Contact resistance test structure and methods of using same

1. A method, comprising:

forming a test structure comprised of a semiconducting substrate and two transistor gate electrode structures formed above said semiconducting substrate;

forming a doped region within said semiconducting substrate and between said two gate electrode structures;

forming a plurality of conductive contacts to said doped region;

forcing a current through said test structure; and

determining a resistance of at least one of said conductive contacts based upon, in part, said forced current.

2. The method of claim 1 , wherein said two gate electrode structures are comprised of polysilicon.

3. The method of claim 1 , wherein each of said gate electrode structures comprises at least one sidewall spacer.

4. The method of claim 1 , wherein said two gate electrode structures of said test structure are formed at the same time as gate electrode structures are formed for an integrated circuit device that is formed on a common substrate with said test structure.

5. The method of claim 4 , wherein said two gate electrode structures of said test structure and said gate electrode structures of said integrated circuit device are formed using the same process flow.

6. The method of claim 1 , wherein said gate electrode structures are spaced apart by a distance of between 10-200 nm.

7. The method of claim 1 , wherein forcing a current through said test structure comprises forcing a current through said test structure using a current source.

8. The method of claim 1 , wherein determining a resistance of at least one of said conductive contacts based upon, in part, said forced current comprises detecting a voltage across said at least one contact and dividing said detected voltage across said at least one contact by said current.

9. The method of claim 1 , further comprising comparing said determined resistance to a design resistance value.

10. The method of claim 1 , wherein said test structure comprises at least first, second and third conductive contacts, each of which are conductively coupled to said doped region and each of which are coupled to a separate conductive line, the method further comprising:

forcing a current through said second conductive contact and said first conductive contact; and

detecting a voltage differential between said second and third conductive contacts.

11. A method, comprising:

forming a test structure comprised of a semiconducting substrate and two transistor gate electrode structures formed above said semiconducting substrate, each of said gate electrode structures comprising at least one sidewall spacer, wherein said two gate electrode structures of said test structure are formed at the same time as gate electrode structures are formed for an integrated circuit device that is formed on a common substrate with said test structure;

forming a doped region within said semiconducting substrate and between said two gate electrode structures;

forming a plurality of conductive contacts to said doped region;

forcing a current through said test structure; and

determining a resistance of at least one of said conductive contacts based upon, in part, said forced current.

12. The method of claim 11 , further comprising comparing said determined resistance to a design resistance value.

13. The method of claim 11 , wherein said two gate electrode structures of said test structure and said gate electrode structures of said integrated circuit device are formed using the same process flow.

14. The method of claim 11 , wherein forcing a current through said test structure comprises forcing a current through said test structure using a current source.

15. The method of claim 11 , wherein determining a resistance of at least one of said conductive contacts based upon, in part, said forced current comprises detecting a voltage across said at least one contact and dividing said detected voltage across said at least one contact by said current.

16. The method of claim 11 , wherein said test structure comprises at least first, second and third conductive contacts, each of which are conductively coupled to said doped region and each of which are coupled to a separate conductive line, the method further comprising:

forcing a current through said second conductive contact and said first conductive contact; and

detecting a voltage differential between said second and third conductive contacts.

17. A method, comprising:

forming a test structure comprised of:

a semiconducting substrate;

two transistor gate electrode structures formed above said semiconducting substrate, each of said gate electrode structures comprising at least one sidewall spacer;

a doped region within said semiconducting substrate and between said two gate electrode structures; and

first, second and third conductive contacts which are conductively coupled to said doped region;

forcing a current through said second conductive contact and said first conductive contact;

detecting a voltage differential between said second and third conductive contacts; and

determining a resistance of said second conductive contact based upon said forced current and said detected voltage.

18. The method of claim 17 , wherein said two gate electrode structures of said test structure are formed at the same time as gate electrode structures are for an integrated circuit device that is formed on a common substrate with said test structure.

19. The method of claim 18 , wherein said two gate electrode structures of said test structure and said gate electrode structures of said integrated circuit device are formed using the same process flow.

20. The method of claim 17 , wherein forcing a current through said test structure comprises forcing a current through said test structure using a current source.

21. The method of claim 17 , further comprising comparing said determined resistance to a design resistance value.