Knee probe having increased scrub motion
View Patent ↗Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is a key geometrical parameter for predetermining the scrub motion provided by the probe in response to a predetermined contact force. The scrub motion preferably includes both a sliding motion and a rocking motion, where the sliding motion acts to clean the contact pad and the rocking motion acts to bring a clean part of the probe tip into contact with the freshly cleaned part of the contact pad. In preferred embodiments, the probe tip can include one or more relatively narrow “skates” for making contact to the contact pad. A dual skate configuration is especially appropriate when small dimples are at the centers of the contact pads.
1. A method for probing a device under test comprising:
providing a layered probe, the probe comprising:
a plurality of planar outer layers terminating at a probe tip;
a plurality of planar inner layers;
at least one of the inner layers extending beyond the outer layers and forming an elongated skate which extends beyond the probe tip; and
causing contact between the skate and a contact pad of the device under test.
2. The method of claim 1 wherein said plurality of inner layers extend beyond the outer layers forming a plurality of elongated skates which extend beyond the probe tip.
3. The method of claim 1 wherein only the inner layer comprising the skate comprises a material selected for suitability as a tip contacting material.
4. The method of claim 1 wherein the inner layer which forms the elongated skate extends the entire length of the layered probe.
5. The method of claim 1 wherein the inner layer which forms the elongated skate extends at least into the skate.
6. The method of claim 1 wherein the inner layer which forms the elongated skate extends at least into a shank of the probe.
7. The method of claim 1 wherein causing contact between the skate and a contact pad comprises applying a vertical displacement to the layered probe.
8. The method of claim 7 wherein vertical displacement of the layered probe is translated into lateral movement of the skate on the contact pad of the device under test after the skate makes contact with the contact pad.
9. The method of claim 1 wherein the method further comprises providing a rocking motion of the probe tip relative to the contact pad.
10. The method of claim 9 wherein the rocking motion is predetermined by geometrical parameters of the probe and by vertical displacement of the layered probe.
11. The method of claim 1 wherein providing a layered probe comprises providing a layered probe which comprises a substantially rectangular cross section.
12. The method of claim 1 wherein causing contact between the skate and a contact pad of the device under test comprises causing contact with a predetermined amount of force.
13. A layered testing probe comprising:
a plurality of planar outer layers terminating at a probe tip;
a plurality of planar inner layers; and
at least one of said inner layers extending beyond said outer layers and forming an elongated skate which extends beyond said probe tip.
14. The probe of claim 13 wherein said plurality of inner layers extend beyond said outer layers forming a plurality of elongated skates which extend beyond said probe tip.
15. The probe of claim 13 wherein only said inner layer comprising said skate comprises a material selected for suitability as a tip contacting material.
16. The probe of claim 13 wherein said inner layer which forms said elongated skate extends the entire length of said layered probe.
17. The probe of claim 13 wherein said inner layer which forms said elongated skate extends at least into said probe tip.
18. The probe of claim 13 wherein said inner layer which forms said elongated skate extends at least into a shank of said probe.
19. The probe of claim 13 wherein said probe comprises a substantially rectangular cross section.
20. The probe of claim 13 where said layers are substantially flat layers.
21. A layered testing probe comprising:
a layered structure, said structure forming a probe tip;
each layer of said layered structure comprising a planar face; and
two layers of said layered structure extending beyond other of said layers and forming two elongated skates which extends beyond said probe tip.
22. The probe of claim 21 wherein said probe comprises a substantially rectangular cross section.
23. The probe of claim 21 wherein at least one of the layers extending beyond other of said layers is an inner layer.
24. A method for probing a device under test comprising:
providing a layered probe, the probe comprising:
a plurality of planar outer layers terminating at a probe tip;
a plurality of Planar inner layers;
at least one of the inner layers extending beyond the outer layers and forming an elongated skate which extends beyond the probe tip and extends at least into a shank of the probe; and
causing contact between the skate and a contact pad of the device under test.
25. The method of claim 24 wherein said plurality of inner layers extend beyond the outer layers forming a plurality of elongated skates which extend beyond the probe tip.
26. The method of claim 24 wherein only the inner layer comprising the skate comprises a material selected for suitability as a tip contacting material.
27. The method of claim 24 wherein the inner layer which forms the elongated skate extends the entire length of the layered probe.
