IP Library Granted Patent US 7,445,967
Granted Patent B2
US 7,445,967 · App. 11/336,368 · Granted Nov 4, 2008

Method of packaging a semiconductor die and package thereof

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Quick Facts
Patent No.
US 7,445,967
App. No.
11/336,368
Granted
Nov 4, 2008
Kind
B2
Abstract

A method of packaging a semiconductor die includes the steps of providing a flange ( 110 ), coupling one or more active die ( 341 ) to the flange with a lead-free die attach material ( 350 ), staking a leadframe ( 120 ) to the flange after coupling the one or more active die to the flange, electrically interconnecting the one or more active die and the leadframe with an interconnect structure ( 470 ), and applying a plastic material ( 130 ) over the flange, the one or more active die, the leadframe, and the interconnect structure.

Claims (106)

1. A method of packaging a semiconductor die comprising:

providing a flange;

coupling one or more active die to the flange with a metallurgical material;

after coupling the one or more active die to the flange, mechanically staking a leadframe to the flange;

using wire bonds to electrically interconnect the one or more active die and the leadframe; and

overmolding a plastic material over at least a portion of the flange, the one or more active die, a portion of the leadframe, and the wire bonds,

wherein:

providing the flange further comprises:

providing the flange comprised of a first material and a second material;

the first material is more ductile and thermally conductive than the second material;

the second material is more rigid than the first material; and

the first material is closer to the one or more active die than the second material.

2. The method of claim 1 wherein:

providing die flange further comprises:

providing multiple flanges coupled together in a leadframe-type structure.

3. The method of claim 1 further comprising:

after coupling the one or more active die to the flange, electrically isolating the leadframe from the flange.

4. The method of claim 3 wherein:

providing the flange further comprises:

providing multiple flanges coupled together in a leadframe-type structure.

5. The method of claim 4 wherein

the flange comprises:

a top surface;

a bottom surface opposite the top surface; and

two or more side surfaces coupling the top surface to the bottom surface; and

overmolding the plastic material comprises:

overmolding the plastic material over at least a portion of the top surface of the flange, at least a portion of at least of one of the two or more side surfaces of the flange, the one or more active die, the leadframe, and the wire bonds.

6. The method of claim 5 wherein:

providing the flange further comprises:

providing the flange with at least one feature; and

mechanically staking a leadframe to the flange further comprises:

mechanically staking the leadframe to the at least one feature of the flange.

7. The method of claim 6 wherein:

providing the flange with the at least one feature comprises:

providing the flange with a protrusion; and

the at least one feature comprises the protrusion.

8. The method of claim 1 wherein

the flange comprises:

a top surface:

a bottom surface opposite the top surface; and

two or more side surfaces coupling the top surface to the bottom surface; and

overmolding the plastic material comprises:

overmolding the plastic material over at least a portion of the top surface of the flange, at least a portion of at least of one of the two or more side surfaces of the flange, the one or more active die, the leadframe, and the wire bonds.

9. The method of claim 1 wherein:

providing the flange further comprises:

providing the flange with at least one feature; and

mechanically staking a leadframe to the flange further comprises:

mechanically staking the leadframe to the at least one feature of the flange.

10. The method of claim 9 wherein:

providing the flange with the at least one feature comprises:

providing the flange with a protrusion; and

the at least one feature comprises the protrusion.

11. The method of claim 1 further comprising:

after coupling the one or more active die to the flange, electrically isolating the leadframe from the flange,

wherein:

providing the flange further comprises:

providing the flange with at least one feature; and

mechanically staking a leadframe to the flange further comprises:

mechanically staking the leadframe to the at least one feature of the flange.

12. A method of packaging a semiconductor die comprising:

providing a flange;

coupling one or more active die to the flange with a metallurgical material;

after coupling the one or more active die to the flange, meet mechanically staking a leadframe to the flange;

using wire bonds to electrically interconnect the one or more active die and the leadframe; and

overmolding a plastic material over at least a portion of the flange, the one or more active die, a portion of the leadframe, and the wire bonds,

wherein:

providing the flange further comprises:

providing flange comprised of a first material and a second material;

the first material is more ductile and thermally conductive than the second material;

the second material is more rigid than the first material;

the first material is closer to the one or more active die than the second material;

mechanically staking the leadframe to the flange further comprises:

mechanically staking the first and second materials of the flange together such that the leadframe and the flange are non-coplanar with each other.

13. The method of claim 12 wherein:

providing the flange further comprises:

providing multiple flanges coupled together in a leadframe-type structure.

14. The method of claim 12 further comprising:

after coupling the one or more active die to the flange, electrically isolating the leadframe from the flange.

15. The method of claim 12 wherein

the flange comprises:

a top surface;

a bottom surface opposite the top surface; and

two or more side surfaces coupling the top surface to the bottom surface; and

overmolding the plastic material comprises:

overmolding the plastic material over at least a portion of the top surface of the flange, at least a portion of at least of one of the two or more side surfaces of the flange, the one or more active die, the leadframe, and the wire bonds.

16. The method of claim 12 wherein:

providing the flange further comprises:

providing the flange with at least one feature; and

mechanically staking a leadframe to the flange further comprises:

mechanically staking the leadframe to the at least one feature of the flange.

17. The method of claim 16 wherein:

providing the flange with the at least one feature comprises:

providing the flange with a protrusion; and

the at least one feature comprises the protrusion.

18. The method of claim 17 wherein:

providing the flange further comprises:

providing multiple flanges coupled together in a leadframe-type structure.

19. The method of claim 18 further comprising:

after coupling the one or more active die to the flange, electrically isolating the leadframe from the flange.

20. The method of claim 19 wherein

the flange comprises:

a top surface;

a bottom surface opposite the top surface; and

two or more side surfaces coupling the top surface to the bottom surface; and

overmolding the plastic material comprises:

overmolding the plastic material over at least a portion of the top surface of the flange, at least a portion of at least of one of the two or more side surfaces of the flange, the one or more active die, the leadframe, and the wire bonds.

Assignments (32)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0807 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 12, 2009
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 022380/0409 →
SECURITY AGREEMENT Recorded Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
Reel/Frame 018855/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2006
From: ABDO, DAVID F.; ELLIOTT, ALEXANDER J.; VISWANATHAN, LAKSHMINARAYAN
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 017915/0463 →