Semiconductor device including a trench with a curved surface portion and method of manufacturing the same
View Patent ↗A semiconductor device includes a trench provided in a semiconductor substrate, a gate electrode formed in the trench through a gate dielectric film, and a diffusion layer formed in the vicinity of the trench. The trench includes an opening portion provided in a surface of the semiconductor substrate, a recess curved surface portion including a cross-sectional contour having a substantially circular arc shape, and a connection curved surface portion connecting the recess curved surface portion and the opening portion. The connection curved surface portion includes a continuous curved surface between the opening portion and the recess curved surface portion.
1. A semiconductor device comprising:
a trench provided in a semiconductor substrate;
a gate electrode formed in the trench through a gate dielectric film; and
a diffusion layer formed in a vicinity of the trench,
wherein the trench comprises:
an opening portion provided in a surface of the semiconductor substrate;
a recess curved surface portion comprising a cross-sectional contour having a substantially circular arc shape; and
a connection curved surface portion connecting the recess curved surface portion and the opening portion, and
wherein the connection curved surface portion comprises a continuous curved surface between the opening portion and the recess curved surface portion.
2. The semiconductor device as recited in claim 1 , further comprising:
a trench gate transistor including the trench, the gate electrode and the diffusion layer,
wherein the semiconductor device comprises a dynamic random access memory using the trench gate transistor as a transfer gate transistor of a memory cell.
3. The semiconductor device as recited in claim 1 , wherein a width of the connection curved surface portion gradually increases between the opening portion and the recess curved surface portion.
4. The semiconductor device as recited in claim 1 , wherein a least width of the opening portion comprises a least width of the trench.
5. The semiconductor device as recited in claim 1 , wherein a bottom of the diffusion layer is formed in a vicinity of the recess curved surface portion of the trench.
6. The semiconductor device as recited in claim 1 , wherein the opening portion adjoins the connection curved surface portion at a location in the trench where a width of the trench includes a least width of the trench.
7. The semiconductor device as recited in claim 1 , wherein a width of an opening of the connection curved surface portion comprises a minimum width of the trench.
8. The semiconductor device as recited in claim 7 , wherein a distance between the opening of the connection curved surface portion and a center of the circular arc shape is greater than a radius of the circular are shape.
9. The semiconductor device as recited in claim 1 , wherein the recess curved surface portion comprises a first portion which forms a bottom of the trench and comprises the substantially circular arc shape.
10. The semiconductor device as recited in claim 9 , wherein the recess curved surface portion comprises a second portion comprising an arc shape having a radius which is greater than a radius of the circular arc shape of the first portion.
11. A semiconductor device, comprising:
a trench provided in a semiconductor substrate;
a gate electrode formed in the trench through a sate dielectric film; and
a diffusion layer formed in a vicinity of the trench,
wherein a cross-sectional contour of the trench is substantially U-shaped, a width of an opening portion of the trench is smaller than the width of a bottom portion of the trench, and a surface extending from the opening portion to the bottom portion comprises a continuous curved surface, and
wherein the surface extending from the opening portion to the bottom portion comprises a non-angular portion.
12. The semiconductor device as recited in claim 11 , further comprising:
a trench gate transistor including the trench, the gate electrode and the diffusion layer,
wherein the semiconductor device comprises a dynamic random access memory using the trench gate transistor as a transfer gate transistor of a memory cell.
13. A trench structure for a trench gate transistor of a semiconductor device, the trench structure comprising:
an opening portion provided in a surface of a semiconductor substrate;
a recess curved surface portion comprising:
a first portion which forms a bottom of the trench structure and comprises the substantially circular arc shape; and
a second portion comprising an arc shape having a radius which is greater than a radius of the circular arc shape of the first portion; and
a connection curved surface portion connecting the second portion of the recess curved surface portion and the opening portion.
14. The trench structure according to claim 13 , wherein the trench structure is formed in a semiconductor substrate of a trench gate transistor in a semiconductor device, the transistor further comprising:
a gate electrode formed in the trench structure; and
a diffusion layer formed in a vicinity of the trench structure, a bottom of the diffusion layer being farmed in a vicinity of the recess curved surface portion of the trench structure.
15. The trench structure according to claim 14 , wherein the bottom of the diffusion layer is formed in a vicinity of the second portion of the recess curved surface portion of the trench structure.