IP Library Granted Patent US 8,435,389
Granted Patent B2
US 8,435,389 · App. 11/954,490 · Granted May 7, 2013

RF substrate bias with high power impulse magnetron sputtering (HIPIMS)

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Quick Facts
Patent No.
US 8,435,389
App. No.
11/954,490
Granted
May 7, 2013
Kind
B2
Abstract

An apparatus for generating sputtering of a target to produce a coating on a substrate with a current density on a cathode of a magnetron between 0.1 and 10 A/cm 2 is provided. The apparatus comprises a power supply that is operably connected to the magnetron and at least one capacitor is operably connected to the power supply. A first switch is also provided. The first switch operably connects the power supply to the magnetron to charge the magnetron and the first switch is configured to charge the magnetron according to a first pulse. An electrical bias device is operably connected to the substrate and configured to apply a substrate bias.

Claims (11)

1. A method for generating sputtering of a target to produce a coating on a substrate with a current density on a cathode of a magnetron between 0.1 and 10 A/cm 2 comprising:

operating a power supply to charge the magnetron;

administering a first pulse to the magnetron;

discharging the magnetron according to a bias pulse from a RF electrical bias device operably connected to the substrate; and

synchronizing a frequency and a time delay of the first pulse with the bias pulse using a synchronization device operably connected to the power supply, wherein the bias pulse is administered before the first pulse with the time delay between 0.1 μs to 500 μs.

2. The method according to claim 1 , wherein a duty cycle for the first pulse is between 0.01% and 20%, and the frequency in the range of 1 Hz to 20 kHz.

3. The method according to claim 1 , wherein a duty cycle for the first pulse is between 2% and 50%.

4. The method according to claim 1 , further comprising:

a matching unit matching a first impedance of a plasma with a second impedance of the substrate, wherein the matching unit is operably connected between RF electrical bias device and a chuck that holds the substrate.

5. The method according to claim 4 , further comprising:

a monitoring device monitoring an RF self-bias at the chuck, wherein the monitoring device is operably connected to the chuck that holds the substrate and the chuck is operably connected between the RF electrical bias device and the substrate.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2019
From: EVATEC ADVANCED TECHNOLOGIES AG (FORMALLY KNOWN AS OERLIKON ADVANCED TECHNOLOGIES AG)
To: EVATEC AG
Reel/Frame 048566/0808 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2014
From: OC OERLIKON BALZERS AG
To: OERLIKON ADVANCED TECHNOLOGIES AG
Reel/Frame 032001/0531 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2014
From: OC OERLIKON BALZERS AG
To: OERLIKON ADVANCED TECHNOLOGIES AG
Reel/Frame 031990/0679 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2008
From: WEICHART, JURGEN; KADLEC, STANISLAV
To: OC OERLIKON BALZERS AG
Reel/Frame 020369/0294 →