Semiconductor device, an electronic device and a method for operating the same

1. A semiconductor memory device comprising:

a plurality of memory cells, each of the memory cells including a transistor; and

circuitry coupled to the memory cells, wherein the circuitry is configured to change a potential of a body of the transistor of each memory cell to a degree depending on a charging state of the body while maintaining a gate electrode of the transistor in a non-addressed state.

2. The semiconductor memory device of claim 1 , wherein the transistor of each memory cell comprises an electrically floating body transistor, and the body of the transistor comprises an electrically floating body region configured to adopt data states representative of an amount of charges stored in the body region.

3. The semiconductor memory device of claim 2 , wherein the electrically floating body transistor of each memory cell is an N-channel type transistor.

4. The semiconductor memory device of claim 3 , wherein the circuitry is configured to apply electrical signals to a doped portion of a corresponding one of the transistors, and the electrical signals comprise a positive voltage pulse.

5. The semiconductor memory device of claim 2 , wherein the electrically floating body transistor is a P-channel type transistor.

6. The semiconductor memory device of claim 5 , wherein the circuitry is configured to apply electrical signals to a doped portion of a corresponding one of the transistors, and the electrical signals comprise a negative voltage pulse.

7. The semiconductor memory device of claim 2 , wherein:

the charging state of the body of the transistor of each memory cell depends on an amount of carriers stored in the body; and

upon application of the signal, the carriers are removed from at least one first memory cell in a first charging state, and the carriers are substantially maintained in at least one second memory cell in a second charging state, the first charging state being different from the second charging state.

8. The semiconductor memory device of claim 7 , wherein the circuitry further comprises data sensing circuitry coupled to the plurality of memory cells, and the data sensing circuitry is configured to determine data states of the memory cells.

9. The semiconductor memory device of claim 8 , wherein the electrically floating body transistor of each memory cell is configured to generate a current between a first and second source/drain portion in response to a read control signal transmitted by the data sensing circuitry, the current being representative of the data state of the memory cell.

10. The semiconductor memory device of claim 7 , wherein the electrically floating body transistor of each memory cell is an N-channel type transistor.

11. The semiconductor memory device of claim 10 , wherein the electrical signals comprise a positive voltage pulse applied to one of the source/drain portions of a corresponding one of the transistors.

12. The semiconductor memory device of claim 7 , wherein the electrically floating body transistor of each memory cell is a P-channel type transistor.

13. The semiconductor memory device of claim 12 , wherein the electrical signals comprise a negative voltage pulse applied to one of the source/drain portions of a corresponding one of the transistors.

14. The semiconductor memory device of claim 7 , wherein the circuitry is operable to simultaneously apply the electrical signals to the first and second memory cells.

15. The semiconductor memory device of claim 7 , wherein the memory cells are arranged in rows and columns and the circuitry is configured to simultaneously apply the electrical signals to memory cells of at least one row or column.

16. The semiconductor memory device of claim 7 , wherein the circuitry is configured to simultaneously apply the electrical signals to all the memory cells of the semiconductor memory device.

17. The semiconductor memory device of claim 1 , wherein the circuitry further comprises a data sensing circuitry coupled to the memory cells, the data sensing circuitry being configured to determine data states of the memory cells.

18. The semiconductor memory device of claim 1 , wherein the circuitry is configured to generate signals to be applied to one of a source region and a drain region of the transistor of each memory cell.

19. An electronic device comprising the semiconductor memory device of claim 1 .

20. The electronic device according to claim 19 , wherein the electronic device is selected from the group consisting of: a computer, a server, a router, a game console, a graphics card, a personal digital assistant, a digital camera, a cell phone, an audio system, a video system and a processing device.

21. The electronic device of claim 19 , wherein the electronic device is portable.

22. The electronic device of claim 19 , wherein the electronic device is battery operated.