IP Library Granted Patent US 7,619,273
Granted Patent B2
US 7,619,273 · App. 11/576,828 · Granted Nov 17, 2009

Varactor

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,619,273
App. No.
11/576,828
Granted
Nov 17, 2009
Kind
B2
Abstract

A varactor comprising a first layer separated from a second layer by an insulating layer, wherein the first layer is a first type of semiconductor material and the second layer is a second type of semiconductor material and the insulation layer is arranged to allow an accumulation region to be formed in the first layer and second layer when a positive bias is applied to the first layer and the second layer and a depletion region to be formed in the first layer and second layer when a negative bias is applied to the first layer and the second layer.

Claims (25)

1. A varactor comprising

a first layer separated from a second layer by an insulating layer, wherein the first layer is a p type of semiconductor material and the second layer is a n type of semiconductor material;

wherein the insulation layer is arranged to allow an accumulation region to be formed in the first layer and second layer when a positive bias is applied to the first layer and the second layer; and

a depletion region to be formed in the first layer and second layer when a negative bias is applied to the first layer and the second layer, the varactor characterized in that the first layer has a first doping p type region formed at the boundary to the insulating layer and a second p+ doping region formed on top of the first doping p type region.

2. A varactor according to claim 1 , wherein the doping impurities of the first layer and the second layer are arranged to be reduced at the boundary to the insulation layer to aid the formation of a depletion region within the first layer and second layer.

3. A varactor according to claim 1 , wherein the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the first layer.

4. A varactor according to claim 3 , wherein the second layer comprises a first n doping region and a second n+ doping region.

5. A varactor according to claim 1 , wherein:

the second layer has a first doping region formed at the boundary to the insulation layer and a second doping region;

the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the second layer.

6. A varactor according to claim 1 , wherein the insulation layer is an oxide layer.

7. A varactor according to claim 2 , wherein the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the first layer.

8. A varactor according to claim 2 , wherein:

the second layer has a first doping region formed at the boundary to the insulation layer and a second doping region;

the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the second layer.

9. A varactor according to claim 3 , wherein:

the second layer has a first doping region formed at the boundary to the insulation layer and a second doping region;

the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the second layer.

10. A varactor according to claim 4 , wherein:

the second layer has a first doping region formed at the boundary to the insulation layer and a second doping region;

the first doping region has a reduced number of doping impurities compared to the second doping region to aid the formation of a depletion region within the second layer.

11. A varactor according to claim 2 , wherein the insulation layer is an oxide layer.

12. A varactor according to claim 3 , wherein the insulation layer is an oxide layer.

13. A varactor according to claim 4 , wherein the insulation layer is an oxide layer.

14. A varactor according to claim 5 , wherein the insulation layer is an oxide layer.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037355/0723 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0655 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024079/0082 →
SECURITY AGREEMENT Recorded Nov 1, 2007
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 020045/0448 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 18, 2007
From: KEARNEY, NIALL K.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 019177/0992 →