Patent Assignment
Reel/Frame 046105/0731
Security Interest
Recorded: 2018-05-08
Pages: 21
Assignors
ADESTO TECHNOLOGIES CORPORATION
Executed: 2018-05-08
ARTEMIS ACQUISITION LLC
Executed: 2018-05-08
Assignee
OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
C/O TENNENBAUM CAPITAL PARTNERS, LLC, 2951 28TH STREET, SUITE 1000, SANTA MONICA, CALIFORNIA, 90405
Covered Properties
(173)
Low power voltage regulator circuit for use in an integrated circuit device
Patent:
6,320,454 →
Application:
09/586,664 →
Reference cell for high speed sensing in non-volatile memories
Patent:
6,411,549 →
Application:
09/602,108 →
Row Decoder Circuit for Use in Programming a Memory Device
Patent:
6,621,745 →
Application:
10/174,632 →
Method of Programming a Multi-Level Memory Device
Method of Establishing Reference Levels for Sensing Multilevel Memory Cell States
Patent:
6,618,297 →
Application:
10/211,437 →
Method of Recovering Overerased Bits in a Memory Device
Method for Identification of Spi Compatible Serial Memory Devices
Current Sense Amplifier
Dual Stage Voltage Regulation Circuit
Method and Apparatus of a Smart Decoding Scheme for Fast Synchronous Read in a Memory System
Functional Register Decoding System for Multiple Plane Operation
Memory System and Process for Controlling a Memory Component to Achieve Different Kinds of Memory Characteristics on One and the Same Memory Component
Approach for Zero Dummy Byte Flash Memory Read Operation
Patent:
6,879,535 →
Application:
10/929,899 →
Method for Fabricating a Semiconductor Memory Cell
Method for Manufacturing an Integrated Circuit Including an Electrolyte Material Layer
Resistively Switching Memory
Semiconductor Memory Component in Cross-Point Architecture
Redundant Column Read in a Memory Array
Method for Operating an Integrated Circuit Having a Resistivity Changing Memory Cell
Method and System for Reducing Soft-Writing in a Multi-Level Flash Memory
Method for Producing Memory Having a Solid Electrolyte Material Region
Channel Discharging After Erasing Flash Memory Devices
Method for Fabricating an Integrated Device Comprising a Structure with a Solid Electrolyte
A Memory Device Including Electrical Circuit Configured to Provide Reversible Bias Across the Pmc Memory Cell to Perform Erase and Write Functions
Memory Having Cbram Memory Cells and Method
Memory Component with Memory Cells Having Changeable Resistance and Fabrication Method Therefor
Resistive Memory Arrangement
Method for Manufacturing a Cbram Semiconductor Memory
Method for Improving the Thermal Characteristics of Semiconductor Memory Cells
Read, Write and Erase Circuit for Programmable Memory Devices
Column/Sector Redundancy Cam Fast Programming Scheme Using Regular Memory Core Array in Multi-Plane Flash Memory Device
Patent:
7,196,952 →
Application:
11/295,878 →
Pmc Memory Circuit and Method for Storing a Datum in a Pmc Memory Circuit
Integrated Semiconductor Memory with an Arrangement of Nonvolatile Memory Cells, and Method
Method for Fabricating a Resistive Memory
Resistive Memory Element with Shortened Erase Time
Solid Electrolyte Memory Element and Method for Fabricating Such a Memory Element
Memory Cell, Memory Device and Method for the Production Thereof
Integrated Circuit Including Resistivity Changing Memory Cells
Memory Cells with an Anode Comprising Intercalating Material and Metal Species Dispersed Therein
Cbram Cell and Cbram Array, and Method of Operating Thereof
Method for Fabricating a Solid Electrolyte Memory Device and Solid Electrolyte Memory Device
Voltage Reference Circuit Using Programmable Metallization Cells
Method for Preventing Over-Erasing of Unused Column Redundant Memory Cells in a Flash Memory Having Single-Transistor Memory Cells
Programmable Memory Device Circuit
