IP Library Granted Patent US 7,520,797
Granted Patent B2
US 7,520,797 · App. 11/221,376 · Granted Apr 21, 2009

Platen endpoint window with pressure relief

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Quick Facts
Patent No.
US 7,520,797
App. No.
11/221,376
Granted
Apr 21, 2009
Kind
B2
Abstract

A polish pad ( 40, 42 ) and platen ( 50 ) assembly for use in chemical mechanical polishing of semiconductor devices includes a platen ( 50 ) having a vented endpoint window ( 62, 72, 82 ) with one or more venting passageways (e.g., 64, 66 ) and/or a grooved or channeled platen surface ( 176 ) to prevent air pressure buildup in the air gap ( 46 ) by discharging or venting air through one or more vent pathways ( 52 ) formed in the platen to provide a pathway to ambient or sub-ambient environment. The air permeable construction of the vented endpoint window ( 72 ) provides pressure relief for the air gap ( 46 ) between the pad endpoint window ( 44 ) and the vented endpoint window ( 72 ), but may also include passages ( 75, 76 ) that are filled with an air permeable hydrophobic material which protects the underlying endpoint detection system ( 30, 32 ) from contamination during cleaning of the platen endpoint window ( 72 ).

Claims (31)

1. A method for performing chemical mechanical polishing, comprising;

assembling a polishing pad assembly by applying a polishing pad to an upper surface of a platen, where the platen comprises a vented platen endpoint window and at least one vent pathway formed through the platen for relieving pressure between the polishing pad and the vented platen endpoint window to an external environment; and

performing chemical mechanical polishing on a polish structure by placing the polishing pad assembly in polishing contact with the polish structure.

2. The method of claim 1 , where the vented platen endpoint window comprises one or more passageways for relieving air pressure between the vented platen endpoint window and the polishing pad.

3. The method of claim 1 , where the vented platen endpoint window comprises one or more passageways which are at least partly formed with an air permeable material for relieving air pressure between the vented platen endpoint window and the polishing pad.

4. The method of claim 1 , where the vented platen endpoint window is formed with an air permeable material for relieving air pressure between the vented platen endpoint window and the polishing pad.

5. The method of claim 1 , where vented platen endpoint window comprises one or more passageways to provide air flow from between the vented platen endpoint window and the polishing pad and to the vent pathway.

6. The method of claim 1 , where the platen comprises a groove pattern formed in the upper surface of a platen which does not extend to any peripheral edge of the upper surface of the platen and which is connected through the vent pathway to the external environment, such that air between the vented platen endpoint window and the polishing pad is able to vent through the vent pathway without allowing contaminants from the chemical mechanical polishing to infiltrate between the platen and the polishing pad.

7. The method of claim 1 , where assembling a polishing pad assembly comprises:

adhesively affixing the polishing pad to the upper surface of the platen; and

venting any air from between the polishing pad and the vented platen endpoint window through an air passage formed in the vented platen endpoint window and through the vent pathway and to an external environment without allowing contaminants from the chemical mechanical polishing to infiltrate between the platen and the polishing pad.

8. The method of claim 7 , further comprising venting any air from between the polishing pad and the vented platen endpoint window through a groove pattern formed in the upper surface of a platen and to an external environment.

9. A method for assembling a polishing pad assembly for use in performing a chemical mechanical polish process, comprising;

providing a polishing pad in which is formed a pad endpoint window;

adhesively affixing the polishing pad to a first surface of a platen, where the platen comprises:

a vented platen endpoint window, and

at least one passageway forming an air pathway between the vented platen endpoint window and an external environment; and

venting air from between the pad endpoint window and the platen endpoint window through the vented platen endpoint window and the passageway formed in the platen to an external environment.

10. The method of claim 9 , further comprising venting air from between the pad endpoint window and the platen endpoint window through one or more interconnected channels formed in the first surface of the platen which are enclosed by a peripheral sealing region on the first surface of the platen.

11. The method of claim 9 , where the vented platen endpoint window comprises a diffuser window which is permeable to air.

12. An apparatus for use in performing chemical mechanical polishing, comprising:

a platen comprising a vented platen endpoint window and an upper surface for adhesive attachment of a polishing pad; and

at least one vent pathway formed in the platen to connect the vented platen endpoint window with an opening in the platen, such that air between the vented platen endpoint window and the polishing pad is able to vent through the vented platen endpoint window and the vent pathway without allowing contaminants from the polishing process to infiltrate between the platen and the polishing pad.

13. The apparatus of claim 12 , where the vent pathway is connected to an ambient environment.

14. The apparatus of claim 12 , where the vented platen endpoint window comprises a diffuser window in which is formed one or more passageways for alleviating pressure buildup between the vented platen endpoint window and the polishing pad.

15. The apparatus of claim 12 , where the vented platen endpoint window comprises a diffuser window in which is formed at least one passageway that is at least partially filled with an air permeable hydrophobic material.

16. The apparatus of claim 12 , where the vented platen endpoint window comprises a diffuser window formed from an air permeable material.

17. The apparatus of claim 12 , where the vented platen endpoint window comprises a diffuser window formed from an air permeable hydrophobic material.

18. The apparatus of claim 12 , further comprising a predetermined groove pattern formed in the upper surface of the platen without extending to any peripheral edge of the upper surface of the platen so that air between the vented platen endpoint window and the polishing pad is able to vent through the predetermined groove pattern.

19. The apparatus of claim 18 , where the predetermined groove pattern comprises a pattern of concentric circles in combination with an X-shaped groove which are positioned to intersect with the vent pathway.

20. The apparatus of claim 12 , where the vented platen endpoint window comprises a diffuser window which is vented through a predetermined groove pattern formed in the upper surface of the platen and connected to the vent pathway so that air pressure between the diffuser window and the polishing pad is able to vent through the predetermined groove pattern.

Assignments (27)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0823 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →