Photomask blank, photomask and fabrication method thereof
View Patent ↗A light-shieldable film is formed on one principal plane of an optically transparent substrate, and the light-shieldable film has a first light-shieldable film and a second light-shieldable film overlying the first light-shieldable film. The first light-shieldable film is a film that is not substantially etched by fluorine-based (F-based) dry etching and is primarily composed of chromium oxide, chromium nitride, chromium oxynitride or the like. The second light-shieldable film is a film that is primarily composed of a silicon-containing compound that can be etched by F-based dry etching, such as silicon oxide, silicon nitride, silicon oxynitride, silicon/transition-metal oxide, silicon/transition-metal nitride or silicon/transition-metal oxynitride.
1. A binary photomask blank, comprising a light-shieldable film formed on a substrate that is transparent to exposure light, the light-shieldable film comprising a first light-shieldable film formed on the substrate and a second light-shieldable film overlying the first light-shieldable film,
wherein the first light-shieldable film is a film primarily composed of chromium metal, chromium oxide, chromium nitride, chromium oxynitride, chromium oxycarbide, chromium nitride carbide or chromium oxynitride carbide that is not substantially etched by fluorine-based dry etching and which has a thickness that is equal to or more than 3 nm and equal to or less than 15 nm, and
wherein the second light-shieldable film having an antireflection capability comprises a layer primarily composed of a silicon-containing compound that is capable of being etched by fluorine-based dry etching, and
wherein the optical density of the light-shieldable film comprising the stack of the first and second light-shieldable films to exposure light is 2.5 or higher.
2. The binary photomask blank according to claim 1 , wherein the silicon-containing compound is silicon oxide, silicon nitride, silicon oxynitride, silicon/transition-metal oxide, silicon/transition-metal nitride, or silicon/transition-metal oxynitride.
3. The binary photomask blank according to claim 2 , wherein the transition metal is at least one metal element selected from among titanium (Ti), vanadium (V), cobalt (Go), nickel (Ni), zirconium (Zr), niobium (Nb), molybdenum (Mo), hafnium (Hf), tantalum (Ta), and tungsten (W).
4. The binary photomask blank according to claim 1 , wherein the second light-shieldable film has a thickness that is equal to or more than 10 nm and equal to or less than 55 nm.
5. The binary photomask blank according to claim 4 , wherein the second light-shieldable film has a thickness that is equal to or more than 25 nm and equal to or less than 55 nm.
6. A photomask that is fabricated using a binary photomask blank according to claim 5 .
7. The binary photomask blank according to claim 1 , wherein the extinction coefficient k of the second light-shieldable film at a wavelength of the exposure light has a profile that gradually decreases from the side of the substrate to the surface of the second light-shieldable film.
8. The binary photomask blank according to claim 1 , wherein at least one of the first light-shieldable film and the second light-shieldable film has a multilayer structure comprising a plurality of layers stacked successively.
9. A photomask that is fabricated using a binary photomask blank according to claim 8 .
10. A photomask that is fabricated using a binary photomask blank according to claim 1 .
11. The binary photomask blank according to claim 5 , wherein at least one of the first light-shieldable film and the second light-shieldable film has a multilayer structure comprising a plurality of layers stacked successively.
12. A photomask blank, comprising an optical film formed on a substrate that is transparent to exposure light and a light-shieldable film formed on the optical film,
wherein the light-shieldable film comprises a first light-shieldable film formed on the optical film and a second light-shieldable film overlying the first light-shieldable film,
wherein the first light-shieldable film comprises a layer primarily composed of chromium metal, chromium oxide, chromium nitride, chromium oxynitride, chromium oxycarbide, chromium nitride carbide or chromium oxynitride carbide that is not substantially etched by fluorine-based dry etching and which has a thickness that is equal to or more than 3 nm and equal to or less than 15 nm, and
wherein the second light-shieldable film comprises a layer primarily composed of a silicon-containing compound that is capable of being etched by fluorine-based dry etching.
13. The photomask blank according to claim 12 , wherein the optical film is a half-tone phase shift layer, and the half-tone phase shift layer is made of silicon oxide, silicon nitride, silicon oxynitride, silicon/transition-metal oxide, silicon/transition-metal nitride or silicon/transition-metal oxynitride.
14. The photomask blank according to claim 13 , wherein the optical film is a film capable of being etched by fluorine-based dry etching, and the time (clear time) required for etching off the optical film by fluorine-based dry etching under the same condition as the second light-shieldable film is longer than the clear time for the second light-shieldable film.
15. The binary photomask blank according to claim 13 , wherein the second light-shieldable film has a thickness that is equal to or more than 10 nm and equal to or less than 55 nm.
16. The photomask blank according to claim 13 , wherein at least one of the first light-shieldable film and the second light-shieldable film has a multilayer structure comprising a plurality of layers stacked successively.
17. A photomask that is fabricated using a photomask blank according to claim 13 .
18. The photomask blank according to claim 12 , wherein the optical film is a film capable of being etched by fluorine-based dry etching, and the time (clear time) required for etching off the optical film by fluorine-based dry etching under the same condition as the second light-shieldable film is longer than the clear time for the second light-shieldable film.
19. A photomask that is fabricated using a photomask blank according to claim 18 .
20. The photomask blank according to claim 12 , wherein the second light-shieldable film has a thickness that is equal to or more than 10 nm and equal to or less than 55 nm.
21. A photomask that is fabricated using a photomask blank according to claim 20 .
22. The photomask blank according to claim 12 , wherein at least one of the first light-shieldable film and the second light-shieldable film has a multilayer structure comprising a plurality of layers stacked successively.
23. A photomask that is fabricated using a photomask blank according to claim 22 .
24. A photomask that is fabricated using a photomask blank according to claim 12 .