IP Library Granted Patent US 7,323,806
Granted Patent B2
US 7,323,806 · App. 11/316,675 · Granted Jan 29, 2008

Piezoelectric thin film element

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Quick Facts
Patent No.
US 7,323,806
App. No.
11/316,675
Granted
Jan 29, 2008
Kind
B2
Abstract

A thin-film piezoelectric element has a substrate, a lower electrode, a piezoelectric portion, and an upper electrode that are sequentially formed on the substrate. The piezoelectric portion has a dielectric thin film that has an alkali niobium oxide-based perovskite structure expressed by general formula (Na x K y Li z )NbO 3 (0<x<1, 0<y<1, 0≦z<1, x+y+z=1), and a high voltage-withstand dielectric that has a dielectric strength voltage greater than that of the dielectric thin film.

Claims (25)

1. A thin-film piezoelectric element, comprising:

a substrate, a lower electrode, a piezoelectric portion, and an upper electrode that are sequentially formed on the substrate,

wherein the piezoelectric portion comprises a dielectric thin film that comprises an alkali niobium oxide-based perovskite structure expressed by general formula (Na x K y Li z )NbO 3 (0<x<1, 0<y<1, 0≦z<1, x+y+z=1), and a high voltage-withstand dielectric that has a dielectric strength voltage greater than that of the dielectric thin film.

2. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric is inserted in a layered form between the dielectric thin film and the lower or upper electrode.

3. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric is inserted in a layered form between the dielectric thin film and the lower electrode and between the dielectric thin film and the upper electrode, respectively.

4. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric is inserted in a layered form in the dielectric thin film.

5. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric is mixed as an additive in the dielectric thin film.

6. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric comprises SrTiO 3 , α-Al 2 O 3 , Ta 2 O 5 , or SiO 2 .

7. The thin-film piezoelectric element according to claim 1 , wherein:

the high voltage-withstand dielectric has a dielectric strength voltage of 1 MV/cm or higher.

8. The thin-film piezoelectric element according to claim 1 , wherein:

the substrate comprises a MgO monocrystalline substrate or a Si substrate.

9. The thin-film piezoelectric element according to claim 1 , wherein:

at least one of the substrate, the lower electrode, the piezoelectric portion and the upper electrode comprises a microfabrication with a width of 1 mm or less.

10. The thin-film piezoelectric element according to claim 1 , wherein:

at least one of the lower electrode, the piezoelectric portion and the upper electrode is formed by RF magnetron sputtering.

11. The thin-film piezoelectric element according to claim 1 , wherein:

at least one of the lower electrode, the piezoelectric portion and the upper electrode is formed by aerosol deposition.

12. The thin-film piezoelectric element according to claim 1 , wherein:

the piezoelectric portion is sandwiched between the upper electrode and the lower electrode.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2016
From: SCIOCS COMPANY LIMITED
To: SUMITOMO CHEMICAL COMPANY, LIMITED
Reel/Frame 037827/0453 →
COMPANY SPLIT Recorded Jul 24, 2015
From: HITACHI METALS, LTD.
To: SCIOCS COMPANY LIMITED
Reel/Frame 036181/0104 →
MERGER AND CHANGE OF NAME Recorded Dec 15, 2014
From: HITACHI CABLE, LTD.; HITACHI METALS, LTD.
To: HITACHI METALS, LTD.
Reel/Frame 034630/0897 →