IP Library Granted Patent US 7,621,041
Granted Patent B2
US 7,621,041 · App. 11/451,763 · Granted Nov 24, 2009

Methods for forming multilayer structures

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Quick Facts
Patent No.
US 7,621,041
App. No.
11/451,763
Granted
Nov 24, 2009
Kind
B2
Abstract

The present invention relates to methods of forming multilayer structures and the structures themselves. In one embodiment, a method of forming a multilayer structure comprises: providing a dielectric composition comprising paraelectric filler and polymer wherein the paraelectric filler has a dielectric constant between 50 and 150; applying the dielectric composition to a carrier film thus forming a multilayer film comprising a dielectric layer and carrier film layer; laminating the multilayer film to a circuitized core wherein the dielectric layer of the multilayer film is facing the circuitized core; and removing the carrier film layer from the dielectric layer prior to processing; applying a metallic layer to the dielectric layer wherein the circuitized core, dielectric layer and metallic layer form a planar capacitor; and processing the planar capacitor to form a multilayer structure.

Claims (20)

1. A method of forming a multilayer structure comprising:

providing a dielectric composition comprising paraelectric filler and polymer wherein said paraelectric filler has a dielectric constant between 50 and 150;

applying said dielectric composition to a carrier film thus forming a multilayer film comprising a dielectric layer and carrier film layer;

laminating said multilayer film to a circuitized core wherein the dielectric layer of said multilayer film is facing said circuitized core; and

removing said carrier film layer from said dielectric layer prior to processing;

applying a metallic layer to said dielectric layer wherein said circuitized core, dielectric layer and metallic layer form a planar capacitor; and

processing said planar capacitor to form a multilayer structure.

2. A method of forming a multilayer structure comprising:

providing a dielectric composition comprising paraelectric filler and polymer wherein said paraelectric filler has a dielectric constant between 50and 150;

applying said dielectric composition to a metallic carrier film thus forming a multilayer film comprising a dielectric layer and carrier film layer;

laminating said multilayer film to a circuitized core wherein the dielectric layer of said multilayer film is facing said circuitized core and wherein said circuitized core, dielectric layer and carrier film layer form a planar capacitor; and

processing said planar capacitor to form a multilayer structure.

3. The method of any one of claims 1 or 2 further comprising providing a release film layer and applying said release film layer to said dielectric layer and removing said release layer prior to laminating.

4. The method of any one of claims 1 or 2 wherein said paraelectric filler is present in an amount of 5 to 55 volume percent.

5. The method of any one of claims 1 or 2 wherein said dielectric composition further comprises a solvent.

6. The method of any one of claims 1 or 2 wherein said paraelectric filler is selected from the group consisting of TiO 2 , Ta 2 O 5 , Hf 2 O 5 , Nb 2 O 5 , Al 2 O 3 , Steatite and mixtures thereof.

7. The method of any one of claims 1 or 2 wherein said paraelectric filler has an average particle size of less than 2 microns.

8. The method of any one of claims 1 or 2 wherein said polymer is selected from an epoxy, acrylic, polyurethane and polyimide.

9. The method of any one of claims 1 or 2 wherein said dielectric composition further comprises a ferroelectric filler.

10. The method of claim 9 wherein said ferroelectric filler is selected from the group consisting of perovskites of the general formula ABO 3 , crystalline barium titanate (BT), barium strontium titanate (BST), lead zirconate titanate (PZT), lead lanthanum titanate, lead lanthanum zirconate titanate (PLZT), lead magnesium niobate (PMN), calcium copper titanate and mixtures thereof.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2019
From: E. I. DU PONT DE NEMOURS AND COMPANY
To: DUPONT ELECTRONICS, INC.
Reel/Frame 049583/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2006
From: BANERJI, SOUNAK; COX, G. SIDNEY; DIETZ, KARL HARTMANN
To: E. I. DU PONT DE NEMOURS AND COMPANY
Reel/Frame 018189/0407 →