IP Library Granted Patent US 7,180,083
Granted Patent B2
US 7,180,083 · App. 11/238,828 · Granted Feb 20, 2007

EUV light source collector erosion mitigation

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Quick Facts
Patent No.
US 7,180,083
App. No.
11/238,828
Granted
Feb 20, 2007
Kind
B2
Abstract

An EUV light source collector erosion mitigation system and method is disclosed which may comprise a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma; a replacement material generator positioned to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction. The replacement material generator may comprise a plurality of replacement material generators positioned to respectively deliver replacement material to a selected portion of the collector outer surface, which may comprise a sputtering mechanism sputtering replacement capping material onto the collector outer surface.

Claims (31)

1. An EUV light source collector erosion mitigation system comprising:

a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma;

a replacement material generator positioned to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction.

2. The apparatus of claim 1 further comprising:

the replacement material generator comprises a plurality of replacement material generators positioned to respectively deliver replacement material to a selected portion of the collector outer surface.

3. The apparatus of claim 1 further comprising:

the replacement material generator comprises a sputtering mechanism sputtering replacement capping material onto the collector outer surface.

4. The apparatus of claim 2 further comprising:

the replacement material generator comprises a sputtering mechanism sputtering replacement capping material onto the collector outer surface.

5. The apparatus of claim 1 further comprising:

an EUV light detector providing an indication of the EUV reflectivity of the collector;

a replacement material generator control mechanism controlling the delivery of replacement material to the collector outer surface.

6. The apparatus of claim 2 further comprising:

an EUV light detector providing an indication of the EUV reflectivity of the collector;

a replacement material generator control mechanism controlling the delivery of replacement material to the collector outer surface.

7. The apparatus of claim 3 further comprising:

an EUV light detector providing an indication of the EUV reflectivity of the collector;

a replacement material generator control mechanism controlling the delivery of replacement material to the collector outer surface.

8. The apparatus of claim 4 further comprising:

an EUV light detector providing an indication of the EUV reflectivity of the collector;

a replacement material generator control mechanism controlling the delivery of replacement material to the collector outer surface.

9. The apparatus of claim 5 further comprising:

the replacement material generator controlling mechanism controls the rate of delivery of the replacement material.

10. The apparatus of claim 6 further comprising:

the replacement material generator controlling mechanism controls the rate of delivery of the replacement material.

11. The apparatus of claim 7 further comprising:

the replacement material generator controlling mechanism controls the rate of delivery of the replacement material.

12. The apparatus of claim 8 further comprising:

the replacement material generator controlling mechanism controls the rate of delivery of the replacement material.

13. An EUV light source collector erosion mitigation method for a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma, the method comprising:

utilizing a replacement material generator to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2014
From: CYMER, LLC
To: ASML NETHERLANDS B.V.
Reel/Frame 032745/0216 →
MERGER Recorded Mar 12, 2014
From: CYMER, INC.
To: CYMER, LLC
Reel/Frame 032416/0794 →