises receiving at least one of a yield parameter and a performance parameter.
35. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 31 , wherein selecting said combination relating to said plurality of processing tools further comprises selecting a control thread.
36. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 31 , further comprising processing a subsequent workpiece.