Device and Method for Access Time Reduction by Speculatively Decoding Non-Memory Read Commands on a Serial Interface
Implementation of Column Redundancy for a Flash Memory with a High Write Parallelism
Resistive Memory Arrangement
Methods of Manufacturing a Semiconductor Device; Method of Manufacturing a Memory Cell; Semiconductor Device; Semiconductor Processing Device; Integrated Circuit Having a Memory Cell
Integrated Circuit, Method for Manufacturing an Integrated Circuit, Memory Cell Array, Memory Module, and Device
Nor and Nand Memory Arrangement of Resistive Memory Elements
Method of Manufacturing an Integrated Circuit, an Integrated Circuit, and a Memory Module
Read, Write, and Erase Circuit for Programmable Memory Devices
A Memory Device Including Electrical Circuit Configured to Provide Reversible Bias Across the Pmc Memory Cell to Perform Erase and Write Functions
Method and System to Access Memory
Integrated Circuits Having Programmable Metallization Cells (Pmcs) and Operating Methods Therefor
Patent:
8,107,273 →
Application:
12/508,212 →
Variable Impedance Memory Device Having Simultaneous Program and Erase, and Corresponding Methods and Circuits
Patent:
8,274,842 →
Application:
12/566,790 →
Reconfigurable Memory Arrays Having Programmable Impedance Elements and Corresponding Methods
Patent:
8,331,128 →
Application:
12/629,531 →
Conducting Bridge Random Access Memory (CBRAM) Device Structures
Patent:
8,426,839 →
Application:
12/767,552 →
Programmable Impedance Element Circuits and Methods
Patent:
8,294,488 →
Application:
12/767,732 →
Pmc-Based Non-Volatile Cam
Patent:
8,320,148 →
Application:
12/802,506 →
Method for Producing Memory Having a Solid Electrolyte Material Region
Methods and Circuits for Temperature Varying Write Operations of Programmable Impedance Elements
Patent:
8,437,171 →
Application:
12/980,752 →
Method and System to Access Memory
Circuits and Methods Having Programmable Impedance Elements
Patent:
8,947,913 →
Application:
13/114,192 →
Circuits Having Programmable Impedance Elements
Patent:
8,687,403 →
Application:
13/157,713 →
Programmable Impedance Elements and Devices That Include Such Elements
Patent:
9,401,472 →
Application:
13/242,391 →
Variable Impedance Memory Device Structure and Method of Manufacture Including Programmable Impedance Memory Cells and Methods of Forming the Same
Patent:
8,829,482 →
Application:
13/242,854 →
Read Methods, Circuits and Systems for Memory Devices
Patent:
8,654,561 →
Application:
13/276,763 →
Memory Devices, Circuits and Methods Having Data Values Based on Dynamic Change in Material Property
Patent:
9,177,639 →
Application:
13/315,652 →
Resistive Memory Devices, Circuits and Methods Having Read Current Limiting
Patent:
9,165,648 →
Application:
13/336,642 →
Methods of Programming and Erasing Programmable Metallization Cells (Pmcs)
Patent:
8,369,132 →
Application:
13/337,004 →
Memory Cell Device and Method of Manufacture
Memory Devices and Methods for Read and Write Operation to Memory Elements Having Dynamic Change in Property
Patent:
9,099,175 →
Application:
13/408,367 →
Read Operations and Circuits for Memory Devices Having Programmable Elements, Including Programmable Resistance Elements
Patent:
8,913,444 →
Application:
13/408,797 →
Programmable Impedance Memory Elements, Methods of Manufacture, and Memory Devices Containing the Same
Patent:
8,847,191 →
Application:
13/431,951 →
Circuits and Methods for Placing Programmable Impedance Memory Elements in High Impedance States
Patent:
8,730,752 →
Application:
13/437,906 →
Variable Impedance Memory Element Structures, Methods of Manufacture, and Memory Devices Containing the Same
Patent:
8,624,219 →
Application:
13/445,389 →
Resistive Switching Memories
Patent:
9,029,829 →
Application:
13/462,659 →
