Self-adaptive output buffer based on charge sharing
View Patent ↗A self-adaptive output buffer for an output terminal of an electronic circuit suitable to be connected to a load is proposed. The self-adaptive output buffer includes means for sensing an indication of the capacitance of the load and means for driving the load according to the sensing, wherein the means for sensing includes capacitive means with a preset capacitance, means for charging the capacitive means to a preset voltage, means for coupling the charged capacitive means with the load, and means for measuring a measuring voltage at the capacitive means due to a charge sharing between the capacitive means and the load.
1. A self adaptive output buffer for an output terminal of an electronic circuit suitable to be connected to a load, the buffer including:
means for sensing an indication of the capacitance of the load, wherein the means for sensing includes:
capacitive means with a preset capacitance;
means for charging the capacitive means to a preset voltage;
means for coupling the charged capacitive means with the load; and
means for measuring a measuring voltage at the capacitive means due to a charge sharing between the capacitive means and the load;
means for driving the load according to the sensing; and
means for enabling the means for sensing in response to a power-on of the electronic circuit.
2. An electronic circuit including at least one output terminal and at least one output buffer according to claim 1 , each one for a corresponding output terminal.
3. A self adaptive output buffer for an output terminal of an electronic circuit suitable to be connected to a load, the buffer including:
means for sensing an indication of the capacitance of the load, wherein the means for sensing includes:
capacitive means with a preset capacitance;
means for charging the capacitive means to a preset voltage, wherein the means for charging includes means for connecting the capacitive means to a power supply terminal providing a supply voltage and means for connecting the load to a reference terminal providing a reference voltage;
means for coupling the charged capacitive means with the load, wherein the means for coupling includes means for connecting the capacitive means and the load in parallel; and
means for measuring a measuring voltage at the capacitive means due to a charge sharing between the capacitive means and the load;
and wherein the means for sensing includes an inverter, having an input terminal for receiving a control signal and an output terminal, and a first, a second and a third transistor, the first and the second transistors being of a first type and the third transistor being of a second type, and each transistor having a first and a second terminal and a control terminal, wherein the first transistor has the first terminal connected to the supply terminal, the second terminal connected to a first electrode of the capacitive means, and the control terminal connected to the input terminal of the inverter, the capacitive means having a second electrode connected to the reference terminal, wherein the second transistor has the first terminal connected to the second terminal of the first transistor, wherein the third transistor has the first terminal connected to the reference terminal and the second terminal connected to the second terminal of the second transistor, the control terminals of the second and third transistors being connected to the output terminal of the inverter, and wherein the sensing means further includes means for selectively connecting the second terminal of the second transistor to the output terminal, the load being connectable between the output terminal and the reference terminal; and
means for driving the load according to the sensing.
4. A self-adaptive output buffer for an output terminal of an electronic circuit suitable to be connected to a load, the buffer including:
means for sensing an indication of the capacitance of the load, wherein the means for sensing includes:
capacitive means with a preset capacitance;
means for charging the capacitive means to a preset voltage;
means for coupling the charged capacitive means with the load; and
means for measuring a measuring voltage at the capacitive means due to a charge sharing between the capacitive means and the load, wherein the means for measuring includes reference means for providing at least one comparing voltage and comparing means for comparing the measuring voltage with the at least one comparing voltage, wherein the reference means provides a plurality of comparing voltages in parallel, and wherein the comparing means includes a plurality of comparators, each one for comparing the measuring voltage with a corresponding one of the comparing voltages; and
means for driving the load according to the sensing, wherein the means for driving includes at least one driving transistor for driving the load and means for enabling each driving transistor according to said comparison.
5. A buffer, comprising:
an input node operable to receive an input signal;
an output node;
a driver coupled to the input and output nodes and operable to provide a drive signal to the output node in response to the input signal, wherein the driver comprises multiple drive stages that are each operable to provide a portion of the drive signal to the output node;
a test component; and
a sensing circuit coupled to the test component and the output node and operable to
charge the test component to a predetermined charge level,
couple the charged test component to the output node,
measure a test charge level on the test component after coupling the test component to the output node, and
adjust the drive signal in response to the test charge level, wherein the sensing circuit is operable to adjust the drive signal by enabling a number of the drive stages, the number corresponding to the test charge level.
6. The buffer of claim 5 wherein the drive signal comprises a drive current.
7. The buffer of claim 5 , wherein:
the test component comprises a test capacitor; and
the sensing circuit is operable to
charge the test capacitor to a predetermined voltage level,
couple the charged test capacitor to the output node,
measure a test voltage level across the test capacitor after coupling the test capacitor to the output node, and
adjust the drive signal in response to the test voltage level.
8. The buffer of claim 5 , wherein:
the test component comprises a test capacitor having a first node coupled to a reference voltage and having a second node; and
the sensing circuit is operable to
charge the test capacitor to a predetermined voltage level by coupling the second node of the test capacitor to a voltage source,
couple the second node of the charged test capacitor to the output node,
measure a test voltage level across the first and second nodes of the test capacitor after coupling the second node of the test capacitor to the output node, and
adjust the drive signal in response to the test voltage level.
9. The buffer of claim 5 wherein the driver comprises a transistor having a drain coupled to the output node.
10. The buffer of claim 5 wherein the sensing circuit is operable to measure the test charge level on the test component by comparing the test charge level to a reference level.
11. The buffer of claim 5 , further comprising:
a supply node operable to receive a supply voltage; and
wherein the sensing circuit is operable to charge the test component, couple the charged test component to the output node, measure a test charge level on the test component, and adjust the drive signal in response to the supply voltage having a predetermined level.
12. A buffer, comprising:
an input node operable to receive an input signal;
an output node;
a driver coupled to the input and output nodes and operable to provide a drive signal to the output node in response to the input signal, wherein the driver comprises multiple drive stages that are each operable to provide a portion of the drive signal to the output node;
a test component; and
a sensing circuit coupled to the test component and the output node and operable to
charge the test component to a predetermined charge level,
couple the test component to the output node after the test component has been charged to the predetermined level,
measure a test charge level on the test component after coupling the test component to the output node, and
adjust the drive signal in response to the test charge level, wherein the sensing circuit is operable to adjust the drive signal by enabling a number of the drive stages, the number corresponding to the test charge level.
13. The buffer of claim 12 wherein the drive signal comprises a drive current.
14. The buffer of claim 12 , wherein:
the test component comprises a test capacitor; and
the sensing circuit is operable to
charge the test capacitor to a predetermined voltage level,
couple the charged test capacitor to the output node,
measure a test voltage level across the test capacitor after coupling the test capacitor to the output node, and
adjust the drive signal in response to the test voltage level.
15. The buffer of claim 12 , wherein:
the test component comprises a test capacitor having a first node coupled to a reference voltage and having a second node; and
the sensing circuit is operable to
charge the test capacitor to a predetermined voltage level by coupling the second node of the test capacitor to a voltage source,
couple the second node of the charged test capacitor to the output node,
measure a test voltage level across the first and second nodes of the test capacitor after coupling the second node of the test capacitor to the output node, and
adjust the drive signal in response to the test voltage level.
16. The buffer of claim 12 wherein the driver comprises a transistor having a drain coupled to the output node.
17. The buffer of claim 12 wherein the sensing circuit is operable to measure the test charge level on the test component by comparing the test charge level to a reference level.
18. The buffer of claim 12 , further comprising:
a supply node operable to receive a supply voltage; and
wherein the sensing circuit is operable to charge the test component, couple the charged test component to the output node, measure a test charge level on the test component, and adjust the drive signal in response to the supply voltage having a predetermined level.