Manufacturing method of a semiconductor device, and substrate processing apparatus
View Patent ↗An object of this invention is to make it possible to suppress early-stage oxidation of a substrate surface prior to oxidation processing, and to remove a natural oxidation film. For this reason, a method is provided comprising the steps of loading a substrate into a processing chamber, supplying a hydrogen-containing gas and an oxygen-containing gas into the processing chamber, and subjecting a surface of the substrate to oxidation processing, and unloading the substrate subjected to oxidation processing from the processing chamber. In the oxidation processing step, the hydrogen-containing gas is introduced in advance into the processing chamber, with the pressure inside the processing chamber set at a pressure that is less than atmospheric pressure, and the oxygen-containing gas is then introduced in the state in which the introduction of the hydrogen-containing gas is continued.
1. A manufacturing method of a semiconductor device comprising the steps of:
loading a substrate into a processing chamber;
supplying a hydrogen-containing gas and an oxygen-containing gas into said processing chamber, and subjecting a surface of said substrate to oxidation processing; and
loading said substrate subjected to oxidation processing out of said processing chamber; wherein,
in said oxidation processing step, a pressure inside said processing chamber is set at a pressure that is less than atmospheric pressure, the hydrogen-containing gas is introduced in advance into said processing chamber, and the oxygen-containing gas is then introduced in a state in which the introduction of the hydrogen-containing gas is continued.
2. The manufacturing method of a semiconductor device according to claim 1 , said oxidation processing step comprising the steps of:
increasing a temperature inside the processing chamber to a processing temperature from a temperature at the time at which the substrate is loaded;
maintaining the temperature inside the processing chamber at the processing temperature; and
lowering the temperature inside the processing chamber from the processing temperature to a temperature at the time at which the substrate is unloaded; wherein
the introduction of said hydrogen-containing gas is performed at least from the step of increasing the temperature inside the processing chamber, and the introduction of the oxygen-containing gas is performed at least during the step of maintaining the temperature inside the processing chamber at the processing temperature.
3. The manufacturing method of a semiconductor device according to claim 1 , said oxidation processing step comprising the steps of:
increasing a temperature inside the processing chamber to a processing temperature from a temperature at the time at which the substrate is loaded;
maintaining the temperature inside the processing chamber at the processing temperature; and
lowering the temperature inside the processing chamber from the processing temperature to a temperature at the time at which the substrate is unloaded; wherein
the introduction of said hydrogen-containing gas is performed from a point prior to the step of increasing the temperature inside the processing chamber, and the introduction of the oxygen-containing gas is performed at least during the step of maintaining the temperature inside the processing chamber at the processing temperature.
4. The manufacturing method of a semiconductor device according to claim 1 , wherein the pressure inside the processing chamber at the time that said hydrogen-containing gas is introduced in advance in said oxidation processing step is set at a value that is greater than the pressure at the time at which the oxygen-containing gas is introduced in a state in which the introduction of said hydrogen-containing gas is continued in the oxidation processing step.
5. The manufacturing method of a semiconductor device according to claim 1 , wherein at least a layer that contains silicon atoms but does not contain metal atoms and a layer that contains metal atoms are exposed at the surface of said substrate.
6. The manufacturing method of a semiconductor device according to claim 5 , wherein the flow rate ratio B/A of the flow rate B of said hydrogen-containing gas to the flow rate A of said oxygen-containing gas is set at 2 or greater in said oxidation processing step.
7. The manufacturing method of a semiconductor device according to claim 6 , wherein the pressure inside said processing chamber when said oxygen-containing gas is introduced in a state in which the introduction of said hydrogen-containing gas is continued in said oxidation processing step is set at 1333 Pa (10 torr) or less.
8. The manufacturing method of a semiconductor device according to claim 5 , wherein, in said oxidation processing step, said hydrogen-containing gas is introduced in advance into said processing chamber, said oxygen-containing gas is then introduced in a state in which the introduction of said hydrogen-containing gas is continued, and the introduction of said oxygen-containing gas is subsequently stopped in the state in which the introduction of said hydrogen-containing gas is continued.
9. The manufacturing method of a semiconductor device according to claim 5 , said oxidation processing step comprising the steps of:
increasing a temperature inside the processing chamber to a processing temperature from a temperature at the time at which the substrate is loaded;
maintaining the temperature inside the processing chamber at the processing temperature; and
lowering the temperature inside the processing chamber from the processing temperature to a temperature at the time at which the substrate is unloaded; wherein
the introduction of said hydrogen-containing gas is continued at least from the step of increasing the temperature inside the processing chamber to the point at which the step of lowering the temperature inside the processing chamber is completed, and the introduction of said oxygen-containing gas is performed at least during the step of maintaining the temperature inside the processing chamber at the processing temperature.
10. The manufacturing method of a semiconductor device according to claim 5 , said oxidation processing step comprising the steps of:
increasing a temperature inside the processing chamber to a processing temperature from a temperature at the time at which the substrate is loaded;
maintaining the temperature inside the processing chamber at the processing temperature; and
lowering the temperature inside the processing chamber from the processing temperature to a temperature at the time at which the substrate is unloaded; wherein
the introduction of said hydrogen-containing gas is continued from a point prior to the step of increasing the temperature inside the processing chamber to a point following the step of lowering the temperature inside the processing chamber, and the introduction of said oxygen-containing gas is performed at least during the step of maintaining the temperature inside the processing chamber at the processing temperature.
11. The manufacturing method of a semiconductor device according to claim 5 , wherein said layer that contains silicon atoms but does not contain metal atoms is at least one layer selected from the group including a silicon single crystal substrate, a polycrystalline silicon film (poly-Si film), a silicon nitride film (Si 3 N 4 film), and a silicon dioxide film (SiO 2 film), and said layer that contains metal atoms is at least one layer selected from the group including a silicide film, a metal film, and a metal oxide film.
12. A manufacturing method of a semiconductor device comprising the steps of:
loading into a processing chamber a substrate in which at least a layer that contains silicon atoms but does not contain metal atoms and a layer that contains metal atoms are exposed at the surface;
supplying a hydrogen-containing gas and an oxygen-containing gas into said processing chamber, and subjecting a surface of said substrate to oxidation processing; and
unloading said substrate subjected to oxidation processing from said processing chamber; wherein,
in said oxidation processing step, a pressure inside said processing chamber is set at a pressure that is less than atmospheric pressure, and a flow rate ratio B/A of a flow rate B of the hydrogen-containing gas B to a flow rate A of the oxygen-containing gas is set at 2 or greater.
13. The manufacturing method of a semiconductor device according to claim 12 , wherein the pressure inside said processing chamber and said flow rate ratio B/A in said oxidation processing step are set in a range in which only said layer that contains silicon atoms but does not contain metal atoms is selectively oxidized without any oxidation of said layer that contains metal atoms.
14. The manufacturing method of a semiconductor device according to claim 12 , wherein, in said oxidation processing step, the pressure inside said processing chamber is set at 1333 Pa (10 torr) or less, and said flow rate ratio B/A is set at 2 or greater.
15. The manufacturing method of a semiconductor device according to claim 12 , wherein, in said oxidation processing step, the pressure inside said processing chamber is set at 1333 Pa (10 torr) or less, and said flow rate ratio B/A is set at a value ranging from 2 or greater to 5 or less.