IP Library Granted Patent US 7,289,863
Granted Patent B2
US 7,289,863 · App. 11/206,675 · Granted Oct 30, 2007

System and method for electronic diagnostics of a process vacuum environment

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Quick Facts
Patent No.
US 7,289,863
App. No.
11/206,675
Granted
Oct 30, 2007
Kind
B2
Abstract

In one embodiment according to the invention, there is disclosed a method of identifying a source of a vacuum quality problem in a vacuum environment associated with a tool. The method comprises gathering and storing vacuum environment data; identifying an anomaly within the vacuum environment; determining a tool component operating state when the anomaly likely occurred; and determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.

Claims (56)

1. A method of identifying a source of a vacuum quality problem in a vacuum environment associated with a tool, the method comprising:

gathering and storing vacuum environment data;

identifying an anomaly within the vacuum environment;

determining a tool component operating state when the anomaly likely occurred; and

determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.

2. A method according to claim 1 , wherein the vacuum environment is in a semiconductor manufacturing tool.

3. A method according to claim 1 , wherein the step of determining the source of the vacuum quality problem is further based on state of vacuum equipment.

4. A method according to claim 3 wherein the step of determining the source of the vacuum quality problem is further based on history of the state of the vacuum environment.

5. A method according to claim 4 , wherein the step of determining the source of the vacuum quality problem is further based on history of tool state.

6. A method according to claim 5 wherein the step of determining the source of the vacuum quality problem is further based on history of vacuum equipment.

7. A method according to claim 1 wherein the step of determining the source of the vacuum quality problem is further based on history of the state of the vacuum environment.

8. A method according to claim 1 , wherein the step of determining the source of the vacuum quality problem is further based on history of tool state.

9. A method according to claim 1 wherein the step of determining the source of the vacuum quality problem is further based on history of vacuum equipment.

10. A method according to claim 1 wherein the step of identifying comprises analyzing vacuum environment history and tool state history.

11. A method according to claim 10 wherein the step of analyzing vacuum environment history includes analysis of one or more measurements from a group consisting of a pressure rate of a rise, base pressure, base pressure trend, residual gas analysis, operating pressure, operating pressure history, and pressure recovery curve.

12. A method according to claim 1 wherein the anomaly is a change in base pressure.

13. A method according to claim 1 wherein the anomaly is a change in pressure rate of rise.

14. A method according to claim 1 wherein the source of anomaly is identified prior to failure for preventative maintenance.

15. A method according to claim 1 wherein the steps of identifying the anomaly and determining the source of the vacuum quality problem are by means of automatic data analysis.

16. A method according to claim 1 further comprising providing automatic electronic notification of the source of the vacuum quality problem.

17. A method according to claim 1 wherein the step of determining the source of the vacuum quality problem is further based on a general tool operating state.

18. A method according to claim 17 wherein the general tool operating state includes a state from a group consisting of idling, turned off, qualification, pumpdown, and processing.

19. A method according to claim 1 wherein the tool component operating state is determined by sensing the tool component operating state.

20. A method according to claim 1 wherein the tool component operating state is determined by analysis of the vacuum environment data.

21. A method according to claim 1 , wherein the tool component operating state is determined by analyzing impulse data from an accelerometer.

22. A system for identifying a source of a vacuum quality problem in a vacuum environment associated with a tool, the system comprising at least one computer for:

gathering and storing vacuum environment data;

identifying an anomaly within the vacuum environment;

determining a tool component operating state when the anomaly likely occurred; and

determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.

23. A system according to claim 22 , wherein the vacuum environment is in a semiconductor manufacturing tool.

24. A system according to claim 22 , wherein the step of determining the source of the vacuum quality problem is further based on state of vacuum equipment.

25. A system according to claim 24 wherein the step of determining the source of the vacuum quality problem is further based on history of the state of the vacuum environment.

26. A system according to claim 25 , wherein the step of determining the source of the vacuum quality problem is further based on history of tool state.

27. A system according to claim 26 wherein the step of determining the source of the vacuum quality problem is further based on history of vacuum equipment.

28. A system according to claim 22 wherein the step of determining the source of the vacuum quality problem is further based on history of the state of the vacuum environment.

29. A system according to claim 22 , wherein the step of determining the source of the vacuum quality problem is further based on history of tool state.

30. A system according to claim 22 wherein the step of determining the source of the vacuum quality problem is further based on history of vacuum equipment.

31. A system according to claim 22 wherein the step of identifying comprises analyzing vacuum environment history and tool state history.

32. A system according to claim 31 wherein the step of analyzing includes analysis of one or more measurements from a group consisting of a pressure rate of a rise, base pressure, base pressure trend, residual gas analysis, operating pressure, operating pressure history, and pressure recovery curve.

33. A system according to claim 22 wherein the anomaly is a change in base pressure.

34. A system according to claim 22 wherein the anomaly is a change in pressure rate of rise.

35. A system according to claim 22 wherein the source of anomaly is identified prior to failure for preventative maintenance.

36. A system according to claim 22 wherein the steps of identifying the anomaly and determining the source of the vacuum quality problem are by means of automatic data analysis.

37. A system according to claim 22 further comprising providing automatic electronic notification of the source of the vacuum quality problem.

38. A system according to claim 22 wherein the step of determining the source of the vacuum quality problem is further based on a general tool operating state.

39. A system according to claim 38 wherein the general tool operating state includes a state from a group consisting of idling, turned off, qualification, pumpdown, and processing.

40. A system according to claim 22 wherein the tool component operating state is determined by sensing the tool component operating state.

41. A system according to claim 22 wherein the tool component operating state is determined by analysis of the vacuum environment data.

42. A system according to claim 22 , wherein the tool component operating state is determined by analyzing impulse data from an accelerometer.

43. A computer-readable medium carrying one or more sequences of instructions for identifying a source of a vacuum quality problem in a vacuum environment associated with a tool, wherein execution of the one or more sequences of instructions by one or more processors causes the one or more processors to perform the steps of:

gathering and storing vacuum environment data;

identifying an anomaly within the vacuum environment;

determining a tool component operating state when the anomaly likely occurred; and

determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.

44. A computer-readable medium as claimed in claim 43 wherein the execution of the one or more sequences of instructions causes the one or more processors to perform the further step of providing automatic electronic notification of the source of the vacuum quality problem.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Jul 2, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: BROOKS AUTOMATION, INC.; BIOSTORAGE TECHNOLOGIES, INC.
Reel/Frame 049669/0578 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2019
From: BROOKS AUTOMATION, INC.
To: EDWARDS VACUUM LLC
Reel/Frame 049648/0016 →
PARTIAL RELEASE OF SECURITY INTEREST IN SPECIFIED PATENTS AND SPECIFIED TRADEMARKS Recorded Jul 1, 2019
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: BROOKS AUTOMATION, INC.; BIOSTORAGE TECHNOLOGIES, INC.
Reel/Frame 049643/0411 →
SECURITY INTEREST Recorded Oct 6, 2017
From: BROOKS AUTOMATION, INC.; BIOSTORAGE TECHNOLOGIES, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 044142/0258 →
SECURITY AGREEMENT Recorded May 31, 2016
From: BROOKS AUTOMATION, INC.; BIOSTORAGE TECHNOLOGIES
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 038891/0765 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2006
From: HELIX TECHNOLOGY CORPORATION
To: BROOKS AUTOMATION, INC.
Reel/Frame 017176/0706 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2005
From: ARRUDA, JOSEPH D.; KEAY, KATHLEEN D.; GILCHRIST, GLEN F.R.
To: HELIX TECHNOLOGY CORPORATION
Reel/Frame 016964/0885 →