IP Library Granted Patent US 7,371,677
Granted Patent B2
US 7,371,677 · App. 11/240,241 · Granted May 13, 2008

Laterally grown nanotubes and method of formation

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Quick Facts
Patent No.
US 7,371,677
App. No.
11/240,241
Granted
May 13, 2008
Kind
B2
Abstract

A semiconductor device has lateral conductors or traces that are formed of nanotubes such as carbon. A sacrificial layer is formed overlying the substrate. A dielectric layer is formed overlying the sacrificial layer. A lateral opening is formed by removing a portion of the dielectric layer and the sacrificial layer which is located between two columns of metallic catalysts. The lateral opening includes a neck portion and a cavity portion which is used as a constrained space to grow a nanotube. A plasma is used to apply electric charge that forms an electric field which controls the direction of formation of the nanotubes. Nanotubes from each column of metallic catalyst are laterally grown and either abut or merge into one nanotube. Contact to the nanotube may be made from either the neck portion or the columns of metallic catalysts.

Claims (42)

1. A method of laterally growing nanotubes comprising:

forming a lateral opening which extends between two metallic catalysts, the lateral opening comprising a neck portion and a cavity portion; and

using the cavity portion of the lateral opening as a constrained space to grow a nanotube to form a continuous lateral electrical conductor between the two metallic catalysts; and

forming a plasma over the neck portion of the lateral opening to limit growth of the nanotube exclusively to substantially within a straight path between the two metallic catalysts.

2. The method of claim 1 further comprising:

depositing electrical charges from the plasma along the neck portion of the lateral opening and on a lower surface of the cavity portion under the neck portion to induce a radial electric field within the cavity portion of the lateral opening that controls growth direction of the nanotube.

3. The method of claim 1 wherein forming the lateral opening further comprises:

providing a substrate;

forming a sacrificial layer overlying the substrate;

forming an insulating layer overlying the sacrificial layer; and

etching the insulating layer and the sacrificial layer to form the lateral opening by removing the sacrificial layer between the two metallic catalysts.

4. The method of claim 1 further comprising:

providing a substrate;

forming a sacrificial layer overlying the substrate;

forming an insulating layer overlying the sacrificial layer;

etching the insulating layer and the sacrificial layer to form a first opening and a second opening which define a location for the two metallic catalysts;

forming a metallic catalyst material layer within a portion of each of the first opening and the second opening, a portion of the metallic catalyst material layer being exposed to the lateral opening; and

exposing the portion of the metallic catalyst material layer exposed to the lateral opening to a carbon-containing material for stimulating growth of carbon nanotubes within the lateral opening.

5. The method of claim 1 further comprising:

forming the neck portion of the lateral opening substantially in a center of the lateral opening.

6. A method of laterally growing nanotubes, comprising:

forming a lateral opening which extends between two metallic catalysts, the lateral opening comprising a neck portion and a cavity portion; and

using the cavity portion of the lateral opening as a constrained space to grow a nanotube to form a continuous lateral electrical conductor between the two metallic catalysts; and

filling the neck portion with a conductive material to form a via for electrical contact to the continuous lateral electrical conductor.

7. A method of laterally growing nanotubes comprising:

forming a substrate;

forming a sacrificial layer overlying the substrate;

forming a dielectric layer overlying the sacrificial layer;

forming a lateral opening by removing a portion of the dielectric layer and all of the sacrificial layer located between two columns of metallic catalysts, the lateral opening comprising a neck portion formed from the dielectric layer that is removed and a cavity portion formed from the sacrificial layer that is removed;

using the cavity portion of the lateral opening as a constrained space to grow a nanotube in a radial direction from each of the two columns of metallic catalysts to form a continuous lateral electrical conductor between the two columns of metallic catalysts; and

forming a plasma over the neck portion of the lateral opening to limit growth of the nanotube exclusively to substantially within a straight path between the two metallic catalysts, the plasma depositing electrical charges along the neck portion of the lateral opening and on a lower surface of the cavity portion under the neck portion to induce a radial electric field within the cavity portion of the lateral opening that controls growth direction of the nanotube.

8. A method of laterally growing nanotubes, comprising:

forming a substrate;

forming a sacrificial layer overlying the substrate;

forming a dielectric layer overlying the sacrificial layer;

forming a lateral opening by removing a portion of the dielectric layer and all of the sacrificial layer located between two columns of metallic catalysts, the lateral opening comprising a neck portion formed from the dielectric layer that is removed and a cavity portion formed from the sacrificial layer that is removed;

using the cavity portion of the lateral opening as a constrained space to grow a nanotube in a radial direction from each of the two columns of metallic catalysts to form a continuous lateral electrical conductor between the two columns of metallic catalysts; and

filling the neck portion with a conductive material to form a via for electrical contact to the continuous lateral electrical conductor.

9. The method of claim 7 further comprising:

forming the neck portion of the lateral opening substantially in a center of the lateral opening.

10. The method of claim 7 further comprising:

forming a carbon nanotube as the nanotube, the two columns of metallic catalysts comprising one of iron, cobalt, platinum, nickel or molybdenum.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
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To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
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Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
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