System and method for reducing current in a device during testing
View Patent ↗A method for testing an electronic assembly ( 10 ) is provided. A portion ( 22 ) of the electronic assembly is electrically isolated from a remainder ( 24 ) of the electronic assembly. Power is provided to the electronic assembly such that a reduced amount of current flows only through the portion of the electronic assembly. The reduced amount of current is determined. A combined amount of current flowing through both the portion and the remainder of the electronic assembly when power is provided to both the portion and the remainder of the electronic assembly is calculated based on the reduced amount of current.
1. A method for testing an electronic device comprising a plurality of transistors, the method comprising:
electrically isolating a portion of the electronic device from a remainder of the electronic device, a portion of the plurality of transistors being within the portion of the electronic device and a remainder of the plurality of transistors being within a remainder of the electronic device;
providing power to the electronic device such that a reduced amount of control current only flows through the portion of the electronic device;
determining the reduced amount of control current, said determination of the reduced amount of control current comprising providing power to the portion of the electronic device such that current flows through the portion of the plurality of transistors and determining a test amount of control current flowing through at least one selected transistor of the portion of the plurality of transistors, the portion of the plurality of transistors being less than 50 percent of the plurality of transistors and the at least one selected transistor being less than 10 percent of the portion of the plurality of transistors; and
calculating a combined amount of control current flowing through both the portion and the remainder of the electronic device when power is provided to both the portion and the reminder of the electronic device based on the reduced amount of control current, wherein the reduced amount is less than 50 percent of the combined amount of control current.
2. The method of claim 1 , wherein the electronic device is configured such that the reduced amount of current is a predetermined percentage of the combined amount of current.
3. The method of claim 2 , wherein the portion of the electronic device and the portion of the plurality of transistors are configured such that the test amount of current is a predetermined percentage of the reduced amount of current.
4. The method of claim 3 , wherein the test amount of current, the reduced amount of current, and the combined amount of current are control currents for the electronic device, the portion of the electronic device, and the at least one selected transistor, respectively.
5. The method of claim 1 , wherein the electronic device includes a microelectronic die with an integrated circuit formed thereon.
6. A method for testing a microelectronic assembly comprising:
providing power to a plurality of transistors in the microelectronic assembly such that current flows through the plurality of transistors;
electrically isolating a predetermined number of the plurality of transistors, the predetermined number of the plurality of transistors being less than 50 percent of the plurality of transistors;
providing power to the predetermined number of the plurality of transistors such that current flows through only the predetermined number of the plurality of transistors;
determining a reduced control current for the predetermined number of the plurality of transistors, said determination of the reduced control current comprising providing power to the predetermined number of the plurality of transistors such that current flows through the predetermined number of the plurality of transistors and determining a test control current flowing through at least one selected transistor of the predetermined number of the plurality of transistors and is based on the test control current, the at least one selected transistor being less than 10 percent of the predetermined number of the plurality of transistors; and
calculating a total control current for the plurality of transistors based on the reduced control current for the predetermined number of the plurality of transistors, wherein the microelectronic assembly is configured such that the reduced control current is a predetermined percentage of the total control current and the test control current is a predetermined percentage of the reduced control current.
7. The method of claim 6 , wherein the microelectronic assembly is a power integrated circuit and includes a microelectronic die, the plurality of transistors being formed on the microelectronic die.