Memory using tunneling field effect transistors
View Patent ↗A memory includes a first tunneling field effect transistor including a first drain and a first source, the first drain coupled to a first resistive memory element. The memory includes a second tunneling field effect transistor including a second drain and sharing the first source, the second drain coupled to a second resistive memory element. The memory includes a first region coupled to the first source for providing a source node.
1. A memory comprising:
a first tunneling field effect transistor including a first drain and a first p+ doped source, the first drain coupled to a first MRAM memory element;
a second tunneling field effect transistor including a second drain and a second p+doped source, the second drain coupled to a second MRAM memory element; and
a p+ doped ground plate region coupled to the first p+ doped source and the second p+doped source.
2. A memory comprising:
a first MRAM memory element;
a second MRAM memory element;
a first tunneling field effect transistor including a first p+ doped source, the first tunneling field effect transistor for accessing the first MRAM memory element;
a first word line coupled to a gate of the first tunneling field effect transistor;
a second tunneling field effect transistor including a second p+ doped source, the second tunneling field effect transistor for accessing the second MRAM memory element;
a second word line coupled to a gate of the second tunneling field effect transistor; and
a p+ doped ground plate region coupled to the first p+ doped source and the second p+doped source.
3. A method for fabricating a memory, the method comprising:
providing a first tunneling field effect transistor including a first drain and a first p+doped source;
providing a first MRAM memory element coupled to the first drain;
providing a second tunneling field effect transistor including a second drain and a second p+ doped source;
providing a second MRAM memory element coupled to the second drain; and
providing a p+ doped ground plate region coupled to the first p+ doped source and the second p+ doped source.
4. An integrated circuit including an array of MRAM memory cells comprising:
a first tunneling field effect transistor including a first n+ doped drain, the first n+ doped drain coupled to a first MRAM memory element;
a second tunneling field effect transistor including a second n+ doped drain; and
a p+ doped ground plate region comprising p+ doped sources for the first and second tunneling field effect transistors.