Conductive Filament Based Memory Elements and Methods with Improved Data Retention and/or Endurance
Memory Devices, Architectures and Methods for Memory Elements Having Dynamic Change in Property
Patent:
8,854,873 →
Application:
13/464,926 →
Method of Operating a Resistive Memory Device with a Ramp-Up/Ramp-Down Program/Erase Pulse
Contact Structure and Method for Variable Impedance Memory Element
Erase and Soft Program Within the Erase Operation for a High Speed Resistive Switching Memory Operation with Controlled Erased States
Patent:
8,659,931 →
Application:
13/488,392 →
Resistive Switching Devices Having A Buffer Layer and Methods of Formation Thereof
Patent:
8,866,122 →
Application:
13/517,653 →
METHODS OF PROGRAMMING AND ERASING PROGRAMMABLE METALLIZATION CELLS (PMCs)
Patent:
8,625,331 →
Application:
13/545,792 →
Programmable Memory Elements, Devices and Methods Having Physically Localized Structure
Patent:
8,895,953 →
Application:
13/545,958 →
Programmable Window of Operation for Cbram
Patent:
9,047,948 →
Application:
13/548,429 →
Cbram/Reram with Improved Program and Erase Algorithms
Patent:
8,659,954 →
Application:
13/548,470 →
Resistive Switching Devices Having Alloyed Electrodes And Methods of Formation Thereof
Ultra-Deep Power-Down Mode for Memory Devices
Variable Impedance Memory Device Biasing Circuits and Methods
Patent:
8,498,164 →
Application:
13/594,756 →
Memory Devices, Circuits and, Methods That Apply Different Electrical Conditions in Access Operations
Memory Devices, Circuits and, Methods That Apply Different Electrical Conditions in Access Operations
Memory Cells, Devices and Method with Dynamic Storage Elements and Programmable Impedance Shadow Elements
Patent:
8,995,173 →
Application:
13/603,373 →
Resistive Devices and Methods of Operation Thereof
Multi-Port Memory Devices and Methods Having Programmable Impedance Elements
Resistive Switching Memory
Memory Devices and Methods Having Write Data Permutation for Cell Wear Reduction
Application:
13/626,721 →
Publication:
US 2014/0089560
Safeguarding Data Through an Smt Process
Patent:
9,007,808 →
Application:
13/628,385 →
Pmc-Based Non-Volatile Cam
Patent:
8,659,926 →
Application:
13/647,534 →
Programmable Impedance Element Circuits and Methods
Patent:
9,159,414 →
Application:
13/657,568 →
Resistive Devices and Methods of Operation Thereof
Patent:
9,001,553 →
Application:
13/670,385 →
Coding Techniques for Reducing Write Cycles for Memory
Integrated Circuit Devices and Systems Having Programmable Impedance Elements with Different Response Types
Patent:
8,675,396 →
Application:
13/710,329 →
Network Interface with Logging
Verify Pulse Delay to Improve Resistance Window
Patent:
9,019,745 →
Application:
13/743,939 →
Circuits and Methods for Programming Variable Impedance Elements
Patent:
8,976,568 →
Application:
13/745,711 →
Two Terminal Resistive Access Devices and Methods of Formation Thereof
Patent:
9,373,786 →
Application:
13/748,470 →
Reverse Program and Erase Cycling Algorithms
Patent:
8,995,167 →
Application:
13/757,275 →
Pre-Conditioning Circuits and Methods for Programmable Impedance Elements in Memory Devices
Patent:
9,025,396 →
Application:
13/763,461 →
Resistive Switching Devices and Methods of Formation Thereof
Sensing Data in Resistive Switching Memory Devices
Resistive Switching Devices Having a Switching Layer and an Intermediate Electrode Layer and Methods of Formation Thereof
Storage Elements, Structures and Methods Having Edgeless Features for Programmable Layer(S)
Patent:
9,412,945 →
Application:
13/830,315 →
Memory Cell Device and Method of Manufacture
Fabrication Methods of Conducting Bridge Random Access Memory (Cbram) Device Structures
Patent:
9,306,161 →
Application:
13/845,922 →
System Architecture with Multiple Memory Types, Including Programmable Impedance Memory Elements
