IP Library Granted Patent US 7,915,740
Granted Patent B2
US 7,915,740 · App. 11/923,335 · Granted Mar 29, 2011

Semiconductor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,915,740
App. No.
11/923,335
Granted
Mar 29, 2011
Kind
B2
Abstract

Provided is a semiconductor device that can reduce the resistance in a horizontal direction of a substrate. A current path in a horizontal direction of a substrate is formed in a direction along a short side of the substrate (chip). For example, adopted is a layout in which an element region on an input terminal side and a current extraction region on an output terminal side are aligned along the short side of the chip. Furthermore, a first bump electrode and a second bump electrode, which are respectively connected to the input terminal and the output terminal, are arranged along the short side of the chip. Thus, the current path in the substrate in the horizontal direction in the substrate is formed to have a wide width and a short length. Accordingly, the resistance of the substrate in the horizontal direction is reduced.

Claims (21)

1. A semiconductor device comprising:

a rectangular semiconductor substrate;

a discrete semiconductor element disposed on a first portion of a first primary plane of the rectangular semiconductor substrate;

a first electrode disposed on the first portion of the first primary plane; and

a second electrode disposed on a second portion of the first primary plane,

wherein the device is configured to form a current path comprising a first path from the first electrode to a first part of the substrate below the first electrode, a second path from the first part to a second part of the substrate below the second electrode, and a third path from the second part of the substrate to the second electrode, and

the second path is parallel to a short side of the rectangular semiconductor substrate.

2. The semiconductor device of claim 1 , further comprising a first contact hole connecting the first electrode and the first portion of the first primary plane and a second contact hole connecting the second electrode and the second portion of the first primary plane, wherein the first contact hole and the second contact hole are disposed parallel to the short side.

3. The semiconductor device of claim 1 , further comprising a first bump electrode disposed on the first electrode and a second bump electrode disposed on the second electrode.

4. The semiconductor device of claim 3 , wherein the first and second bump electrodes are disposed parallel to the short side.

5. The semiconductor device of claim 1 , further comprising a circuit board on which the rectangular semiconductor substrate is mounted d by a flip chip mounting.

6. A semiconductor device comprising:

a rectangular semiconductor substrate comprising two long sides and two short sides;

an elongated input electrode disposed on a first surface of the substrate along one of the long sides of the substrate so that a direction of the elongation of the input electrode is parallel to the long sides; and

an output electrode disposed on the first surface of the substrate between the elongated input electrode and another of the long sides of the substrate,

wherein the rectangular semiconductor substrate comprises a high impurity substrate and a low impurity layer formed on the high impurity substrate,

the input electrode and the output electrode are electrically connected through the high impurity substrate,

a length of the output electrode in the direction of the elongation of the input electrode is smaller than a length of the input electrode in the direction of the elongation of the input electrode.

7. The semiconductor device of claim 1 , wherein no discrete semiconductor element is disposed on the second portion of the first primary plane.

8. The semiconductor device of claim 1 , wherein the second electrode is smaller than the first electrode.

9. The semiconductor device of claim 6 , wherein the length of the output electrode in the direction of the elongation of the input electrode is smaller than half of the length of the input electrode in the direction of the elongation of the input electrode.

Assignments (9)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR NAME PREVIOUSLY RECORDED AT REEL: 033813 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 21, 2015
From: SYSTEM SOLUTIONS CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 034816/0510 →
CHANGE OF NAME Recorded Dec 3, 2014
From: SANYO SEMICONDUCTOR CO., LTD
To: SYSTEM SOLUTIONS CO., LTD.
Reel/Frame 034537/0044 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2014
From: SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033813/0420 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2008
From: YOSHIDA, TETSUYA
To: SANYO ELECTRIC CO., LTD.; SANYO SEMICONDUCTOR CO., LTD.
Reel/Frame 020330/0341 →