IP Library Granted Patent US 7,622,960
Granted Patent B2
US 7,622,960 · App. 12/073,409 · Granted Nov 24, 2009

Metastable-resistant phase comparing circuit

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Quick Facts
Patent No.
US 7,622,960
App. No.
12/073,409
Granted
Nov 24, 2009
Kind
B2
Abstract

A phase comparing circuit includes a first storage circuit for reading an external clock signal based on a control clock signal; first and second inverters for inverting a signal from the first storage circuit based respectively on first and second threshold levels; third and fourth inverters for inverting respective signals output from the first and second inverters; a delay circuit for delaying the control clock signal by a specific time; a coincidence control circuit for setting the delayed control clock signal to be active when the signals from the third and fourth inverters coincide with each other, and setting it to be inactive when the signals from the third and fourth inverters do not coincide with each other; and a second storage circuit for reading a signal output form the first storage circuit when the delayed control clock signal is active, and outputting the read signal as the control signal.

Claims (15)

1. A phase comparing circuit for comparing phases between an external clock signal and a control clock signal, and outputting a control signal based on a result of the comparison, the phase comparing circuit comprising:

a first storage circuit for reading the external clock signal in accordance with the control clock signal;

a first inverter circuit for inverting a signal output from the first storage circuit based on a first threshold level;

a second inverter circuit for inverting a signal output from the first storage circuit based on a second threshold level;

a third inverter circuit for inverting a signal output from the first inverter circuit;

a fourth inverter circuit for inverting a signal output from the second inverter circuit;

a delay circuit for delaying the control clock signal by a specific time and outputting the delayed control clock signal;

a coincidence control circuit for setting the delayed control clock signal to be active when the signals output from the third and fourth inverter circuits coincide with each other, and setting it to be inactive when the signals output from the third and fourth inverter circuits do not coincide with each other; and

a second storage circuit for reading a signal output form the first storage circuit when the delayed control clock signal is active, and outputting the read signal as the control signal.

2. The phase comparing circuit in accordance with claim 1 , wherein the third and fourth inverter circuits each have a hysteresis characteristic.

3. The phase comparing circuit in accordance with claim 1 , wherein the coincidence control circuit includes:

a comparison circuit for comparing the signals output from the third and fourth inverter circuits, determining whether the signals coincide with each other, and outputting a determined result;

a latch circuit for reading a signal output from the comparison circuit, and outputting the read signal in accordance with the delayed control clock signal; and

a gate circuit which is open or closed in accordance with a signal output from the latch circuit.

4. The phase comparing circuit in accordance with claim 1 , wherein the first and second inverter circuits are each formed by a current mirror amplifier which inverts an input signal based on a reference voltage generated by a resistive division.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2014
From: ELPIDA MEMORY, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 032645/0422 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2008
From: TAKAI, YASUHIRO
To: ELPIDA MEMORY, INC.
Reel/Frame 020651/0341 →