Method for processing interior of vapor phase deposition apparatus, method for depositing thin film and method for manufacturing semiconductor device
A method for depositing a metal compound film on the wafer by using a vapor phase deposition apparatus 100 , including: forming a thin film on the wafer in an interior of the vapor phase deposition apparatus 100 by introducing a source gas for the metal compound film containing Hf or Zr; unloading the wafer having the metal compound film formed thereon from the interior of the vapor phase deposition apparatus 100 ; introducing a reactive gas in the interior of the vapor phase deposition apparatus 100 to immobilize the unreacted organic compound 180 derived from the source gas remained in the interior of the vapor phase deposition apparatus 100 ; loading another wafer in the interior of the vapor phase deposition apparatus 100 ; and depositing metal compound film on another wafer by further introducing the source gas in the interior of the vapor phase deposition apparatus 100 , in the condition that the unreacted organic compound 180 exists therein as an immobilized form, is presented.
1. A method for processing an interior of a vapor phase deposition apparatus, after conducting a deposition of a thin film by utilizing an organic source material including Zr or Hf and an oxidizing gas within said vapor phase deposition apparatus, comprising:
immobilizing an unreacted organic compound within the interior of said vapor phase deposition apparatus by introducing said oxidizing gas into the interior of said vapor phase deposition apparatus, without opening said vapor phase deposition apparatus to the atmosphere;
wherein said organic source material is M(NRR′), where the R or R′ is hydrocarbon substitute, M is Zr or Hf.
2. The method as claimed in claim 1 , said vapor phase deposition is atomic layer deposition.
3. The method as claimed in claim 1 , wherein R is methyl group and R′ is ethyl group.
4. The method as claimed in claim 1 , wherein a process for immobilizing said unreacted organic compound is conducted in every time after a deposition process for a wafer.
5. The method as claimed in claim 1 , wherein a process for immobilizing said unreacted organic compound is conducted in every time between lot processing for said films.
6. The method as claimed in claim 1 , wherein said oxidizing gas is O 3 .
7. The method as claimed in claim 6 , wherein flow ratio of O 3 gas is between 100 to 2000 sccm.
8. The method as claimed in claim 6 , wherein concentration of O 3 gas is between 50 to 300 g/Nm 3 .
9. The method as claimed in claim 6 , wherein pressure of O 3 gas is between 0.05 to 50 torr.
10. The method as claimed in claim 1 , wherein duration time of introducing oxidizing gas is longer than the oxidation step in said deposition.
11. The method as claimed in claim 10 , wherein said duration time is not shorter than 30 second.