IP Library Granted Patent US 7,393,418
Granted Patent B2
US 7,393,418 · App. 11/231,938 · Granted Jul 1, 2008

Susceptor

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Quick Facts
Patent No.
US 7,393,418
App. No.
11/231,938
Granted
Jul 1, 2008
Kind
B2
Abstract

A susceptor at least a surface thereof being coated with SiC, includes a recess where an wafer is mounted, the recess having an round portion disposed on a lower portion of an outer circumferential portion of the recess, a ring-shaped SiC crystal growth surface portion provided within the round portion in a range of 0.05 mm or more and 0.3 mm or less defined from an outer circumference vertical portion of the recess and a contact portion, where the susceptor contacts with the wafer on the recess, having a surface roughness Ra in a range of 0.5 μm or more and 3 μm or less.

Claims (9)

1. A susceptor for use in growing semiconductor wafers, comprising:

a base which comprises

at least one surface, comprising a recess formed in the coated surface for mounting a wafer the recess comprising a generally flat floor region defining a contact portion for the wafer, an outer circumferential vertical portion, and a rounded transitional portion providing a transition between a lower portion of the outer circumferential vertical portion of the recess and the generally flat floor region of the recess;

a layer of SiC coating the surface and the recess; a second ring-shaped SiC crystal growth surface portion provided within the rounded transitional portion located at a distance within a range of 0.05 mm to 0.3 mm less defined from the outer circumference vertical portion of the recess and

wherein a surface roughness Ra in the contact portion, where the susceptor contacts the wafer is within on the recess, having a surface roughness Ra in a range of 0.5 μm 3 μm less.

2. The susceptor according to claim 1 , wherein an outer circumference planar portion extending from the outer circumferential vertical portion of the recess and at least partially or forming a surface of the susceptor has an irregularly shaped surface having an arithmetic average roughness Ra in a range of 0.05 μm to 0.5 μm.

3. The susceptor according to claim 2 , comprising five recesses, wherein the outer circumference planar portion occupies 70% or more of the surface of the susceptor excluding the recesses.

4. The susceptor according to claim 2 , comprising one recess, wherein the outer circumference planar portion covers the entire surface of the susceptor excluding the recesses.

5. The susceptor according to claim 1 , wherein the second ring-shaped SiC crystal growth layer comprises a non-polished surface portion.

Assignments (4)
CHANGE OF NAME Recorded May 2, 2024
From: COORSTEK KK
To: COORSTEK GK
Reel/Frame 067565/0354 →
CHANGE OF NAME & ADDRESS Recorded Apr 11, 2016
From: COVALENT MATERIALS CORPORATION
To: COORSTEK KK
Reel/Frame 038399/0880 →
MERGER Recorded Sep 12, 2007
From: TOSHIBA CERAMICS CO., LTD.
To: COVALENT MATERIALS CORPORATION
Reel/Frame 019805/0793 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2005
From: YOKOGAWA, MASANARI
To: TOSHIBA CERAMICS CO., LTD.
Reel/Frame 017024/0291 →