IP Library Granted Patent US 7,709,746
Granted Patent B2
US 7,709,746 · App. 11/331,220 · Granted May 4, 2010

Pb-free solder-connected structure and electronic device

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Quick Facts
Patent No.
US 7,709,746
App. No.
11/331,220
Granted
May 4, 2010
Kind
B2
Abstract

Provided are a bonded structure by a lead-free solder and an electronic article comprising the bonded structure. The bonded structure has a stable bonding interface with respect to a change in process of time, an enough strength and resistance to occurrence of whiskers while keeping good wettability of the solder. In the bonded structure, a lead-free Sn—Ag—Bi alloy solder is applied to an electrode through an Sn—Bi alloy layer. The Sn—Bi alloy, preferably, comprises 1 to 20 wt % Bi in order to obtain good wettability of the solder. In order to obtain desirable bonding characteristics having higher reliability in the invention, a copper layer is provided under the Sn—Bi alloy layer thereby obtaining an enough bonding strength.

Claims (22)

1. An electronic device comprising:

a substrate; and

a semiconductor device having a lead on which a single Sn—Bi alloy layer comprising 1 to 5 wt % Bi is provided,

wherein the substrate and the semiconductor device are connected with each other by utilization of a Pb-free solder, the Pb-free solder being applied to the lead through the single Sn—Bi layer.

2. The electronic device according to claim 1 , wherein the Pb-free solder contains Bi.

3. The electronic device according to claim 1 , wherein the Pb-free solder is of a Sn—Ag—Bi alloy.

4. The electronic device according to claim 1 , wherein the Pb-free solder contains Sn and Ag.

5. The electronic device according to claim 1 , wherein the Pb-free solder contains Sn, Ag and Cu.

6. The electronic device according to claim 1 , wherein the Pb-free solder contains 5 to 25 wt % Bi, 1.5 to 3 wt % Ag and not less than 1 wt % Cu.

7. The electronic device according to claim 1 , wherein material of the lead is an Fe-Ni alloy.

8. The electronic device according to claim 1 , wherein material of the lead is a Cu alloy.

9. The electronic device according to claim 1 , wherein the semiconductor device is a Thin Small Outline Package (TSOP).

10. The electronic device according to claim 1 , wherein the semiconductor device is a Quad Flat Package (QFP).

11. An electronic device comprising:

a substrate; and

a semiconductor device having a lead on which a single Sn—Bi alloy layer comprising 1 to 20 wt % Bi, except for 4 to 15 wt % Bi, is provided,

wherein the substrate and the semiconductor device are connected with each other by utilization of a Pb-free solder, the Pb-free solder being applied to the lead through the single Sn—Bi alloy layer.

12. An electronic device comprising:

a substrate; and

a semiconductor device having a lead on which a single layer is provided, said single layer being a Sn—Bi alloy layer comprising 1 to 20 wt % Bi,

wherein the substrate and the semiconductor device are connected with each other by utilization of a Pb-free solder, the Pb-free solder being applied to the lead through the single Sn—Bi alloy layer.

13. The electronic device according to claim 12 , wherein said Sn—Bi alloy layer comprises 1 to 5 wt % Bi.

Assignments (3)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
MERGER/CHANGE OF NAME Recorded Aug 31, 2011
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 026837/0505 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2009
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 022774/0406 →