IP Library Granted Patent US 8,006,155
Granted Patent B2
US 8,006,155 · App. 11/621,361 · Granted Aug 23, 2011

Testing an operation of integrated circuitry

Assignee: International Business Machines Corporation
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Quick Facts
Patent No.
US 8,006,155
App. No.
11/621,361
Granted
Aug 23, 2011
Kind
B2
Abstract

A general purpose computational resource is provided for performing general purpose operations of a system. A special purpose computational resource is coupled to the general purpose computational resource. The special purpose computational resource is provided for: storing test patterns, a description of integrated circuitry, and a description of hardware for testing the integrated circuitry; and executing software for simulating an operation of the described hardware's testing of the described integrated circuitry in response to the test patterns.

Claims (25)

1. A system, comprising:

a general purpose computational resource for performing general purpose operations of the system; and

a special purpose computational resource, coupled to the general purpose computational resource, for: storing test patterns, a description of an integrated circuit, and a description of hardware for testing the integrated circuit; and executing software for simulating an operation of testing of the integrated circuit in response to the test patterns,

wherein the test patterns specify an expected value of the operation of testing of the integrated circuit;

wherein the special purpose computational resource is for determining whether the expected value is different from a measured value of the operation of testing of the integrated circuit; and

wherein the special purpose computational resource is for modifying the test patterns in response to a determination that the expected value is different from the measured value.

2. The system of claim 1 , wherein the description of the integrated circuit and the description of hardware for testing the integrated circuit are register-transfer level descriptions.

3. The system of claim 1 , wherein the special purpose computational resource is for receiving the test patterns and the description of the integrated circuit and the description of hardware for testing the integrated circuit from the general purpose computational resource.

4. The system of claim 1 , wherein the special purpose computational resource is for outputting an error signal in response to a determination that the expected value is different from the measured value.

5. The system of claim 1 , wherein the special purpose computational resource is for outputting the modified test patterns to the general purpose computational resource.

6. The system of claim 1 , wherein the test patterns are coded in a programming language.

7. The system of claim 1 , wherein the special purpose computational resource is for: compressing the test patterns for storage; and decompressing the test patterns for execution.

8. A method performed by an information handling system, the method comprising:

with a general purpose computational resource of the information handling system, performing general purpose operations of the information handling system; and

with a special purpose computational resource of the information handling system: storing test patterns, a description of an integrated circuit, and a description of hardware for testing the integrated circuit; executing software for simulating an operation of testing of the integrated circuit in response to the test patterns, wherein the test patterns specify an expected value of the operation of testing of the integrated circuit; determining whether the expected value is different from a measured value of the operation of testing of the integrated circuit; and modifying the test patterns in response to a determination that the expected value is different from the measured value.

9. The method of claim 8 , wherein the description of the integrated circuit and the description of hardware for testing the integrated circuit are register-transfer level descriptions.

10. The method of claim 8 , and comprising:

with the special purpose computational resource, receiving the test patterns and the description of the integrated circuit and the description of hardware for testing the integrated circuit from the general purpose computational resource.

11. The method of claim 8 , and comprising:

with the special purpose computational resource, outputting an error signal in response to a determination that the expected value is different from the measured value.

12. The method of claim 8 , and comprising:

with the special purpose computational resource, outputting the modified test patterns to the general purpose computational resource.

13. The method of claim 8 , wherein the test patterns are coded in a programming language.

14. The method of claim 8 , and comprising:

with the special purpose computational resource: compressing the test patterns for storage; and decompressing the test patterns for execution.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2007
From: FERNSLER, MATTHEW E.; GLOEKLER, TILMAN; GUPTA, SANJAY; SPANDIKOW, CHRISTOPHER J.; SWANSON, TODD
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 018737/0567 →
Continuity (1)
Related Publication 20080167853A1 · Jul 10, 2008