IP Library Granted Patent US 8,592,314
Granted Patent B2
US 8,592,314 · App. 11/794,201 · Granted Nov 26, 2013

Polishing composition and polishing method

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Quick Facts
Patent No.
US 8,592,314
App. No.
11/794,201
Granted
Nov 26, 2013
Kind
B2
Abstract

The present invention aims to provide a polishing composition which allows high-speed polishing of a barrier film and an inter-layer dielectric film along with a wiring metal at the same time, while preventing dishing and erosion, and particularly maintaining the flatness of metal film. The chemical-mechanical polishing composition of the present invention comprises a dicarboxylic acid having 7 to 13 carbon atoms, an oxidizing agent, an abrasive and water.

Claims (19)

1. A chemical-mechanical polishing composition, comprising an aliphatic dicarboxylic acid having 8 to 13 carbon atoms in an amount of 0.3 to 10 mass % based on the chemical-mechanical polishing composition, one or more additional acids in an amount of 0.1 mass % or less based on the chemical-mechanical polishing composition, an oxidizing agent, an abrasive and water, and having a pH of 2 to 4.

2. The chemical-mechanical polishing composition according to claim 1 , wherein the dicarboxylic acid is a dicarboxylic acid which does not have an additional hydroxyl group.

3. The chemical-mechanical polishing composition according to claim 1 , wherein the dicarboxylic acid is sebacic acid, tridecanedioic acid, or mixtures thereof.

4. The chemical-mechanical polishing composition according to claim 1 , wherein the oxidizing agent is hydrogen peroxide.

5. The chemical-mechanical polishing composition according to claim 1 , wherein the abrasive is a colloidal silica.

6. The chemical-mechanical polishing composition according to claim 1 , wherein the one or more additional acids comprises at least one selected from the group consisting of a sulfonic acid, a carboxylic acid, an amino acid, sulfuric acid, a phosphoric acid, a phosphonic acid, and nitric acid.

7. The chemical-mechanical polishing composition according to claim 1 , wherein the composition comprises one or more alkali metal ions.

8. The chemical-mechanical polishing composition according to claim 1 , wherein the composition comprises an alkali metal ion, and exclusively comprises, as the contents other than the alkali metal ion, the dicarboxylic acid having 8 to 13 carbon atoms, the oxidizing agent, the abrasive and water.

9. The chemical-mechanical polishing composition according to claim 7 , wherein the alkali metal ion is potassium ion.

10. The chemical-mechanical polishing composition according to claim 1 , wherein the content of the dicarboxylic acid is from 1 to 10 mass % based on the chemical-mechanical polishing composition.

11. The chemical-mechanical polishing composition according to claim 1 , wherein the content of the oxidizing agent is from 0.01 to 30 mass % based on the chemical-mechanical polishing composition.

12. The chemical-mechanical polishing composition according to claim 1 , wherein the content of the abrasive is 30 mass % or less based on the chemical-mechanical polishing composition.

13. A method for polishing a substrate, wherein the method comprises planarizing a substrate by using the chemical-mechanical polishing composition according to claim 1 , the substrate comprising an insulating film having a trench, a barrier film formed on the insulating film, and a wiring material film buried in the trench and covering the barrier film.

14. The polishing method according to claim 13 , wherein the wiring material is copper or a copper alloy.

15. The polishing method according to claim 13 , wherein the insulating film is a film of an inorganic silicon compound or an organic compound.

16. The polishing method according to claim 15 , wherein the inorganic silicon compound is at least one material selected from the group consisting of SiO 2 , SiN, SiNO, SiOC, SiCN and mixtures thereof.

17. The polishing method according to claim 13 , wherein the barrier film is a film of at least one material selected from the group consisting of tantalum, a tantalum alloy, a tantalum compound and mixtures thereof.

18. A kit comprising a plurality of compositions, wherein the plurality of compositions provides the chemical-mechanical polishing composition according to claim 1 when plurality of compositions are mixed together or when plurality of compositions are mixed together and diluted with water.

19. A method for transporting or storing a chemical-mechanical polishing composition, wherein the method comprises utilizing the kit according to claim 1 .

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2014
From: SHOWA DENKO K.K.
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 034035/0134 →