Dynamic mask memory for serial scan testing
View Patent ↗A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs.
1. An apparatus comprising a sequential failure mask store coupled to a new failure filter, wherein the new failure filter receives a data stream emitted from a data state comparator and a failure mask data stream emitted from the sequential failure mask store wherein the failure mask data stream masks previously discovered failures in test pattern fail data and wherein the new failure filter transmits an error capture memory input data stream, the error capture memory input data stream providing an input to the sequential failure mask store.
2. An apparatus comprising a sequential failure mask store coupled to a new failure filter, wherein the new failure filter receives a data stream emitted from a data state comparator, and a first failure mask data stream emitted from the sequential failure mask store, wherein the first failure mask data stream masks previously discovered failures in test pattern fail data, and wherein the new failure filter transmits an error capture memory input data stream, the error capture memory input data stream providing an input to a failure accumulator, wherein the failure accumulator is coupled to the sequential failure mask store to i) receive from the sequential failure mask store the first failure mask data stream and ii) transmit to the sequential failure mask store a second failure mask data stream.
3. The apparatus of claim 2 further comprising an input to the sequential failure mask store to initialize the contents and set the size of the store.
4. The apparatus of claim 2 further comprising an input to the sequential failure mask store to unload the contents as a cumulative failure data stream.
5. The apparatus of claim 2 further comprising an input to the sequential failure mask store to load the contents with a saved failure mask data stream.
6. A new failure filter comprising means for receiving a sequential failure mask data stream that masks previously discovered failures in test pattern fail data, means for receiving a data state comparator data stream, means for synchronizing the sequential failure mask data stream and the data state comparator data stream, means for transmitting a Fail data value when a data state comparator value in the data state comparator data stream is Fail and a failure mask data value in the sequential failure mask data stream is unmasked, and means for transmitting a Pass data value for all other combinations of data state comparator values and failure mask data values.
7. A failure accumulator comprising means for receiving a first sequential failure mask data stream that masks previously discovered failures in test pattern fail data and means for receiving an error capture memory input data stream and means for transmitting a second sequential failure mask data stream as follows:
Mask if an error capture memory input value is Fail,
Mask if a first sequential failure mask data value is Mask,
Unmask if an error capture memory input value is Pass and first sequential failure mask data value is Unmask.