IP Library Granted Patent US 7,482,679
Granted Patent B2
US 7,482,679 · App. 11/569,113 · Granted Jan 27, 2009

Leadframe for a semiconductor device

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Quick Facts
Patent No.
US 7,482,679
App. No.
11/569,113
Filed
Jul 25, 2007
Granted
Jan 27, 2009
Kind
B2
Art Unit
2826
USPC
257/666
Abstract

A leadframe ( 40 ) for a semiconductor device has a radially extending leads ( 42 ) having inner lead portions ( 44 ) and outer lead portions ( 46 ), and a dam bar ( 48 ) that mechanically connects the leads ( 42 ) together near the outer lead portions ( 46 ). The inner lead portions ( 44 ) define an open area having a central region and the dam bar ( 48 ) defines a leadframe outer perimeter. A generally X-shaped die support member has arms ( 50 ) that extend from the leadframe outer perimeter and meet at the central region. A heat sink includes sections ( 64 ) that are formed between adjacent pairs of the die support member arms ( 50 ). The heat sink sections ( 64 ) are connected to the die support member arms ( 50 ) with down set tie bars ( 66 ) such that the heat sink lays in a plane below a plane of the die support member arms ( 50 ).

Claims (38)

1. A leadframe for a semiconductor device, comprising:

a plurality of radially extending leads having inner lead portions and outer lead portions, wherein the inner lead portions define an open area having a central region;

a dam bar that mechanically connects the leads together near to the outer lead portions, wherein the dam bar defines a leadframe outer perimeter;

a generally X-shaped die support member having a plurality of arms that extend from the leadframe outer perimeter and meet at the central region;

a heat sink having a plurality of sections, the heat sink sections being formed between adjacent pairs of the die support member arms; and

a plurality of down set tie bars connecting the heat sink sections to adjacent ones of the die support member arms, wherein the heat sinks lie in a plane below a plane of the die support member arms.

2. The leadframe of claim 1 , wherein the heat sink sections are triangular.

3. The leadframe of claim 1 , wherein the leads, the die support member, and the heat sink lie in separate planes.

4. The leadframe of claim 1 , wherein each arm of the die support member has a first portion of a first width and a second portion of a second width that is greater than the first width, wherein the second portions receive and support a die.

5. The leadframe of claim 1 , wherein the leadframe is formed of a metal plated with silver, gold or platinum.

6. The leadframe of claim 5 , wherein the metal comprises an alloy of copper, aluminum or iron and nickel.

7. The leadframe of claim 1 , wherein the leadframe is formed from a single sheet of metal.

8. A semiconductor device, comprising:

a plurality of radially extending leads having inner lead portions and outer lead portions, wherein the inner lead portions define an open area having a central region;

a generally X-shaped die support member having a plurality of arms located within the open area and meeting at the central region;

a heat sink having a plurality of sections, the heat sink sections being formed between adjacent pairs of the die support member arms;

a plurality of down set tie bars connecting the heat sink sections to adjacent ones of the die support member arms, wherein the heat sink sections lie in a plane below a plane of the die support member arms;

a semiconductor die mounted to the X-shaped die support member;

means for electrically coupling the semiconductor die to the plurality of leads; and

a mold compound covering the semiconductor die, at least the inner lead portions of the leads, and the tie bars.

9. The semiconductor device of claim 8 , wherein the mold compound covers the heat sink.

10. The semiconductor device of claim 9 , wherein the heat sink sections are triangular.

11. The semiconductor device of claim 9 , wherein the leads, the die support member, and the heat sink lie in three separate planes.

12. The semiconductor device of claim 9 , wherein each arm of the die support member has a first portion of a first width and a second portion of a second width that is greater than the first width, wherein the second portions receive and support the semiconductor die.

13. The semiconductor device of claim 9 , wherein the means for electrically coupling the semiconductor die to the plurality of leads comprises a plurality of wires.

14. The semiconductor device of claim 13 , wherein the wires are connected to bonding pads on a surface of the semiconductor die and corresponding ones of the leads.

15. The semiconductor device of claim 9 , wherein the mold compound fills an area between the heat sink sections and the die support member arms.

16. The semiconductor device of claim 15 , wherein a thickness of the mold compound from the heat sink to an outer surface of the mold compound is about 14 mils.

17. A semiconductor device, comprising:

a plurality of radially extending leads having inner lead portions and outer lead portions, wherein the inner lead portions define an open area having a central region;

a generally X-shaped die support member having four arms located within the open area and meeting at the central region;

a heat sink having four triangular sections, the heat sink sections being formed between adjacent pairs of the die support member arms;

a plurality of down set tie bars connecting the heat sink sections to adjacent ones of the die support member arms, wherein the heat sink sections lie in a plane below a plane of the die support member arms;

a semiconductor die mounted to the X-shaped die support member;

a plurality of wires for electrically coupling the semiconductor die to the plurality of leads; and

a mold compound covering the semiconductor die, the wires, the inner lead portions of the leads, the tie bars, and at least one surface of the heat sink sections.

18. The semiconductor device of claim 17 , wherein the leads, the die support member, and the heat sink lie in three separate planes.

19. The semiconductor device of claim 17 , wherein the heat sink sections are encompassed by the mold compound.

Assignments (27)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0793 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →