IP Library Granted Patent US 7,829,134
Granted Patent B2
US 7,829,134 · App. 11/153,964 · Granted Nov 9, 2010

Method for producing memory having a solid electrolyte material region

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Quick Facts
Patent No.
US 7,829,134
App. No.
11/153,964
Granted
Nov 9, 2010
Kind
B2
Abstract

A method for producing a solid electrolyte material region for a memory element of a solid electrolyte memory cell. A first material is formed in substantially pure form. A thermal treatment is carried out in the presence of at least one second material, and the chalcogenide material of the solid electrolyte material region thereby being produced.

Claims (50)

1. A method for producing a solid electrolyte material region for a memory element of a solid electrolyte memory cell comprising:

providing a substrate having an electrode formed on a surface of the substrate;

forming a chalcogenide material on the electrode, including

forming at least one first material region on the electrode from a first elementary material in a solid form on which the chalcogenide material is based, in a substantially pure form, to provide a structure, and

thermally treating the structure in the presence of at least one second elementary material on which the chalcogenide material is based to form the chalcogenide material consisting of the first elementary material and the second elementary material, the chalcogenide material having a free surface;

forming a second electrode on the free surface; and

wherein the at least one second elementary material on which the chalcogenide material is based includes SeS 2 O.

2. The method of claim 1 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a further material region.

3. The method of claim 1 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a process atmosphere.

4. The method of claim 1 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a liquid.

5. The method of claim 1 , comprising carrying out the thermal treatment thermally.

6. The method of claim 1 , comprising using a laser to carry out thermally the thermal treatment in the context of an irradiation.

7. The method of claim 6 , comprising using the laser in a localized manner.

8. The method of claim 1 , comprising carrying out the thermal treatment using a furnace process.

9. The method of claim 1 , comprising carrying out the thermal treatment using an RTA process.

10. The method of claim 1 , comprising:

progressively depositing a plurality of layers of the first elementary material and of the at least one second elementary material on which the chalcogenide material is based progressively; and

then carrying out the thermal treatment step.

11. A method for producing a solid electrolyte material region for a memory element of a solid electrolyte memory cell comprising:

providing a substrate having an electrode formed on a surface of the substrate;

forming a chalcogenide material on the electrode, including

forming at least one first material region on the electrode from a first elementary material in a solid form on which the chalcogenide material is based, in a substantially pure form, to provide a structure, and

thermally treating the structure in the presence of at least one second elementary material on which the chalcogenide material is based to form the chalcogenide material consisting of the first elementary material and the second elementary material, the chalcogenide material having a free surface; and

forming a second electrode on the free surface;

wherein the at least one first material on which the chalcogenide material is based includes a material from the group formed by germanium Ge, silicon Si, and tungsten W; and

wherein the at least one second elementary material on which the chalcogenide material is based includes SeS 2 O.

12. The method of claim 11 , comprising:

providing the at least one second elementary material on which the chalcogenide material is based as a further material region;

using a laser to carry out thermally the thermal treatment in the context of an irradiation; and

using the laser in a localized manner.

13. A method for producing a solid electrolyte material region for a memory element of a solid electrolyte memory cell comprising:

providing a substrate having an electrode formed on a surface of the substrate;

forming a chalcogenide material on the electrode, including

forming at least one first material region on the electrode from at least one first material in a solid form on which the chalcogenide material is based, in a substantially pure form, to provide a structure, and

thermally treating the structure in the presence of at least one second material on which the chalcogenide material is based to form the chalcogenide material having a free surface; and

forming a second electrode on the free surface;

wherein the at least one second material on which the chalcogenide material is based includes Se 2 S 2 O.

14. A method for producing a memory cell comprising:

producing a memory element having a solid electrolyte material region, including;

providing a substrate having an electrode formed on a surface of the substrate;

forming a chalcogenide material on the electrode, including

forming at least one first material region on the electrode from a first elementary material in a solid form on which the chalcogenide material is based, in a substantially pure form, to provide a structure, and

thermally treating the structure in the presence of at least one second elementary material on which the chalcogenide material is based to form the chalcogenide material consisting of the first elementary material and the second elementary material, the chalcogenide material having a free surface;

forming a second electrode on the free surface; and

wherein the at least one second elementary material on which the chalcogenide material is based includes SeS 2 O.

15. The method of claim 14 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a further material region.

16. The method of claim 14 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a process atmosphere.

17. The method of claim 16 , comprising providing the at least one second elementary material on which the chalcogenide material is based as a liquid.

18. The method of claim 17 , comprising carrying out the thermal treatment using an RTA process.

19. The method of claim 17 , comprising using a laser to carry out thermally the thermal treatment in the context of an irradiation.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Sep 24, 2019
From: OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 050480/0836 →
RELEASE OF SECURITY INTEREST Recorded May 9, 2019
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 049125/0970 →
SECURITY INTEREST Recorded May 8, 2018
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OBSIDIAN AGENCY SERVICES, INC., AS COLLATERAL AGENT
Reel/Frame 046105/0731 →
RELEASE OF SECURITY INTEREST Recorded Oct 3, 2017
From: WESTERN ALLIANCE BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 044219/0610 →
SECURITY INTEREST Recorded May 22, 2015
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 035754/0580 →
RELEASE OF SECURITY INTEREST Recorded Oct 15, 2013
From: OPUS BANK
To: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
Reel/Frame 031414/0232 →
SECURITY AGREEMENT Recorded Oct 7, 2013
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: BRIDGE BANK, NATIONAL ASSOCIATION
Reel/Frame 031371/0581 →
SECURITY AGREEMENT Recorded Oct 8, 2012
From: ADESTO TECHNOLOGIES CORPORATION; ARTEMIS ACQUISITION LLC
To: OPUS BANK
Reel/Frame 029090/0922 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 8, 2010
From: QIMONDA AG
To: ADESTO TECHNOLOGY CORPORATION
Reel/Frame 024953/0554 →
CONTRIBUTION AGREEMENT (RELEVANT PARTS; ENGLISH TRANSLATION) Recorded Oct 6, 2009
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023330/0771 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2005
From: PINNOW, CAY-UWE; UFERT, KLAUS-DIETER
To: INFINEON TECHNOLOGIES AG
Reel/Frame 016790/0121 →