Scalable embedded DRAM array
View Patent ↗A method and apparatus for scaling an embedded DRAM array from a first process to a second process, wherein the scaling involves reducing the linear dimensions of features by a constant scale factor. From the first process to the second process, DRAM cell capacitor layout area is reduced by the square of the scale factor, while cell capacitance is reduced by the scale factor. The voltage used to supply the logic transistors is scaled down from the first process to the second process. However, the voltage used to supply the sense amplifiers remains constant in both processes. Thus, in an embedded DRAM array of the second process, sense amplifiers are supplied by a greater voltage than the logic transistors. This allows the sensing voltage of DRAM cells to be maintained from one process generation to another, while allowing memory size to scale with the square of the process scale factor.
1. A method for scaling an embedded DRAM array from a first process to a second process, wherein the DRAM array includes a plurality of DRAM cells and a plurality of sense amplifier transistors, the method comprising:
reducing the linear dimensions of features from the first process to the second process by a scaling factor; and
reducing the layout area of a capacitor structure present in each of the DRAM cells from the first process to the second process, wherein a capacitance associated with each DRAM cell is scaled down by the scaling factor, and the area of each DRAM cell is scaled down by the square of the scaling factor.
2. The method of claim 1 , further comprising:
reducing a first supply voltage from the first process to the second process, wherein the first supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array; and
maintaining a constant sense amplifier supply voltage from the first process to the second process, wherein the sense amplifier supply voltage is used to operate the sense amplifier transistors of the DRAM array.
3. The method of claim 1 , further comprising:
reducing a first supply voltage in the first process to a second supply voltage in the second process, wherein the first supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array in the first process, and wherein the second supply voltage is used to operate logic transistors fabricated on the same chip as the embedded DRAM array in the second process; and
using a third supply voltage, greater than the second supply voltage, to operate sense amplifier transistors of the embedded DRAM array in the second process.