Test apparatus and method for testing a circuit unit
View Patent ↗In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is connected to the circuit subunits by means of a connecting unit, test signals are generated for the electric circuit and response signals generated by the electric circuit in response to the test signals are evaluated. The test signals and the response signals are interchanged between the circuit subunits by means of at least one compression/decompression unit associated with at least one of the circuit subunits.
1. A test apparatus for testing an electric circuit, comprising:
a test system for generating test signals and for evaluating response signals which an electric circuit generates in response to said test signals;
a tester channel for connecting said electric circuit to said test system;
said electric circuit comprising a plurality of circuit subunits and a connecting unit being arranged in said electric circuit for connecting said tester channel to said circuit subunits and at least one of said circuit subunits comprising a compression/decompression unit for interchanging said test signals and said response signals between said circuit subunits.
2. The apparatus of claim 1 , wherein said circuit subunits are arranged in a common housing.
3. The apparatus of claim 2 , wherein said common housing is designed as a multichip package.
4. The apparatus of claim 1 , wherein said compression/decompression unit is a 4:16 decompression unit.
5. The apparatus of claim 1 , wherein said compression/decompression unit is a 16:4 compression unit.
6. A method for testing an electric circuit, comprising the steps of:
Connecting an electric circuit to a test system via a tester channel with a connection unit; said electric circuit comprising circuit subunits;
connecting said tester channel to said circuit subunits by means of a connecting unit;
generating test signals for said electric circuit; and
evaluating response signals generated by said electric circuit in response to said test signals; and
interchanging said test signals and said response signals between said circuit subunits by means of at least one compression/decompression unit associated with at least one of said circuit subunits.
7. The method of claim 6 , comprising compressing said test signals supplied by said test system to one of said circuit subunits in said compression/decompression unit.
8. The method of claim 6 , comprising compressing said response signals output by one of said circuit subunits and supplied to said test system in said compression/decompression unit.