28. The method of claim 24 wherein the inner layer which forms the elongated skate extends at least into the skate.
29. The method of claim 24 wherein causing contact between the skate and the contact pad comprises applying a vertical displacement to the layered probe.
30. The method of claim 29 wherein vertical displacement of the layered probe is translated into lateral movement of the skate on the contact pad of the device under test after the skate makes contact with the contact pad.
31. The method of claim 24 wherein the method further comprises providing a rocking motion of the probe tip relative to the contact pad.
32. The method of claim 31 wherein the rocking motion is predetermined by geometrical parameters of the probe and by vertical displacement of the layered probe.
33. The method of claim 24 wherein providing a layered probe comprises providing a layered probe which comprises a substantially rectangular cross section.
34. The method of claim 24 wherein causing contact between the skate and the contact pad of the device under test comprises causing contact with a predetermined amount of force.
35. A layered testing probe comprising:
a plurality of planar outer layers terminating at a probe tip;
a plurality of Planar inner layers; and
at least one of said inner layers extending beyond said outer layers and forming an elongated skate which extends beyond said probe tip, wherein said inner layer which forms said elongated skate extends at least into a shank of said probe.
36. The probe of claim 35 wherein said plurality of inner layers extend beyond said outer layers forming a plurality of elongated skates which extend beyond said probe tip.
37. The probe of claim 35 wherein only said inner layer comprising said skate comprises a material selected for suitability as a tip contacting material.
38. The probe of claim 35 wherein said inner layer which forms said elongated skate extends the entire length of said layered probe.
39. The probe of claim 35 wherein said inner layer which forms said elongated skate extends at least into said probe tip.
40. The probe of claim 35 wherein said probe comprises a substantially rectangular cross section.
41. A method for probing a device under test comprising:
providing a layered probe comprising a substantially rectangular cross section, the probe comprising:
a plurality of outer layers terminating at a probe tip;
a plurality of inner layers;
at least one of the inner layers extending beyond the outer layers and forming an elongated skate which extends beyond the probe tip; and
causing contact between the skate and a contact pad of the device under test.
42. The method of claim 41 wherein said plurality of inner layers extend beyond the outer layers forming a plurality of elongated skates which extend beyond the probe tip.
43. The method of claim 41 wherein only the inner layer comprising the skate comprises a material selected for suitability as a tip contacting material.
44. The method of claim 41 wherein the inner layer which forms the elongated skate extends the entire length of the layered probe.
45. The method of claim 41 wherein the inner layer which forms the elongated skate extends at least into the skate.
46. The method of claim 41 wherein the inner layer which forms the elongated skate extends at least into a shank of the probe.
47. The method of claim 41 wherein causing contact between the skate and a contact pad comprises applying a vertical displacement to the layered probe.
48. The method of claim 47 wherein vertical displacement of the layered probe is translated into lateral movement of the skate on the contact pad of the device under test after the skate makes contact with the contact pad.
49. The method of claim 41 wherein the method further comprises providing a rocking motion of the probe tip relative to the contact pad.
50. The method of claim 49 wherein the rocking motion is predetermined by geometrical parameters of the probe and by vertical displacement of the layered probe.
51. The method of claim 41 wherein causing contact between the skate and a contact pad of the device under test comprises causing contact with a predetermined amount of force.
52. A layered testing probe comprising:
a plurality of outer layers terminating at a probe tip;
a plurality of inner layers;
at least one of said inner layers extending beyond said outer layers and forming an elongated skate which extends beyond said probe tip; and
a wherein each of said layers comprises substantially rectangular cross section.
53. The probe of claim 52 wherein said plurality of inner layers extend beyond said outer layers forming a plurality of elongated skates which extend beyond said probe tip.
54. The probe of claim 52 wherein only said inner layer comprising said skate comprises a material selected for suitability as a tip contacting material.
55. The probe of claim 52 wherein said inner layer which forms said elongated skate extends the entire length of said layered probe.
56. The probe of claim 52 wherein said inner layer which forms said elongated skate extends at least into said probe tip.
57. The probe of claim 52 wherein said inner layer which forms said elongated skate extends at least into a shank of said probe.
58. A layered testing probe comprising:
a layered structure, said structure forming a probe tip;
each layer of said layered structure comprising a planar face;
two layers of said layered structure extending beyond other of said layers and forming two elongated skates which extend beyond said probe tip; and
a substantially rectangular cross section.
59. The probe of claim 58 wherein the layers extending beyond other of said layers are inner layers.