Granted Patent B2

US 7,554,861 · App. 11/368,363 · Granted Jun 30, 2009

Abstract

Claims (48)

1. A memory device including a plurality of memory cells, means for comparing a set of selected memory cells with at least one reference cell having a predefined threshold voltage, the means for comparing including biasing means for applying a biasing voltage having a substantially monotonic time pattern to the selected memory cells and the at least one reference cell, means for detecting the reaching of a comparison current by a measure cell current corresponding to each selected memory cell and by a measure reference current corresponding to each reference cell, and means for determining a condition of each selected memory cell according to a temporal relation of the reaching of the comparison current by the corresponding measure cell current and by the as least one measure reference current, wherein

the means for comparing further includes means for selectively modifying at least one of said currents to emulate the comparison with at least one further reference cell having a further threshold voltage.

2. The memory device according to claim 1 , wherein the biasing means includes means for applying a biasing current to a set of first paths and to a second path, each first path including the selected memory cell and the second path including the at least one reference cell.

3. The memory device according to claim 2 , wherein the means for selectively modifying includes means for unbalancing an equivalent resistance of the second path with respect to an equivalent resistance of each first second path.

4. The memory device according to claim 2 wherein the means for selectively modifying includes means for unbalancing an equivalent capacitance of the second path with respect to an equivalent capacitance of each first path.

5. The memory device according to claim 1 wherein the means for selectively modifying includes means for delaying the application of the biasing voltage to the at least one reference cell.

6. The memory device according to claim 5 , wherein the biasing means is responsive to an enabling signal, the means for delaying the application of the biasing voltage including means for delaying the enabling signal.

7. The memory device according to claim 1 wherein the means for selectively modifying includes means for obtaining each measure reference current by combining a current flowing through the corresponding reference cell with an adjusting current.

8. The memory device according to claim 1 wherein the means for selectively modifying includes means for updating the comparison current.

9. The memory device according to claim 1 , further including means for disabling the means for selectively modifying during a read operation of the selected memory cells and for enabling the means for selectively modifying during at least one read operation with a margin of the selected memory cells.

10. A read circuit operable to read a memory cell storing a data value, the circuit comprising:

a sense amplifier operable to

detect when a data signal from the memory cell achieves a first predetermined relationship to a first comparison signal,

detect when a reference signal from a reference cell achieves a second predetermined relationship to a second comparison signal, and

identify the data value stored in the memory cell by determining an order in which the data signal and reference signal respectively achieve the first and second predetermined relationships to the first and second comparison signals; and

a modifier operable to modify a time at which the reference signal achieves the second predetermined relationship to the second comparison signal.

11. The read circuit of claim 10 wherein:

the data signal achieves the first predetermined relationship to the first comparison signal when the data signal becomes greater than the first comparison signal; and the reference signal achieves the second predetermined relationship to the second comparison signal when the reference data signal becomes greater than the second comparison signal.

12. The read circuit of claim 10 wherein the first comparison signal is substantially equal to the second comparison signal.

13. The read circuit of claim 10 wherein the modifier is operable to modify the time at which the reference signal achieves the second predetermined relationship to the second comparison signal by:

generating a modified read signal having substantially the same slope as a read signal that drives the memory cell and having an amplitude that is offset from an amplitude of the read signal; and

driving the reference cell with the modified read signal.

14. The read circuit of claim 10 wherein the modifier is operable to modify the time at which the reference signal achieves the second predetermined relationship to the signal comparison signal by:

generating from a first portion of a bias signal a modified read signal having substantially the same slope as and having a different amplitude than a read signal that is generated from a second portion of the bias signal and that drives the memory cell; and

driving the reference cell with the modified read signal.

15. The read circuit of claim 10 wherein the modifier is operable to modify the time at which the reference signal achieves the second predetermined relationship to the second comparison signal by:

delaying a start signal in response to which is generated a read signal that drives the memory cell;

generating in response to the delay start signal a modified read signal having substantially the same slope and the same amplitude as the read signal; and

driving the reference cell with the modified read signal.

16. The read circuit of claim 10 wherein the modifier is operable to modify the time at which the reference signal achieves the second predetermined relationship to the second comparison signal by:

generating a modifying signal; and

combining the modifying signal with a raw reference signal from the reference cell to generate the reference signal.

17. The read circuit of claim 10 wherein the modifier is operable to modify the time at which the reference signal achieves the second predetermined relationship to the second comparison signal by generating the second comparison signal unequal to the first comparison signal.

18. An integrated circuit, comprising:

a memory cell operable to store a data value and to generate a data signal that represents the data value;

a reference cell operable to generate a reference signal;

a sense amplifier coupled to the memory and reference cells and operable to detect when the data signal from the memory cell achieves a first predetermined relationship to a first comparison signal,

detect when the reference signal from the reference cell achieves a second predetermined relationship to a second comparison signal, and

identify the data value stored in the memory cell by determining an order in which the data signal and reference signal respectively achieve the first and second predetermined relationships to the first and second comparison signals; and

a modifier operable to modify a time at which the reference signal achieves the second predetermined relationship to the second comparison signal.

19. A system, comprising:

an integrated circuit comprising,

a memory cell operable to store data value and to generate a data signal that represents the data value;

a reference cell operable to generate a reference signal;

a sense amplifier coupled to the memory and reference cells and operable to detect when the data signal from the memory cell achieves a first predetermined relationship to a first comparison signal,

detect when the reference signal from the reference cell achieves a second predetermined relationship to a second comparison signal,

identify the data value stored in the memory cell by determining an order in which the data signal and reference signal respectively achieve the first and second predetermined relationships to the first and second comparison signals; and

a modifier operable to modify a time at which the reference signal achieves the second predetermined relationship to the second comparison signal.

Assignments (8)