IP Library Granted Patent US 8,686,526
Granted Patent B2
US 8,686,526 · App. 11/942,506 · Granted Apr 1, 2014

Semiconductor device and method of manufacturing the same

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Quick Facts
Patent No.
US 8,686,526
App. No.
11/942,506
Granted
Apr 1, 2014
Kind
B2
Abstract

The invention is directed to providing a semiconductor device receiving a blue-violet laser, of which the reliability and yield are enhanced. A device element converting a blue-violet laser into an electric signal is formed on a front surface of a semiconductor substrate. An optically transparent substrate is attached to the front surface of the semiconductor substrate with an adhesive layer being interposed therebetween. The adhesive layer contains transparent silicone. Since the front surface of the device element is covered by the optically transparent substrate, foreign substances are prevented from adhering to the front surface of the device element. Furthermore, the adhesive layer is covered by the optically transparent substrate. This prevents the adhesive layer from being exposed to outside air, thereby preventing the degradation of the adhesive layer 6 due to a blue-violet laser.

Claims (19)

1. A semiconductor device comprising:

a blue-violet laser emitting device emitting laser light having a wavelength between 400 and 415 nm;

a semiconductor substrate comprising a device element formed on a front surface thereof, the device element being configured to receive the laser light emitted from the blue-violet laser emitting device and to convert the received laser light into an electric signal;

a transparent substrate attached to the front surface of the semiconductor substrate so as to cover the device element; and

an adhesive layer comprising a transparent silicone and attaching the transparent substrate to the front surface of the semiconductor substrate, the adhesive layer covering the device element.

2. The semiconductor device of claim 1 , wherein the adhesive layer comprises an epoxy silicone and an organosilane.

3. The semiconductor device of claim 1 , further comprising a protection layer covering a side surface of the adhesive layer.

4. The semiconductor device of claim 3 , further comprising a pad electrode electrically connected to the device element and a wiring layer electrically connected to the pad electrode and covering a side and a back surface of the semiconductor substrate, wherein the protection layer covers the side and the back surface of the semiconductor substrate and has an opening in a portion of the back surface, and a conductive terminal is disposed in the opening so as to be electrically connected to the wiring layer.

5. The semiconductor device of claim 3 , further comprising a pad electrode electrically connected to the device element, wherein the protection layer covers a back surface of the semiconductor substrate and has an opening at the pad electrode, and a conductive terminal is disposed in the opening so as to be electrically connected to the pad electrode.

6. The semiconductor device of claim 3 , further comprising a pad electrode electrically connected to the device element, wherein the protection layer covers a back surface of the semiconductor substrate and has an opening at the pad electrode, and a conductive terminal is disposed in the opening so as to be electrically connected to the pad electrode.

7. The semiconductor device of claim 3 , wherein the transparent substrate comprises a slanting portion slanting from a surface of the transparent substrate attached to the front surface of the semiconductor substrate, and the protection layer covers the slanting portion.

8. The semiconductor device of claim 7 , further comprising a pad electrode electrically connected to the device element and a wiring layer electrically connected to the pad electrode and covering a side and a back surface of the semiconductor substrate, wherein the protection layer covers the side and the back surface of the semiconductor substrate and has an opening in a portion of the back surface, and a conductive terminal is disposed in the opening so as to be electrically connected to the wiring layer.

9. The semiconductor device of claim 7 , further comprising a pad electrode electrically connected to the device element, wherein the protection layer covers a back surface of the semiconductor substrate and has an opening at the pad electrode, and a conductive terminal is disposed in the opening so as to be electrically connected to the pad electrode.

10. The semiconductor device of claim 3 , wherein the adhesive layer comprises an epoxy silicone and an organosilane.

11. The semiconductor device of claim 10 , further comprising a pad electrode electrically connected to the device element and a wiring layer electrically connected to the pad electrode and covering a side and a back surface of the semiconductor substrate, wherein the protection layer covers the side and the back surface of the semiconductor substrate and has an opening in a portion of the back surface, and a conductive terminal is disposed in the opening so as to be electrically connected to the wiring layer.

12. The semiconductor device of claim 10 , further comprising a pad electrode electrically connected to the device element, wherein the protection layer covers a back surface of the semiconductor substrate and has an opening at the pad electrode, and a conductive terminal is disposed in the opening so as to be electrically connected to the pad electrode.

13. The semiconductor device of claim 7 , wherein the adhesive layer comprises an epoxy silicone and an organosilane.

14. The semiconductor device of claim 13 , further comprising a pad electrode electrically connected to the device element and a wiring layer electrically connected to the pad electrode and covering a side and a back surface of the semiconductor substrate, wherein the protection layer covers the side and the back surface of the semiconductor substrate and has an opening in a portion of the back surface, and a conductive terminal is disposed in the opening so as to be electrically connected to the wiring layer.

15. The semiconductor device of claim 13 , further comprising a pad electrode electrically connected to the device element, wherein the protection layer covers a back surface of the semiconductor substrate and has an opening at the pad electrode, and a conductive terminal is disposed in the opening so as to be electrically connected to the pad electrode.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2014
From: SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032022/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2008
From: KITAGAWA, KATSUHIKO; SHINOGI, HIROYUKI; ISHIBE, SHINZO; YAMADA, HIROSHI
To: SANYO ELECTRIC CO., LTD.; SANYO SEMICONDUCTOR CO., LTD.
Reel/Frame 020546/0994 →