IP Library Granted Patent US 7,919,767
Granted Patent B2
US 7,919,767 · App. 11/812,752 · Granted Apr 5, 2011

Semiconductor memory device and fabrication method thereof

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Quick Facts
Patent No.
US 7,919,767
App. No.
11/812,752
Granted
Apr 5, 2011
Kind
B2
Abstract

A semiconductor memory device comprises a heater electrode, a phase change portion, a heat insulation portion and an upper electrode. The phase change portion comprises a concave portion and a contact portion. The concave portion is in contact with the heater electrode. The contact portion is formed integrally with the concave portion. The heat insulation portion is formed in the concave portion. The upper electrode is formed on the contact portion and the heat insulation portion so that the heat insulation portion is positioned between the concave portion and the upper electrode.

Claims (18)

1. A semiconductor device comprising:

a first insulating layer having an upper surface;

a heater electrode embedded into the first insulating layer such that an upper surface of the heater electrode is substantially coplanar with the upper surface of the first insulating layer;

a second insulating layer formed on the first insulating layer, the second insulating layer including a hole that exposes the upper surface of the heater electrode and a first part of the upper surface of the first insulating layer around the upper surface of the heater electrode;

a phase change layer including a first portion that is formed in contact with the upper surface of the heater electrode and with the first part of the upper surface of the first insulating layer through the hole, the phase change layer further including a second portion that is elongated from the first portion over a part of the second insulating layer;

an upper electrode including a first part that is in contact with the second portion of the phase change layer, the upper electrode further including a second part that is elongated from the first part over the first portion of the phase change layer with a gap therebetween; and

a heat isolation layer formed between the first portion of the phase change layer and the second part of the upper electrode to fill the gap.

2. The device as claimed in claim 1 , wherein the heat isolation layer is formed such that an upper surface thereof is substantially coplanar with an upper surface of the second portion of the phase change layer.

3. The device as claimed in claim 1 , wherein the heat isolation layer comprises a plurality of insulation films different in material from each other.

4. The device as claimed in claim 1 , wherein the hole comprises a tapered hole.

5. The device as claimed in claim 1 , wherein

the heater electrode comprises a first heater electrode, and the device further comprises a second heater electrode that is embedded into the first insulating layer such that an upper surface of the second heater electrode is substantially coplanar with the upper surface of the first insulating layer;

the hole of the second insulating layer further exposing the upper surface of the second heater electrode and a second part of the upper surface of the first insulating layer around the upper surface of the second heater electrode,

the first portion of the phase change layer being elongated to be in contact with the upper surface of the second heater electrode and with the second part of the upper surface of the first insulating layer,

the phase change layer further including a third portion that is elongated from the first portion over another part of the second insulating layer separately from the second portion; and

the upper electrode further including a third part that is in contact with the third portion of the phase change layer and merged with the second part of the upper electrode.

6. The device as claimed in claim 5 , further comprising first and second driving elements connected respectively to the first and second heater electrodes, the phase change layer being thereby used in common to the first and second driving elements.

7. The device as claimed in claim 6 , wherein the first driving element comprises a first transistor and the second driving element comprises a second transistor, one of source and drain electrodes of the first transistor being connected to the first heater electrode, one of the source and drain electrodes of the second transistor being connected to the second heater electrode, and the other of the source and drain electrodes of the first transistor being connected to the other of the source and drain electrodes of the second transistor.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2014
From: ELPIDA MEMORY, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 032645/0422 →