Electric discharge machining of a probe array
View Patent ↗A method of forming a probe away includes forming a layer of tip material over a block of probe material. A first electric discharge machine (EDM) electrode is positioned over the layer of tip material, the EDM electrode having a plurality of openings corresponding to a plurality of probes to be formed. Excess material from the layer of tip material and the block of probe material is removed to form the plurality of probes. A substrate having a plurality of through holes corresponding to the plurality of probes is positioned so that the probes penetrate the plurality of through holes. The substrate is bonded to the plurality of probes. Excess probe material is removed so as to planarize the substrate.
1. A method of manufacturing comprising:
removing with an electric discharge machine (EDM) material from a block of material to form shaped contact tips at first ends of probes, said shaped tips configured to contact and thereby make electrical connections with terminals of an electronic device wherein:
said block of material comprises a layer of tip material and a layer of probe material;
said removing comprises removing material from said tip material to form said shaped contact tips; and
said tip material comprises at least one of palladium, gold, rhodium, nickel, cobalt, an alloy of palladium, an alloy of gold, an alloy of rhodium, an alloy of nickel, and an alloy of cobalt.
2. A method of manufacturing comprising:
removing with an electric discharge machine (EDM) material from a block of material to form shaped contact tips at first ends of probes, said shaped tips configured to contact and thereby make electrical connections with terminals of an electronic device; and
cutting with an EDM said probes out of said block of material.
3. The method of claim 2 , wherein said cutting is in a direction from said first ends of said probes to second opposite ends of said probes.
4. The method of claim 2 , wherein said cutting is in a direction from a first side profile of each of said probes to a second opposite side profile of each of said probes.
5. The method of claim 4 , wherein said first side profiles include said first ends of said probes and second opposite ends of said probes.
6. The method of claim 5 , wherein each of said first side profiles comprises a base, a body with least one change in direction, and one of said contact tips.
7. The method of claim 2 , wherein after said cutting, said probes are loose probes.
8. A method of manufacturing comprising:
removing with an electric discharge machine (EDM) material from a block of material to form shaped contact tips at first ends of probes, said shaped tips configured to contact and thereby make electrical connections with terminals of an electronic device; and
attaching ones of said probes to a substrate.
9. The method of claim 8 , further comprising forming electrical connections on said substrate to said ones of said probes for connecting to external signal sources.
10. A method of manufacturing a plurality of probes, said method comprising:
removing first material from a block with an electric discharge machine comprising an electrode having a plurality of cavities therein, said cavities comprising shapes that correspond to desired shapes of said probes,
said removing leaving second material of said block corresponding to the cavities to form said plurality of probes; and
removing with and EDM a portion of said second material to form shaped contact tips at ends of said probes,
wherein said second material comprises a plurality of layers of materials, and said removing a portion of said second material to form shaped contact tips at ends of said probes comprises removing a portion of one of said layers.
11. A method of manufacturing a plurality of probes, said method comprising:
removing first material from a block with an electric discharge machine comprising an electrode having a plurality of cavities therein, said cavities comprising shapes that correspond to desired shapes of said probes,
said removing leaving second material of said block corresponding to the cavities to form said plurality of probes,
wherein after said removing, said probes are loose probes.
12. A method of manufacturing a plurality of probes, said method comprising:
removing first material from a block with an electric discharge machine comprising an electrode having a plurality of cavities therein, said cavities comprising shapes that correspond to desired shapes of said probes,
said removing leaving second material of said block corresponding to the cavities to form said plurality of probes; and
attaching ones of said probes to a substrate.
13. The method of claim 12 , further comprising forming electrical connections on said substrate to said ones of said probes for connecting to external signal sources.