IP Library Granted Patent US 7,629,559
Granted Patent B2
US 7,629,559 · App. 11/305,073 · Granted Dec 8, 2009

Method of improving electrical connections in circuitized substrates

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Quick Facts
Patent No.
US 7,629,559
App. No.
11/305,073
Granted
Dec 8, 2009
Kind
B2
Abstract

A method of improving conductive paste connections in a circuitized substrate in which at least one and preferably a series of high voltage pulses are applied across the paste and at least one and preferably a series of high current pulses are applied, both series of pulses applied separately. The result is an increase in the number of conductive paths through the paste connections from those present prior to the pulse applications and a corresponding resistance reduction in said connections.

Claims (18)

1. A method of improving an electrical connection within a circuitized substrate wherein said electrical connection includes conductive paste as a conductive medium, said method comprising:

applying at least one high voltage pulse, of from about one hundred volts to about one thousand volts given a resistance exceeding fifty ohms, across said conductive paste of said electrical connection; and

applying at least one high current pulse, of from about one amp to about ten amps, across said conductive paste of said electrical connection, said high voltage and high current pulses being applied separately.

2. The method of claim 1 , wherein said at least one high voltage pulse is applied prior to said applying said at least one high current pulse.

3. The method of claim 1 , wherein said at least one high voltage pulse is applied for a time period less than the time period said at least one high current pulse is applied.

4. The method of claim 3 , wherein said time period for applying said at least one high voltage pulse is from about ten milliseconds to about one-thousand milliseconds and said time period for applying said at least one high current pulse is from about five-hundred milliseconds to about one-thousand milliseconds.

5. The method of claim 1 , wherein the amperage of said at least one high voltage pulse is less than the amperage of said at least one high current pulse.

6. The method of claim 5 , wherein said amperage of said at least one high voltage pulse is from about 0.001 amps to about 0.02 amps.

7. The method of claim 1 , wherein the voltage of said at least one high current pulse is lower than the voltage of said at least one high voltage pulse.

8. The method of claim 7 , wherein said voltage of said at least one high current pulse is from about one volt to about thirty volts.

9. The method of claim 1 , wherein said at least one high voltage pulse causes arcs to form between at least some of said conductive paste particles sufficiently to form more conductive paths through said conductive paste than were present prior to said applying of said at least one high voltage pulse.

10. The method of claim 9 , wherein said at least one high current pulse heats said conductive paste sufficiently to form more conductive paths through said conductive paste than were formed following said application of said at least one high voltage pulse.

11. The method of claim 1 , wherein said applying of said at least one high current pulse across said conductive paste of said electrical connection occurs following said applying of said at least one high voltage pulse across said conductive paste and is sufficient to heat said conductive paste so as to cause said conductive paste to form a liquidus ball.

12. The method of claim 1 , wherein the number of said high voltage pulses is from one to about one hundred.

13. The method of claim 1 , wherein the number of said high current pulses is from about one-hundred to about five-hundred.

14. The method of claim 1 , wherein said conductive paste includes metallic particles as part thereof.

15. The method of claim 14 , wherein said applying of said at least one high voltage pulse does not result in the sintering of said metallic particles of said conductive paste and said applying of said high current pulse does result in the sintering of at least some of said particles.

16. The method of claim 15 , wherein said at least some of said metallic particles which are sintered from said applying of said high current pulse are silver particles.

Assignments (11)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2019
From: I3 ELECTRONICS, INC.
To: TTM TECHNOLOGIES NORTH AMERICA, LLC
Reel/Frame 049758/0265 →
SECURITY INTEREST Recorded Nov 14, 2016
From: I3 ELECTRONICS, INC.
To: M&T BANK
Reel/Frame 040608/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2015
From: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
To: I3 ELECTRONICS, INC.
Reel/Frame 035442/0569 →
RELEASE OF SECURITY INTEREST Recorded Feb 26, 2015
From: MAINES, WILLIAM; MAINES, DAVID
To: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
Reel/Frame 035098/0968 →
SECURITY AGREEMENT Recorded Jun 12, 2013
From: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
To: MAINES, WILLIAM; MAINES, DAVID
Reel/Frame 030599/0918 →
SECURITY AGREEMENT Recorded May 6, 2013
From: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.; EI TRANSPORTATION COMPANY LLC; ENDICOTT MEDTECH, INC.; INTEGRIAN HOLDINGS, LLC
To: M&T BANK
Reel/Frame 030359/0057 →
ASSIGNMENT OF SECURITY AGREEMENT Recorded Mar 6, 2013
From: PNC BANK, NATIONAL ASSOCIATION
To: INTEGRIAN HOLDINGS, LLC
Reel/Frame 029938/0823 →
SECURITY AGREEMENT Recorded May 14, 2012
From: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.; EI TRANSPORTATION COMPANY LLC; ENDICOTT MEDTECH, INC.
To: PNC BANK, NATIONAL ASSOCIATION
Reel/Frame 028230/0798 →
RELEASE BY SECURED PARTY Recorded May 14, 2012
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
Reel/Frame 028230/0611 →
SECURITY AGREEMENT Recorded Dec 3, 2008
From: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 021912/0908 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2005
From: DESAI, SUBAHU D.; LAUFFER, JOHN M.; LIN, HOW T.; MARKOVICH, VOYA R.; SMITH, RONALD V.
To: ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
Reel/Frame 017383/0163 →