Probe for combined signals
View Patent ↗A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
1. A probe for simultaneously communicating a first signal and a second signal to a device, said probe comprising:
(a) a first conductor connectable to a source of said first signal and having a suspended end portion;
(b) a first contact tip nonconductively affixed to said suspended end portion of said first conductor, said first contact tip engageable with a first contact pad of said device;
(c) a resistor conductively connecting said first contact tip to said first conductor; and
(d) a second conductor connectable to a source of said second signal and arranged to provide a conductive path from said source of said second signal to said first contact pad while said first contact tip is in engagement with said first contact pad.
2. The probe of claim 1 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
3. The probe of claim 1 wherein said source of said first signal comprises a modulated signal source, said first conductor connectable to a capacitor interconnected in series with said modulated signal source.
4. The probe of claim 1 wherein said source of said second signal comprises a direct current source, said first conductor connectable to an inductor interconnected in series with said direct current source.
5. The probe of claim 1 wherein said conductive path from said source of said second signal to said first contact pad comprises a conductor connecting said second conductor and said first contact tip.
6. The probe of claim 5 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
7. The probe of claim 5 wherein said source of said first signal comprises a modulated signal source, said first conductor connectable to a capacitor interconnected in series with said modulated signal source.
8. The probe of claim 5 wherein said source of said second signal comprises a direct current source, said first conductor connectable to an inductor interconnected in series with said direct current source.
9. The probe of claim 1 wherein said conductive path from said source of said second signal to said first contact pad comprises a second contact tip arranged to engage said first contact pad while said first contact tip is in engagement with said first contact pad.
10. The probe of claim 9 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
11. The probe of claim 9 wherein said source of said first signal comprises a modulated signal source, said first conductor connectable to a capacitor interconnected in series with said modulated signal source.
12. The probe of claim 9 wherein said source of said second signal comprises a direct current source, said first conductor connectable to an inductor interconnected in series with said direct current source.
13. A probe for simultaneously communicating a first signal and a second signal to a device, said probe comprising:
(a) a support block;
(b) a first conductor having a first end portion conductively connected to a first connector affixed to said support block and a suspended second end portion, said first conductor conductively connectable to a source of said first signal through said first connector;
(c) a first contact tip conductively engageable with a first contact pad of said device and affixed relative to said second end portion of said first conductor but not conductively connected to said first conductor;
(d) a resistor conductively connecting said first contact tip and said first conductor; and
(e) a second conductor having a first end portion conductively connected to a second connector affixed to said support block and a suspended second end portion, said second conductor connectible to a source of said second signal through said second connector and arranged to provide a conductive path to said first contact pad for said second signal while said first contact tip is in engagement with said first contact pad.
14. The probe of claim 13 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
15. The probe of claim 13 wherein said source of said first signal comprises a modulated signal source, said first conductor conductively connectable to a capacitor interconnected in series with said modulated signal source.
16. The probe of claim 13 wherein said source of said second signal comprises a direct current source, said first conductor conductively connectable to an inductor interconnected in series with said direct current source.
17. The probe of claim 13 wherein said conductive path from said source of said second signal to said first contact pad comprises a conductor connecting said second conductor and said first contact tip.
18. The probe of claim 17 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
19. The probe of claim 17 wherein said source of said first signal comprises a modulated signal source, said first conductor conductively connectable to a capacitor interconnected in series with said modulated signal source.
20. The probe of claim 17 wherein said source of said second signal comprises a direct current source, said first conductor conductively connectable to an inductor interconnected in series with said direct current source.
21. The probe of claim 13 wherein said conductive path from said source of said second signal to said first contact pad comprises a second contact tip arranged to engage said first contact pad while said first contact tip is in engagement with said first contact pad.
22. The probe of claim 21 further comprising a third conductor connectable to a ground potential and including a first conductive end portion spaced laterally apart from said first contact tip and a second conductive end portion spaced laterally apart from said first contact tip on a side of said first contact tip opposite said first conductive end portion, said first and said second conductive end portions engageable with at least one additional contact pad of said device.
23. The probe of claim 21 wherein said source of said first signal comprises a modulated signal source, said first conductor connectable to a capacitor interconnected in series with said modulated signal source.
24. The probe of claim 21 wherein said source of said second signal comprises a direct current source, said first conductor connectable to an inductor interconnected in series with said direct current source.