IP Library Granted Patent US 7,359,236
Granted Patent B2
US 7,359,236 · App. 11/276,758 · Granted Apr 15, 2008

Read, write and erase circuit for programmable memory devices

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Quick Facts
Patent No.
US 7,359,236
App. No.
11/276,758
Granted
Apr 15, 2008
Kind
B2
Abstract

A circuit for writing, reading, and erasing a programmable device is disclosed. The programmable device includes an ion conductor and a plurality of electrodes. Electrical properties of the device are altered by applying a sufficient bias across the electrode to form a conductive region within the ion conductor. The circuit can be used to program and read multiple bits within a single programmable device.

Claims (28)

1. A circuit for programming a programmable elements, comprising:

an array of programmable elements, wherein at least one element of the array of programmable elements is capable of being programmed to multiple resistance states;

an equalization circuit switchably coupled to the at least one element;

a current comparator switchably coupled to the at least one element;

a decoder coupled to the current comparator;

a first voltage source;

a first current source coupled to the first voltage source and switchably connected to the at least one element;

a second voltage source;

a second current source coupled to the second voltage source and switchably connected to the at least one element; and

a third current source coupled to the second voltage source and switchably connected to the at least one element.

2. A circuit for writing information to a programmable element in an array, the circuit comprising:

an array of programmable elements, wherein each element comprises a ion conductor and two electrodes

a common bias portion for generating a current for programming one of said elements;

a current selection portion, including at least one transistor, coupled to the common bias portion;

a first transistor coupled to a first portion of the array for selecting a row of elements; and

a second transistor coupled to a second portion of the array for selecting a column of elements, wherein the current selection portion includes multiple transistors to generate multiple output currents, and wherein the resistance of a selected element is determined by one of the multiple output currents.

3. The circuit for writing information to a programmable element of claim 2 , wherein the array of programmable elements coupled together with a common anode.

4. The circuit for writing information to a programmable element of claim 2 , wherein the array of programmable elements coupled together with a common cathode.

5. A circuit for erasing information to a programmable element in an array, the circuit comprising:

an array of programmable elements, wherein each element comprises a ion conductor and two electrodes

a common bias portion for generating a current for programming one of said elements;

a current selection portion, including at least one transistor, coupled to the common bias portion;

a first transistor coupled to a first portion of the array for selecting a row of elements;

a second transistor coupled to a second portion of the array for selecting a column of elements; and

a third and fourth transistor to replicate the current from the current selection portion, and wherein the current selection portion includes multiple transistors to generate multiple output currents, and wherein the resistance of a selected element is determined by one of the multiple output currents.

6. The circuit for erasing information to a programmable element in an array of claim 5 , further comprising a fifth and sixth transistor, wherein the third, fourth, fifth, and sixth transistors replicate the current from the current selection portion.

7. The circuit for erasing information to a programmable element of claim 5 , wherein the array of programmable elements coupled together with a common anode.

8. The circuit for erasing information to a programmable element of claim 5 , wherein the array of programmable elements coupled together with a common cathode.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Sep 24, 2019
From: OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 050480/0836 →
RELEASE OF SECURITY INTEREST Recorded May 9, 2019
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 049125/0970 →
SECURITY INTEREST Recorded May 8, 2018
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
Reel/Frame 046105/0731 →
RELEASE OF SECURITY INTEREST Recorded Oct 3, 2017
From: WESTERN ALLIANCE BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 044219/0610 →
SECURITY INTEREST Recorded May 22, 2015
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 035754/0580 →
RELEASE OF SECURITY INTEREST Recorded Oct 15, 2013
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 031414/0232 →
SECURITY AGREEMENT Recorded Oct 7, 2013
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: BRIDGE BANK, NATIONAL ASSOCIATION
Reel/Frame 031371/0581 →
SECURITY AGREEMENT Recorded Oct 8, 2012
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 029090/0922 →