IP Library Granted Patent US 8,752,228
Granted Patent B2
US 8,752,228 · App. 11/912,126 · Granted Jun 17, 2014

Apparatus for cleaning of circuit substrates

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Quick Facts
Patent No.
US 8,752,228
App. No.
11/912,126
Granted
Jun 17, 2014
Kind
B2
Abstract

Silicon wafers and the like are cleaned using new scrubber-type apparatus in which measures are taken to compensate for differential cleaning of the central region of the wafer by: using rotary brushes having one or more non-contact portions arranged in the section thereof that faces the central region of the substrate, or toggling the relative position of the wafer and the rotary brushes, or directing cleaning fluid(s) preferentially towards the central region of the wafer. Another aspect of the invention provides scrubber-type cleaning apparatus in which the rotary brushes are replaced by rollers ( 110 ). A web of cleaning material ( 116 ) is interposed between each roller and the substrate. Various different webs of cleaning material may be used, e.g. a length of tissue, a continuous loop of cleaning material whose surface is reconditioned on each cleaning pass, adhesive material provided on a carrier tape, etc.

Claims (25)

1. A circuit substrate cleaning apparatus comprising:

a pair of elongate rollers arranged such that curved surfaces thereof oppose each other across a gap, each roller being rotatable about its longitudinal axis and the outer curved surface of each roller being adapted for cleaning; and

circuit substrate support means for supporting and rotating a circuit substrate between, and in contact with, the rollers, the circuit substrate support comprising at least four pair of capstans, each capstan of each pair of capstans being movable between a first position in contact with the edge of the circuit substrate and a second position spaced apart from each other by a distance sufficient to pass around the pair of elongated rollers, at least two pairs of capstans of the plurality of pairs of capstans concurrently in contact with the circuit substrate when the pair of elongated rollers is in contact with the circuit substrate;

characterized by comprising compensating means adapted to reduce inequalities in cleaning across a radial direction of the circuit substrate; wherein the compensating means comprises means for moving the circuit substrate relative to the rollers in the radial direction of the circuit substrate while the circuit substrate is being supported and rotated between the rollers.

2. Circuit substrate cleaning apparatus according to claim 1 , wherein the compensating means comprises one or more non-contact regions provided in the curved surfaces of the rollers at a location arranged to face said central region of a circuit substrate being supported between the rollers.

3. Circuit substrate cleaning apparatus according to claim 1 , wherein the compensating means comprises means for directing cleaning fluid towards said central region of the circuit substrate while the circuit substrate is being supported and rotated between the rollers.

4. Circuit substrate cleaning apparatus comprising:

a pair of elongate rollers arranged such that curved surfaces thereof oppose each other across a gap, each roller being rotatable about its longitudinal axis;

circuit substrate support means for supporting a circuit substrate in the gap between the rollers; and

feeding means for feeding a web of cleaning material between one of said rollers and a circuit substrate supported in the gap between the rollers such that, in use, the cleaning material contacts said circuit substrate;

wherein the support means is configured to reduce inequalities in cleaning across the radial direction of the circuit substrate;

wherein:

the rollers are wider than the circuit substrate to be cleaned; and

the circuit substrate support means comprises a plurality of pairs of capstans, the capstans of each pair being movable between a first position in contact with the edge of the circuit substrate and a second position spaced apart from each other by a distance sufficient to pass around the rollers, at least two pairs of capstans of the plurality of pairs of capstans concurrently in contact with the circuit substrate when the web of cleaning material is in contact with the circuit substrate;

wherein the plurality of pairs of capstans or the rollers are configured to move the circuit substrate in a radial direction of the circuit substrate relative to the rollers to reduce inequalities in cleaning across the radial direction of the circuit substrate.

5. Circuit substrate cleaning apparatus according to claim 4 , and further comprising dispensing means for applying cleaning fluid to at least one of said web of cleaning material and said circuit substrate.

6. Circuit substrate cleaning apparatus according to claim 4 , wherein the feeding means is arranged to feed between a roller and a circuit substrate supported in the gap between the rollers a web of cleaning material comprising a layer of porous material and an impermeable backing tape, with the backing tape arranged to face towards the roller.

7. Circuit substrate cleaning apparatus according to claim 4 , wherein the feeding means is arranged to feed between a roller and a circuit substrate supported in the gap between the rollers a web of cleaning material comprising a layer of adhesive material and a carrier tape, with the carrier tape arranged to face towards the roller.

8. Circuit substrate cleaning apparatus according to claim 4 , wherein the feeding means comprises means for feeding a first web of cleaning material between a first one of said rollers and a first major surface of a circuit substrate supported in the gap between the rollers and means for feeding a second web of cleaning material between the second one of said rollers and the second major surface of said circuit substrate.

9. Circuit substrate cleaning apparatus according to claim 4 , and comprising a surface-reconditioning station for reconditioning the surface of said web of cleaning material, wherein the feeding means is adapted to circulate a continuous loop of cleaning material along a path passing through the gap between the rollers and passing through the surface-reconditioning station.

10. Circuit substrate cleaning apparatus according to claim 9 , and comprising a rinsing station for rinsing said web of cleaning material, wherein the feeding means is adapted to circulate the continuous loop of cleaning material along a path passing through said rinsing station.

11. Circuit substrate cleaning apparatus according to claim 4 , wherein the circuit substrate support means is arranged such that the capstans impart a rotary motion to the circuit substrate being cleaned.

12. Circuit substrate cleaning apparatus according to claim 4 , wherein said plurality of pairs of capstans comprises a first set of capstans adapted to contact the circuit substrate before the circuit substrate has made contact with the web of cleaning material and a second set of capstans adapted to contact the circuit substrate after the circuit substrate has made contact with the web of cleaning material.

13. Circuit substrate cleaning apparatus according to claim 4 , wherein at least one pair of capstans of the at least two capstans is in contact with the circuit substrate on one side of the center line of the circuit substrate and at least one other pair of capstans of the at least two capstans with the circuit substrate on the other side of the center line of the circuit substrate when the web of cleaning material is in contact with the circuit substrate.

14. Circuit substrate cleaning apparatus according to claim 4 , wherein the rollers translate relative to the circuit substrate and the plurality of pairs of capstans.

Assignments (24)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NXP B.V. PREVIOUSLY RECORDED ON REEL 020078 FRAME 0899. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNEES ARE KONINKLIJKE PHILIPS ELECTRONICS N.V. AND FREESCALE SEMICONDUCTOR, INC.. Recorded Jun 5, 2013
From: KORDIC, SRDJAN; COOPER, KEVIN E.; PETITDIDIER, SEBASTIEN; FARKAS, JANOS; VAN-HASSEL, JAN
To: FREESCALE SEMICONDUCTOR, INC.; KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 030558/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 31, 2013
From: NXP B.V.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030520/0650 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024085/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2009
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 022597/0832 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2007
From: KORDIC, SRDJAN; COOPER, KEVIN E; PETITDIDIER, SEBASTIEN; FARKAS, JANOS; VAN-HASSEL, JAN
To: NXP B.V.
Reel/Frame 020078/0899 →