IP Library Granted Patent US 7,932,616
Granted Patent B2
US 7,932,616 · App. 12/098,248 · Granted Apr 26, 2011

Semiconductor device sealed in a resin section and method for manufacturing the same

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Quick Facts
Patent No.
US 7,932,616
App. No.
12/098,248
Granted
Apr 26, 2011
Kind
B2
Abstract

A semiconductor device includes a first semiconductor chip having a pad electrode formed on an upper surface thereof; a resin section sealing the first semiconductor chip with the upper surface and a side surface of the first semiconductor chip being covered and a lower surface of the first semiconductor chip being exposed; a columnar electrode communicating between the upper surface and the lower surface of the resin section with the upper surface and the lower surface of the columnar electrode being exposed on the resin section and at least a part of the side surface of the columnar electrode being covered; and a bonding wire connecting the pad electrode and the columnar electrode with a part of the bonding wire being embedded in the columnar electrode as one end of the bonding wire being exposed on the lower surface of the columnar electrode and the remaining part of the bonding wire being covered with the resin section, and a method for manufacturing the same.

Claims (16)

1. A semiconductor device comprising:

a first semiconductor chip having a pad electrode formed on an upper surface thereof;

a resin section sealing the first semiconductor chip with the upper surface and a side surface of the first semiconductor chip being covered and a lower surface of the first semiconductor chip being exposed;

a columnar electrode communicating between an upper surface and a lower surface of the resin section with an upper surface and a lower surface of the columnar electrode being exposed on the resin section and at least a part of the side surface of the columnar electrode being covered; and

a bonding wire connecting the pad electrode and the columnar electrode with a portion of a length of the bonding wire embedded in the columnar electrode so that one end of the bonding wire is exposed on the lower surface of the columnar electrode and a remaining portion of the length of the bonding wire is covered with the resin section.

2. The semiconductor device according to claim 1 , wherein the side surface of the columnar electrode is surrounded by the resin section.

3. The semiconductor device according to claim 1 , wherein an outer surface of the columnar electrode is exposed on the resin section.

4. The semiconductor device according to claim 1 , further comprising a metal film formed on the upper surface and the lower surface of the columnar electrode.

5. The semiconductor device according to claim 1 , further comprising a second semiconductor chip flip-chip bonded on the first semiconductor chip with a lower surface and a side surface of the second semiconductor chip being covered with the resin section and an upper surface of the second semiconductor chip being exposed on the resin section.

6. The semiconductor device according to claim 1 , wherein the columnar electrode is made of copper or solder.

7. The semiconductor device according to claim 1 , wherein the first semiconductor chip is provided in plurality and such first semiconductor chips are stacked so as to superpose the columnar electrodes for the first semiconductor chips above and below.

8. A semiconductor device comprising:

a first semiconductor chip having a pad electrode formed on an upper surface thereof;

a resin section sealing the first semiconductor chip with the upper surface and a side surface of the first semiconductor chip being covered and a lower surface of the first semiconductor chip being exposed;

a first and second columnar electrodes communicating between an upper surface and a lower surface of the resin section with an upper surface and a lower surface of each of the first and second columnar electrodes being exposed on the resin section and at least a part of the side surface of each of the first and second columnar electrodes being covered; and

a first and second bonding wires connecting the pad electrode and the first and second columnar electrodes, respectively, with a portion of a length of each of the first and second bonding wires embedded in the first and second columnar electrodes, respectively, so that one end of each of the first and second bonding wires is exposed on the lower surface of the first and second columnar electrodes, respectively, and a remaining portion of the length of each of the first and second bonding wires is covered with the resin section.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Oct 28, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 050896/0366 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036050/0174 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
RELEASE OF SECURITY INTEREST Recorded Mar 13, 2015
From: BARCLAYS BANK PLC
To: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY LLC
Reel/Frame 035201/0159 →
SECURITY AGREEMENT Recorded Jun 4, 2010
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 024522/0338 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2008
From: MEGURO, KOUICHI
To: SPANSION LLC
Reel/Frame 021639/0284 →