Method for accessing a memory

1. A method for accessing a memory comprising a cell array having a plurality of memory cells arranged in cell array elements, the method comprising:

deactivating a cell array element;

applying an address of the deactivated cell array element to an activation apparatus of the memory in order to activate the deactivated cell array element for a memory access in which a memory cell arranged in a cell array element is to be accessed;

comparing the applied address with error addresses which are stored in the activation apparatus and which are assigned to defective cell array elements of the cell array; and

in response to a match between the applied address and one of the error addresses, activating a redundant cell array element of the cell array instead of the deactivated cell array element; wherein activating the redundant cell array element comprises issuing a signal from the activation apparatus.

2. The method as claimed in claim 1 , wherein all of the defective cell array elements of the cell array are deactivated prior to a first application of an address associated with any of the cell array elements to the activation apparatus.

3. The method as claimed in claim 1 , wherein the cell array comprises rows and columns in which the memory cells are arranged, and wherein the deactivated cell array element is a column of the cell array of the memory.

4. The method as claimed in claim 3 , wherein the memory access comprises activating a respective row containing the memory cell to be accessed, and wherein deactivating the cell array element is done when the respective row is activated.

5. The method as claimed in claim 3 , wherein deactivating the cell array element is done when the memory is switched on.

6. The method as claimed in claim 1 , wherein the cell array comprises rows and columns in which the memory cells are arranged, and wherein the defective cell array element is a row of the cell array of the memory.

7. The method as claimed in claim 6 , deactivating the cell array element is done when the memory is switched on.

8. The method as claimed in claim 6 , wherein all of the defective cell array elements of the cell array are deactivated prior to a first application of an address associated with any of the cell array elements to the activation apparatus.

9. The method as claimed in claim 1 , wherein all of the defective cell array elements of the cell array are deactivated prior to a first application of an address associated with any of the cell array elements to the activation apparatus; wherein the cell array comprises rows and columns in which the memory cells are arranged, and wherein the deactivated cell array element is a column of the cell array of the memory.

10. A device, comprising:

a cell array having a plurality of memory cells arranged in cell array elements;

a storage area containing error addresses assigned to defective cell array elements of the cell array; and

an activation apparatus configured to:

deactivate a cell array element;

as part of a memory access operation, receive an address of the deactivated cell array element;

compare the received address with the error addresses; and

in response to determining a match between the received address and one of the error addresses, activating a redundant cell array element of the cell array instead of the deactivated cell array element.

11. The device of claim 10 , wherein the cell array is part of a dynamic random access memory device.

12. A memory device, comprising a cell array having a number of memory cells arranged in cell array elements, comprising an activation apparatus for activating a cell array element for a memory access, wherein, when a memory cell arranged in a cell array element of the memory is accessed, an address of the relevant cell array element is applied to the activation apparatus in order to activate the relevant cell array element for the memory access, wherein the applied address is compared with error addresses which are stored in the activation apparatus and which are assigned to defective cell array elements, wherein, in the event of a match between the applied address and one of the error addresses, a redundant cell array element is activated instead of the relevant defective cell array element with the aid of the activation apparatus, wherein the memory is designed to deactivate the relevant defective cell array element prior to the application of the address associated with the relevant cell array element to the activation apparatus.