Method of forming insulating film and method of manufacturing semiconductor device

1. A method of forming an insulating film for use in a semiconductor device, comprising:

depositing a conductive metal nitride material;

depositing a tantalum nitride film on said conductive metal nitride material; and

performing thermal oxidation of said tantalum nitride film by a wet oxidation process at a temperature range of 200 to 400 degrees centigrade, whereby a tantalum oxide film is formed as said insulating film, said tantalum oxide film has an amorphous structure,

wherein all of the deposited tantalum nitride is oxidized, and

wherein said tantalum oxide film has a laminated structure composed of a first film having nonstoichiometric composition and a second film having stoichiometric composition.

2. The method of forming an insulating film according to claim 1 ,

wherein said thermal oxidation is performed in the air atmosphere.

3. The method of forming an insulating film according to claim 1 , further comprising:

performing surface oxidation of said tantalum nitride film, whereby said amorphous structure is obtained.

4. The method of forming an insulating film according to claim 1 ,

wherein said first and second films are a tantalum suboxide film and an amorphous Ta 2 O 5 film, respectively.

5. The method of forming an insulating film according to claim 1 ,

wherein said tantalum oxide film is used as a capacitance insulating film in said semiconductor device.

6. A method of manufacturing a semiconductor device, comprising:

forming said tantalum oxide film using the method of forming an insulating film according to claim 1 .

7. The method of forming an insulating film according to claim 1 , wherein said conductive metal nitride material is titanium nitride.