IP Library Granted Patent US 7,262,092
Granted Patent B2
US 7,262,092 · App. 11/326,243 · Granted Aug 28, 2007

High-voltage CMOS-compatible capacitors

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Quick Facts
Patent No.
US 7,262,092
App. No.
11/326,243
Granted
Aug 28, 2007
Kind
B2
Abstract

A high-voltage stacked capacitor includes a first capacitor and a second capacitor. Each capacitor includes a first plate having a first semiconductive body and a second plate having a floating electrode. The first and second semiconductive bodies are electrically isolated from each other. The floating electrode includes an intercapacitor node configured to self-adjust to a value less than a working voltage impressed on the stacked capacitor.

Claims (4)

1. A process for charging a floating electrode of a stacked capacitor, comprising: coupling a first potential to a first electrode of the stacked capacitor, the first electrode being coupled to a first semiconductive body; coupling a second potential to a second electrode of the stacked capacitor, the second electrode being coupled to a second semiconductive body that is electrically isolated from the first semiconductive body, a difference between the first and second potentials comprising a working voltage of the stacked capacitor; and charging a floating electrode to a floating voltage whose value is less than the working voltage, wherein the floating electrode is capacitively coupled to the first and second semiconductive bodies and includes an intercapacitor node.

2. The process of claim 1 , further comprising storing the floating voltage on the floating electrode following removal of the first and second potentials from the stacked capacitor.

3. The process of claim 1 , wherein the act of charging comprises tunneling charge carriers through a dielectric, wherein the dielectric includes a first portion disposed between the first semiconductive body and a corresponding portion of the floating electrode and the dielectric includes a second portion disposed between the second semiconductive body and a corresponding portion of the floating electrode.

4. The process of claim 1 , wherein the acts of coupling first and second potentials comprise coupling the first and second potentials to first and second electrodes of the stacked capacitor, and wherein the stacked capacitor comprises a plurality of PFETs, NFETs or MOSCAPs, or any combination thereof coupled to the common intercapacitor node.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2010
From: VIRAGE LOGIC CORPORATION; VL C.V.; ARC CORES LIMITED; ARC INTERNATIONAL I.P., INC.; ARC INTERNATIONAL INTELLECTUAL PROPERTY, INC.; ARC INTERNATIONAL LIMITED, FORMERLY ARC INTERNATIONAL PLC; ARC INTERNATIONAL (UK) LIMITED
To: SYNOPSYS, INC.
Reel/Frame 025105/0907 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2010
From: DIORIO, CHRISTOPHER J.; BERNARD, FREDERIC J.
To: IMPINJ, INC.
Reel/Frame 024294/0618 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2008
From: IMPINJ, INC.
To: VIRAGE LOGIC CORPORATION
Reel/Frame 021637/0351 →