IP Library Granted Patent US 7,384,819
Granted Patent B2
US 7,384,819 · App. 11/414,440 · Granted Jun 10, 2008

Method of forming stackable package

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Quick Facts
Patent No.
US 7,384,819
App. No.
11/414,440
Granted
Jun 10, 2008
Kind
B2
Abstract

A method of forming a semiconductor package ( 50 and 52 ) includes providing a substrate ( 14 ) having a die pad and bond pads on a first surface ( 20 ) and conductive pads ( 66, 68 and 74 ) on a second surface ( 22 ). An integrated circuit (IC) die ( 38 ) is attached to the die pad and the first surface ( 20 ) of the substrate ( 14 ) is attached to a lead frame ( 26 ). The substrate ( 14 ) is electrically connected to the lead frame ( 26 ), and the IC die ( 38 ) is electrically connected to the substrate ( 14 ) and the lead frame ( 26 ). The IC die ( 14 ), the electrical connections ( 40, 42 and 44 ), a portion of the substrate ( 14 ) and a portion of the lead frame ( 26 ) are encapsulated with a mold compound ( 46 ), forming a stackable package ( 48 ). The conductive pads ( 66, 68 and 74 ) on the second surface ( 22 ) of the substrate ( 14 ) are not encapsulated by the mold compound ( 46 ).

Claims (20)

1. A method of forming a plurality of stacked packages, comprising:

providing a plurality of substrates, each substrate having a die pad and a plurality of bond pads on a first surface thereof and a plurality of conductive pads on a second surface thereof;

attaching the first surfaces of the substrates to respective ones of a plurality of lead frames;

attaching a plurality of integrated circuit (IC) dice to the respective die pads on the first surfaces of the substrates;

electrically connecting the substrates, the respective lead frames and the respective IC dice;

encapsulating the IC dice, the electrical connections, a portion of the substrates and a portion of the lead frames with a mold compound, wherein the conductive pads on the second surfaces of the substrates are exposed, thereby forming a plurality of packaged devices;

attaching a plurality of semiconductor devices to respective ones of the second surfaces of the substrates, wherein the semiconductor devices are electrically connected to the respective IC dice by way of the conductive pads, thereby forming the stacked packages; and

separating the stacked packages from other ones of the stacked packages.

2. The method of forming a plurality of stacked packages of claim 1 , wherein the substrate provides electrical connection between the IC die and the at least one external semiconductor device.

3. The method of forming a plurality of stacked packages of claim 1 , wherein the plurality of semiconductor devices is electrically coupled to the conductive pads via one of a plurality of conductive balls and a plurality of leads.

4. The method of forming a plurality of stacked packages of claim 1 , wherein the plurality of semiconductor devices comprises one or more of a Quad Flat Pack (QEP) package, a Thin Small Outline Package (TSOP), a Small Outline Integrated Circuit (SOIC) package, a Small Outline J-Lead (SOJ) package, a Plastic Leaded Chip Carrier (PLCC) package, a Wafer Level Chip Scale Package (WLCSP), a Mold Array Process-Ball Grid Array (MAPBGA) package, a Quad Flat No-Lead (QFN) package, a Land Grid Array (LGA) package and a passive component.

5. The method of forming a plurality of stacked packages of claim 1 , further comprising encapsulating the plurality of semiconductor devices.

6. The method of forming a plurality of stacked packages of claim 1 , wherein each of the plurality of lead frames comprises:

a plurality of leads lying substantially in a first plane; and

a down-set portion coupled to respective ones of the leads, wherein the down-set portion lies in a second plane vertically spaced front the first plane.

7. The method of forming a plurality of stacked packages of claim 1 , further comprising the step of testing the packaged devices prior to attaching the semiconductor devices to the substrates.

8. The method of forming a plurality of stacked packages of claim 1 , wherein a film is attached to the second surface of each substrate.

9. The method of forming a plurality of stacked packages of claim 8 , further comprising removing the film from the second surfaces of each of the substrates to expose the conductive pads.

10. The method of forming a plurality of stacked packages of claim 1 , wherein the separation step comprises punch singulation.

11. The method of forming a plurality of stacked packages of claim 1 , wherein the substrates are provided by performing a singulating operation on a film laminated substrate.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0719 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Sep 24, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 021570/0449 →
SECURITY AGREEMENT Recorded Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
Reel/Frame 018855/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2006
From: YIP, HENG KEONG; TAN, LAN CHU
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 017841/0359 →