IP Library Granted Patent US 7,499,358
Granted Patent B2
US 7,499,358 · App. 12/070,499 · Granted Mar 3, 2009

Method and circuitry to generate a reference current for reading a memory cell, and device implementing same

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Quick Facts
Patent No.
US 7,499,358
App. No.
12/070,499
Granted
Mar 3, 2009
Kind
B2
Abstract

There are many inventions disclosed herein. In one aspect, the present inventions are directed to methods and circuitry to control, adjust, determine and/or modify the absolute and/or relative positioning or location (i.e., absolute or relative amount) of reference current which is employed by read circuitry to read the data state of a memory cell during a read operation of one or more memory cells. The control, adjustment, determination and/or modification of the reference current levels may be implemented using many different, distinct and/or diverse techniques and circuitry, including both analog and digital techniques and circuitry.

Claims (32)

1. A method of controlling a reference current generation circuit that generates a predetermined reference current which is used by read circuitry during a read operation to data a data state of one or more memory cells, wherein the reference current generation circuit includes (i) a plurality of reference cell circuits including a first reference cell circuit and a second reference cell circuit, each reference cell circuit including a plurality of reference cells, and (ii) a reference current driver, the method comprising:

programming at least one of the reference cells of the first reference cell circuit to one of a plurality of predetermined states;

programming at least one of the reference cells of the second reference cell circuit to one of a plurality of predetermined states, wherein a majority of the reference cells of the reference cell circuits is programmed to a second state and a minority of the reference cells of the reference cell circuits is programmed to a first state; and

outputting the predetermined reference current, wherein the amount of the predetermined reference current is associated with the programmed states of the reference cells of the plurality of reference cell circuits.

2. The method of claim 1 wherein programming the at least one of the reference cells of the first reference cell circuit to one of a plurality of predetermined states includes storing a first charge in a body region of a transistor of the at least one reference cell of the first reference cell circuit.

3. The method of claim 1 wherein programming the at least one of the reference cells of the first reference cell circuit to one of a plurality of predetermined states includes programming the at least one of the reference cells of the first reference cell circuit during an initialization sequence.

4. The method of claim 1 further including re-programming the at least one of the reference cells of the first reference cell circuit to a different one of the plurality of predetermined states.

5. The method of claim 4 further including re-programming the at least one of the reference cells of the second reference cell circuit to a different one of the plurality of predetermined states.

6. The method of claim 1 further including programming at least one reference cell of a third reference cell circuit to one of a plurality of predetermined states wherein the third reference cell circuit is one of the plurality of reference cell circuits.

7. The method of claim 1 wherein at least one reference cell of one of the plurality of reference cell circuits is fixed in a predetermined state.

8. A method of controlling a reference current generation circuit to generate a predetermined reference current which is used by read circuitry during a read operation to data a data state of one or more memory cells, wherein the reference current generation circuit includes (i) a plurality of reference cell circuits including a first reference cell circuit and a second reference cell circuit, each reference cell circuit including a plurality of reference cells, and (ii) a reference current driver to generate the predetermined reference current, the method comprising:

programming each reference cell of the first reference cell circuit to one of a plurality of predetermined states;

programming each reference cell of the second reference cell circuit to one of a plurality of predetermined states, wherein a majority of the reference cells of the reference cell circuits is programmed to a second state and a minority of the reference cells of the reference cell circuits is programmed to a first state; and

outputting the predetermined reference current, wherein the amount of predetermined reference current is associated with the programmed states of the reference cells of the plurality of reference cell circuits.

9. The method of claim 8 wherein programming each reference cell of the first reference cell circuit to one of a plurality of predetermined states includes storing a first charge in a body region of a transistor of each reference cell of the first reference cell circuit.

10. The method of claim 8 wherein programming each reference cell of the first reference cell circuit to one of a plurality of predetermined states includes programming each reference colt of the first reference cell circuit during an initialization sequence.

11. The method of claim 8 further including re-programming at least one of the inference cells of the first reference cell circuit to a different one of the plurality of predetermined states.

12. The method of claim 11 further including re-programming all of the reference cells of the first reference cell circuit to a different one of the plurality of predetermined states.

13. The method of claim 11 further including re-programming at least one of the reference cells of the second reference cell circuit to a different one of the plurality of predetermined states.

14. The method of claim 8 further including re-balancing a read margin by programming at least one of the reference cells of the first reference cell circuit to a different one of the plurality of predetermined states.

15. The method of claim 8 further including re-balancing a read margin by programming at least one of the reference cells of the first reference cell circuit to one of the plurality of predetermined states.

16. The method of claim 5 further including re-balancing a read margin by:

programming at least one of the reference cells of the first reference cell circuit to one of the plurality of predetermined states; and

programming at least one of the reference cells of the second reference cell circuit to one of the plurality of predetermined states.

17. The method of claim 5 further including programming at least one reference cell of a third reference cell circuit to one of a plurality of predetermined states wherein the third reference cell circuit is one of the plurality of reference cell circuits.

18. The method of claim 8 wherein at least one reference cell of one of the plurality of reference cell circuits is fixed in a predetermined state.

19. A method of generating a predetermined reference current which is used by read circuitry during a read operation to data a data state of one or more memory cells, wherein predetermined reference current is generated by a reference current generation circuit having (i) a plurality of reference cell circuits including a first reference cell circuit and a second reference cell circuit, each reference cell circuit including a plurality of reference cells, and (ii) a reference current driver, the method comprising:

storing a control word in memory circuitry;

programming one or more reference cells of the first reference cell circuit to one of a plurality of predetermined states in accordance with the control word;

programming one or more reference cells of the second reference cell circuit to one of a plurality of predetermined states in accordance with the control word, wherein a majority of the reference cells of the reference cell circuits is programmed to a second state and a minority of the reference cells of the reference cell circuits is programmed to a first state; and

outputting the predetermined reference current, wherein the amount of the predetermined reference current is associated with the programmed states of the reference cells of the plurality of reference cell circuits.

20. The method of claim 19 wherein programming the at least one of the reference cells of the first reference cell circuit to one of a plurality of predetermined states includes storing a first charge in a body region of a transistor of the at least one reference cell of the first reference cell circuit.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2011
From: INNOVATIVE SILICON ISI S.A.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 025850/0798 →