Patent:
9,147,464 →
Application:
13/846,539 →
Solid Electrolyte Memory Elements with Electrode Interface for Improved Performance
Solid Electrolyte Based Memory Devices and Methods Having Adaptable Read Threshold Levels
Triggered Cell Annihilation for Resistive Switching Memory Devices
Patent:
9,053,789 →
Application:
13/859,853 →
Current Source Circuits and Methods for Mass Write and Testing of Programmable Impedance Elements
Patent:
8,947,907 →
Application:
13/862,390 →
Common Plate Switching Reduction in Resistive Switching Memory Devices
Patent:
9,336,868 →
Application:
13/909,983 →
Memory Elements and Methods with Improved Data Retention and/or Endurance
Latch Circuits and Methods with Programmable Impedance Elements
Patent:
9,330,755 →
Application:
14/176,123 →
Programmable Impedance Memory Elements and Corresponding Methods
Application:
14/195,787 →
Publication:
US 2014/0293676
Application of Relaxation Voltage Pulses to Programmble Impedance Elements During Read Operations
Patent:
9,007,814 →
Application:
14/197,541 →
Nonvolatile Memory Elements Having Conductive Structures with Semimetals and/or Semiconductors
Circuits Having Programmable Impedance Elements and Vertical Access Devices
Patent:
9,343,667 →
Application:
14/231,729 →
Resistive Switching Memory Device with Diode Select
Patent:
9,099,176 →
Application:
14/256,123 →
Resistive Switching Memory Device Architecture for Reduced Cell Damage During Processing
Patent:
9,437,815 →
Application:
14/265,548 →
Circuits and Methods for Placing Programmable Impedance Memory Elements in High Impedance States
Patent:
9,368,198 →
Application:
14/281,830 →
Capacitor Arrangements Using a Resistive Switching Memory Cell Structure
Patent:
9,368,206 →
Application:
14/325,119 →
Programmable Impedance Memory Elements with Laterally Extending Cell Structure
Patent:
8,952,351 →
Application:
14/447,322 →
Serial Memory Device Alert of an External Host to Completion of an Internally Self-Timed Operation
Memory Cells with Vertically Integrated Tunnel Access Device and Programmable Impedance Element
Patent:
9,391,270 →
Application:
14/530,460 →
Resistive Switching Memory
Read Operations and Circuits for Memory Devices Having Programmable Elements, Including Programmable Resistance Elements
Patent:
9,570,166 →
Application:
14/572,646 →
Resistive Devices and Methods of Operation Thereof
Resistive Switching Memory with Cell Access by Analog Signal Controlled Transmission Gate
Verify Pulse Delay to Improve Resistance Window
Patent:
9,208,876 →
Application:
14/663,719 →
Cached Memory Structure and Operation
Patent:
10,031,869 →
Application:
14/665,831 →
Prototyping Integrated Circuit Devices with Programmable Impedance Elements
Patent:
9,373,398 →
Application:
14/686,403 →
Ultra-Deep Power-Down Mode for Memory Devices
Concurrent Read and Write Operations in a Serial Flash Device
Memory Devices and Methods for Storing Single Data Value in Multiple Programmable Resistance Elements
Patent:
9,721,658 →
Application:
14/791,416 →
Resistive Switching Memory Having a Resistor, Diode, and Switch Memory Cell
Patent:
9,530,495 →
Application:
14/819,014 →
Resistive Memory Device with Ramp-Up/Ramp-Down Program/Erase Pulse
System Architectures with Data Transfer Paths Between Different Memory Types
Patent:
9,455,036 →
Application:
14/868,363 →
Write Parameter Switching in a Memory Device
Patent:
10,191,666 →
Application:
14/875,464 →
Methods for Setting a Resistance of Programmable Resistance Memory Cells and Devices Including the Same
Patent:
9,613,693 →
Application:
14/927,352 →
Resistive Switching Devices Having a Switching Layer and an Intermediate Electrode Layer and Methods of Formation Thereof
Read Latency Reduction in a Memory Device
Dual Program State Cycling Algorithms for Resistive Switching Memory Device
