Device package and methods for the fabrication and testing thereof
View Patent ↗Provided are methods of forming sealed via structures. One method involves: (a) providing a semiconductor substrate having a first surface and a second surface opposite the first surface; (b) forming a layer on the first surface of the substrate; (c) etching a via hole through the substrate from the second surface to the layer, the via hole having a first perimeter at the first surface; (d) forming an aperture in the layer, wherein the aperture has a second perimeter within the first perimeter; and (e) providing a conductive structure for sealing the via structure. Also provided are sealed via structures, methods of detecting leakage in a sealed device package, sealed device packages, device packages having cooling structures, and methods of bonding a first component to a second component.
1. A method of detecting leakage in a sealed device package, comprising:
(a) providing a sealed package containing a device, wherein the package is sealed under conditions providing a measurable deflection in a wall of the package, and wherein the extent of deflection is dependent on the pressure inside the package; and
(b) measuring the deflection of the wall after sealing the package,
wherein the deflection provided at the time of sealing is an outward deflection of the wall.
2. A sealed device package, comprising:
substrate;
a lid comprising a semiconductor material over the substrate;
a sealed volume between the substrate and the lid; and
a device in the sealed volume;
wherein the sealed volume is at a pressure such that a wall of the lid has a measurable deflection, and wherein the extent of deflection is dependent on the sealed volume pressure,
wherein the deflection is an outward deflection of the wall.
3. A method of bonding a first component to a second component, comprising:
(a) providing a plurality of layers between the first and second components, the plurality of layers comprising a first constituent layer, a second constituent layer of a different composition from the first constituent layer, and a diffusion barrier layer, wherein the diffusion barrier layer is disposed between the first and second constituent layers and the second constituent layer is disposed between the first component and the diffusion barrier layer;
(b) applying a pressure to the first component to form a bond between the first component and the second constituent layer; and
(c) heating the bonded structure to a temperature and for a time effective to cause inter-diffusion of atoms between the first and second constituent layers, wherein the resulting structure has an overall melting point greater than the heating temperature.
4. The method of claim 3 , wherein the bond in (b) is a compression bond or a thermocompression bond.
5. The method of claim 3 , wherein the first component is an optical element.
6. The method of claim 5 , wherein the second component is a silicon substrate.
7. The method of claim 3 , wherein the first constituent layer and the second constituent layer are chosen from metal and metal alloy layers.
8. The method of claim 3 , wherein the second constituent layer has a lower melting point than the first constituent layer.
9. The method of claim 3 , wherein the first constituent layer is chosen from gold, copper, silver, and bismuth, the second constituent layer material is chosen from indium, tin and bismuth, and the diffusion barrier layer is chosen from platinum, nickel, titanium tungsten, titanium nitride, and tantalum.
10. The method of claim 3 , further comprising an oxygen inhibiting layer over the second constituent layer.
11. The method of claim 10 , wherein the material of the oxygen inhibiting layer is chosen from gold, polymer films and Lu.
12. The method of claim 3 , wherein the heating temperature of (c) is below the reflow temperature of the bonded structure.
13. The method of claim 3 , further comprising:
forming a solder area on the second component prior to (b); and
after (c), bonding a third component to the solder area, wherein temperatures applied during (b) and (c) are less than the melting point of the solder area.
14. The method of claim 1 , wherein the sealed device package is sealed with helium.
15. The method of claim 1 , wherein the sealed device package comprises a base substrate and a lid, wherein the wall forms part of the lid.
16. The method of claim 1 , wherein the wall is formed of silicon.
17. The method of claim 1 , wherein the deflection measuring is by interferometry.
18. The sealed device package of claim 2 , wherein the cavity contains a helium atmosphere.