IP Library Granted Patent US 7,596,018
Granted Patent B2
US 7,596,018 · App. 11/929,495 · Granted Sep 29, 2009

Spin memory with write pulse

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Quick Facts
Patent No.
US 7,596,018
App. No.
11/929,495
Granted
Sep 29, 2009
Kind
B2
Abstract

An electron spin-based memory cell has a first ferromagnetic layer with a changeable magnetization state and a second ferromagnetic layer with a fixed magnetization state. A non-volatile logic state of such cell is dependent on a relationship between said first ferromagnetic layer and said second ferromagnetic layer, including whether said changeable magnetization state and said fixed magnetization state are parallel or antiparallel. To facilitate writing, the cell is adapted carry at least a portion of a write pulse.

Claims (38)

1. An electron spin-based memory cell comprising:

a first ferromagnetic layer which has a changeable magnetization state;

a second ferromagnetic layer with a fixed magnetization state;

wherein the electron spin-based memory cell has a non-volatile logic state that is dependent on a relationship between said first ferromagnetic layer and said second ferromagnetic layer, including whether said changeable magnetization state and said fixed magnetization state are parallel or antiparallel;

further wherein the electron spin-based memory cell is adapted to carry at least a portion of a write pulse associated with a switching field that is applied to the cell for changing said non-volatile logic state.

2. The electron spin-based memory cell of claim 1 , wherein said cell is situated on a silicon substrate and is in a stacked arrangement over a second electron spin-based memory cell.

3. The electron spin-based memory cell of claim 1 , further including a low transmission barrier situated between said first ferromagnetic layer and said second ferromagnetic layer.

4. The electron spin-based memory cell of claim 1 , wherein said write pulse can have a single polarity.

5. The electron spin-based memory cell of claim 1 , wherein said write pulses can have at least two polarities.

6. The electron spin-based memory cell of claim 1 , wherein said cell is situated above an isolation element including a semiconductor based transistor and is separated by an insulation layer therefrom.

7. The electron spin-based memory cell of claim 1 wherein said cell is part of an electron spin-based memory array.

8. The electron spin-based memory cell of claim 1 wherein said electron spin-based memory cell is coupled in parallel by a read line to a second electron spin-based memory cell.

9. The electron spin-based memory cell of claim 6 , wherein said isolation element is coupled to a bit line, and further including a second semiconductor based transistor isolation element coupling said electron spin-based memory cell to a bit reference line.

10. The electron spin-based memory cell of claim 1 , further including a read line coupled to read data from said cell, and at least one separate write line coupled to write data to said cell.

11. An electron spin-based memory cell situated on silicon substrate comprising:

a first ferromagnetic layer which has a changeable magnetization state;

a second ferromagnetic layer with a fixed magnetization state;

wherein the electron spin-based cell has a non-volatile logic state which is dependent on a relationship between said first ferromagnetic layer and said second ferromagnetic layer, including whether said changeable magnetization state and said fixed magnetization state are parallel or antiparallel;

further wherein the electron spin-based is adapted to carry at least a portion of a write pulse associated with a switching field applied to the cell;

a semiconductor isolation element coupled to the electron spin-based memory cell adapted to isolate data stored in the cell, which isolation element includes a transistor situated in the silicon substrate.

12. The electron spin-based memory cell of claim 11 wherein said cell is part of an electron spin-based memory array.

13. The electron spin-based memory cell of claim 11 , wherein said cell is situated in a stacked arrangement over a second electron spin-based memory cell.

14. The electron spin-based memory cell of claim 11 , wherein said write pulse can have a single polarity.

15. The electron spin-based memory cell of claim 11 , wherein said write pulse can have at least two polarities.

16. A magnetoelectronic memory cell comprising:

an electron spin-based memory element situated on a silicon based substrate;

said electron spin-based memory element including:

i) a first ferromagnetic layer with a changeable magnetization state;

ii) a second ferromagnetic layer with a non-changeable magnetization state;

iii) a low transmission barrier interface coupled to at least said first ferromagnetic layer;

further wherein the electron spin-based memory element is adapted to carry at least a portion of a write pulse associated with a switching field applied to the cell.

17. The magnetoelectronic memory cell of claim 16 , further including a second low transmission barrier interface associated with said second ferromagnetic layer.

18. The magnetoelectronic memory cell of claim 16 wherein said second ferromagnetic layer is a bilayer including both a first ferromagnetic conductor layer and a second nonmagnetic conductor layer, which second nonmagnetic conductor layer is used to control a magnetic behavior of said first ferromagnetic conductor layer.

19. The memory cell of claim 16 , further including a read line coupled to read data from said electron spin-based memory element, and a separate write line coupled to write data to said electron spin-based memory element.

20. The electron spin-based memory cell of claim 16 wherein said cell is part of an electron spin-based memory array.

21. The electron spin-based memory cell of claim 16 , wherein said cell is situated in a stacked arrangement over a second electron spin-based memory cell.

22. The electron spin-based memory cell of claim 16 , wherein said write pulse can have a single polarity.

23. The electron spin-based memory cell of claim 16 , wherein said write pulse can have at least two polarities.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Jul 23, 2025
From: THE BANK OF NOVA SCOTIA
To: SEAGATE TECHNOLOGY PUBLIC LIMITED COMPANY; SEAGATE TECHNOLOGY; SEAGATE TECHNOLOGY HDD HOLDINGS; I365 INC.; SEAGATE TECHNOLOGY LLC; SEAGATE TECHNOLOGY INTERNATIONAL; SEAGATE HDD CAYMAN; SEAGATE TECHNOLOGY (US) HOLDINGS, INC.
Reel/Frame 072193/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2019
From: SEAGATE TECHNOLOGY LLC
To: EVERSPIN TECHNOLOGIES, INC.
Reel/Frame 050483/0188 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Jul 19, 2013
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT AND SECOND PRIORITY REPRESENTATIVE
To: SEAGATE TECHNOLOGY LLC; EVAULT INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY INTERNATIONAL; SEAGATE TECHNOLOGY US HOLDINGS, INC.
Reel/Frame 030833/0001 →
SECURITY AGREEMENT Recorded Mar 24, 2011
From: SEAGATE TECHNOLOGY LLC
To: THE BANK OF NOVA SCOTIA, AS ADMINISTRATIVE AGENT
Reel/Frame 026010/0350 →