Patent:
9,524,777 →
Application:
15/071,567 →
Circuits and Systems Having Low Power Power-on-Reset and/or Brown Out Detection
Patent:
9,729,138 →
Application:
15/085,904 →
Programmable Impedance Memory Device and Related Methods
Patent:
10,181,496 →
Application:
15/143,310 →
Methods of Making Memory Devices with Programmable Impedance Elements and Vertically Formed Access Devices
Patent:
9,755,142 →
Application:
15/155,301 →
Methods of Fabricating Storage Elements and Structures Having Edgeless Features for Programmable Layer(S)
Patent:
9,595,671 →
Application:
15/214,224 →
Support for Improved Throughput in a Memory Device
Memory Devices and Methods Having Instruction Acknowledgement
Memory Device Ultra-Deep Power-Down Mode Exit Control
Automatic Resumption of Suspended Write Operation Upon Completion of Higher Priority Write Operation in a Memory Device
Patent:
10,042,587 →
Application:
15/457,819 →
Memory Device Alert of Completion of Internally Self-Timed Power-Up and Reset Operations
Patent:
10,539,989 →
Application:
15/458,122 →
Memory Device Having Multiple Read Buffers for Read Latency Reduction
Memory Elements Having Conductive Cap Layers and Methods Therefor
Concurrent Read and Reconfigured Write Operations in a Memory Device
Ultra-Deep Power Down Mode Control in a Memory Device
Nonvolatile Memory Elements Having Conductive Structures with Semimetals and/or Semiconductors
Application:
15/650,719 →
Publication:
US 2018/0033960
Methods of Operating Integrated Circuit Devices Having Volatile and Nonvolatile Memory Portions
Patent:
10,446,747 →
Application:
15/693,360 →
Read Latency Reduction in a Memory Device
Offset Test Pads for Wlcsp Final Test
Automatic Switch to Single Spi Mode When Entering Udpd
Memory Device Having Programmable Impedance Elements with a Common Conductor Formed Below Bit Lines
Reference Schemes for Resistive Memories
Application:
62/531,488 →
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 3, 2012
From: ECHEVERRY, JUAN PABLO SAENZ; KAMALANATHAN, DEEPAK
To: ADESTO TECHNOLOGIES CORPORATION
Reel/Frame 028148/0129 →
Corrective Assignment to Correct the Name of Assignee Previously Recorded on Reel 028148 Frame 0129. Assignor(S) Hereby Confirms the Assignment of Assignor's Interest (See Document for Details)..
Jul 18, 2012
From: ECHEVERRY, JUAN PABLO SAENZ; KAMALANATHAN, DEEPAK
To: ADESTO TECHNOLOGIES CORPORATION
Reel/Frame 028594/0529 →
Security Agreement
Oct 8, 2012
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 029090/0922 →
Assignment of Assignor's Interest
Jan 10, 2013
From: ATMEL CORPORATION
To: ARTEMIS ACQUISITION LLC
Reel/Frame 029605/0665 →
Security Agreement
Oct 7, 2013
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: BRIDGE BANK, NATIONAL ASSOCIATION
Reel/Frame 031371/0581 →
Release of Security Interest
Oct 15, 2013
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 031414/0232 →
Security Interest
May 22, 2015
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 035754/0580 →
Release of Security Interest
Oct 3, 2017
From: WESTERN ALLIANCE BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 044219/0610 →
Release of Security Interest
May 9, 2019
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 049125/0970 →
Release of Security Interest
Sep 24, 2019
From: OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 050480/0836 →
Release of Security Interest
Jul 12, 2022
From: VENTURE LENDING & LEASING IX, INC.; WTI FUND X, INC.
To: PARALLEL WIRELESS, INC.
Reel/Frame 060900/0022 →
Assignment of Assignor's Interest
Mar 16, 2023
From: RENESAS DESIGN US INC. (FORMERLY KNOWN AS DIALOG SEMICONDUCTOR US INC. AS SUCCESSOR-IN-INTEREST TO ADESTO TECHNOLOGIES CORPORATION AND ARTEMIS ACQUISITION, LLC)
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 062999/0839 →