Processes for curing silicon based low-k dielectric materials
Processes for curing silicon based low k dielectric materials generally includes exposing the silicon based low k dielectric material to ultraviolet radiation in an inert atmosphere having an oxidant in an amount of about 10 to about 500 parts per million for a period of time and intensity effective to cure the silicon based low k dielectric material so to change a selected one of chemical, physical, mechanical, and electrical properties and combinations thereof relative to the silicon based low k dielectric material prior to the ultraviolet radiation exposure. Also disclosed herein are silicon base low k dielectric materials substantially free of sub-oxidized SiO species.
1. A process for curing silicon based low k dielectric materials, the process comprising:
exposing the silicon based low k dielectric material to ultraviolet radiation in an inert atmosphere having an oxidant in an amount and for a period of time and intensity effective to cure the silicon based low k dielectric material so as to change a selected one of chemical, physical, mechanical, and electrical properties and combinations thereof relative to the silicon based low k dielectric material prior to the ultraviolet radiation exposure, wherein exposing the silicon based low k dielectric material to the ultraviolet radiation having the oxidant is effective to substantially prevent formation of sub-oxidized SiO species.
2. The process of claim 1 , wherein exposing the silicon based low k dielectric material to the ultraviolet radiation increases porogen removal efficiency relative to the ultraviolet radiation exposure of the silicon based low k dielectric material without the oxidant.
3. The process of claim 1 , wherein exposing the silicon based low k dielectric material to the ultraviolet radiation increases modulus relative to the ultraviolet radiation exposure of the silicon based low k dielectric material without the oxidant.
4. The process of claim 1 , wherein exposing the silicon based low k dielectric material to the ultraviolet radiation increases shrinkage relative to the ultraviolet radiation exposure of the silicon based low k dielectric material without the oxidant.
5. The process of claim 1 , wherein exposing the silicon based low k dielectric material to the ultraviolet radiation increases crosslinking density.
6. The process of claim 1 , wherein the period of time decreases to obtain substantially the same or greater than an atomic percent of Q groups than the ultraviolet radiation exposure of the silicon based low k dielectric material without the oxidant.
7. The process of claim 1 , wherein exposing the silicon based low k dielectric material to the ultraviolet radiation is in an amount and intensity effective to remove water.
8. The process of claim 1 , wherein the inert atmosphere comprises the oxidant in an amount of 20 to 100 ppm.
9. The process of claim 1 , wherein the silicon based low k dielectric is porous.
10. The process of claim 1 , wherein the silicon based low k dielectric is selected from a group consisting of hydrogen silsesquioxane (HSQ) dielectric materials, methylsilsesquioxane (MSQ) dielectric materials, hydrogenated silicon oxy-carbide (SiCOH) dielectric materials.
11. The process of claim 1 , wherein the oxidant is pulsed.
12. The process of claim 1 , wherein the oxidant is oxygen gas.
13. The process of claim 1 , wherein the oxidant is a gas selected from the group consisting of O2, O3, a nitrogen oxide, water vapor, a sulfur oxide, CO, CO2, NO, CxFyOz, wherein x is an integer from 1 to 6, y is an integer from 1 to 14, and z is an integer from 1 to 4, and combinations thereof.
14. A process for reducing formation of sub-oxidized species in silicon based low k dielectric materials during an ultraviolet radiation curing process, the process comprising:
providing an inert atmosphere;
providing an oxidant in the inert atmosphere during ultraviolet radiation exposure of the silicon based low k dielectric material; and
exposing the silicon based dielectric material to ultraviolet radiation, wherein the amount of oxidant is effective to reduce sub-oxidized SiO species formed relative to ultraviolet radiation exposure in the absence of the oxidant.
15. The process of claim 14 , wherein providing the oxidant comprises partially evacuating a process chamber to form the inert atmosphere therein.
16. The process of claim 14 , wherein providing the oxidant comprises introducing the oxidant as a gas into the inert atmosphere.
17. The process of claim 16 , wherein introducing the oxidant is pulsed.
18. The process of claim 16 , wherein introducing the oxidant is continuous.
19. The process of claim 14 , wherein the oxidant is a gas selected from the group consisting of O2, O3, a nitrogen oxide, water vapor, a sulfur oxide, CO, CO2, NO, CxFyOz, wherein x is an integer from 1 to 6, y is an integer from 1 to 14, and z is an integer from 1 to 4, and combinations thereof.
20. The process of claim 14 , wherein the silicon based low k dielectric is selected from a group consisting of hydrogen silsesquioxane (HSQ) dielectric materials, methylsilsesquioxane (MSQ) dielectric materials, hydrogenated silicon oxy-carbide (SiCOH) dielectric materials.