Variable-ratio double-deflection beam blanker
View Patent ↗The invention provides methods for conjugate blanking of a charged particle beam within a charged particle column using a beam blanker. The beam blanker comprises a first deflector, a second deflector and a blanking aperture, the first deflector being positioned between a gun lens and a main lens, the second deflector being positioned between the first deflector and the main lens, the blanking aperture being positioned between the second deflector and the main lens, and the first deflector, the second deflector and the blanking aperture being aligned on the optical axis of the column. A method according to the invention comprises the steps of: configuring electron optical elements of said charged particle column to form a beam in the column either with or without a crossover; configuring the main lens to focus the beam formed by the gun lens onto a substrate plane; deflecting the beam with a first deflector in a first direction; and deflecting the beam with a second deflector in a second direction onto the blanking aperture, wherein the first direction is parallel or anti-parallel to the second direction; and wherein the image at the substrate plane does not move during blanking.
1. A method of blanking a charged particle beam within a charged particle column using a beam blanker, said beam blanker comprising a first deflector, a second deflector and a blanking aperture, said first deflector being positioned between a gun lens and a main lens, said second deflector being positioned between said first deflector and said main lens, said blanking aperture being positioned between said second deflector and said main lens, said first deflector, said second deflector and said blanking aperture being aligned on the optical axis of said column, said method comprising:
configuring said column such that no charged particle beam cross-over is formed in said column;
configuring said main lens to form an image of a virtual source of said charged particle beam at a substrate plane;
deflecting said beam with a first deflector in a first direction; and
deflecting said beam with a second deflector in a second direction onto said blanking aperture, wherein said first direction is antiparallel to said second direction;
wherein said image at said substrate plane does not move during blanking.
2. A method as in claim 1 , wherein said charged particle beam in said beam blanker is neither substantially convergent nor substantially divergent.
3. A method as in claim 1 , wherein said first deflector and said second deflector are electrostatic deflectors.
4. A method as in claim 3 , wherein said first deflector and said second deflector are parallel plate electrostatic deflectors.
5. A method as in claim 1 , further comprising executing a set-up routine for determining excitations of said first and second deflectors required to provide conjugate blanking of said charged particle beam, said routine comprising:
(a) applying a time varying signal to said deflectors in addition to said deflector excitations, wherein said signal is not so large as to cause said beam to be blanked;
(b) monitoring said image at said substrate plane;
(c) adjusting deflector excitations;
(d) monitoring said image at said substrate plane;
(e) repeating steps (c) and (d) until movement of said image at said substrate plane is measured to be below a preset level.
6. A method as in claim 5 , wherein said deflector excitations are voltages.
7. A method of blanking a charged particle beam within a charged particle column using a beam blanker, said beam blanker comprising a first deflector, a second deflector and a blanking aperture, said first deflector being positioned between a gun lens and a main lens, said second deflector being positioned between said first deflector and said main lens, said blanking aperture being positioned between said second deflector and said main lens, said first deflector, said second deflector and said blanking aperture being aligned on the optical axis of said column, said method comprising:
configuring said gun lens to form a cross-over in said charged particle beam between said gun lens and said main lens;
configuring said main lens to form an image at a substrate plane of said cross-over in said charged particle beam;
deflecting said beam with a first deflector in a first direction; and
deflecting said beam with a second deflector in a second direction onto said blanking aperture, wherein said first direction and said second direction lie along parallel lines;
wherein said image at said substrate plane does not move during blanking.
8. A method as in claim 7 , wherein said first deflector and said second deflector are electrostatic deflectors.
9. A method as in claim 8 , wherein said first deflector and said second deflector are parallel plate electrostatic deflectors.
10. A method as in claim 7 , wherein said charged particle beam has a cross-over between said gun lens and the mid-plane of said first deflector, wherein said first deflection direction is antiparallel to said second deflection direction.
11. A method as in claim 7 , wherein said charged particle beam has a cross-over between the mid-plane of said first deflector and the mid-plane of said second deflector, wherein said first deflection direction is parallel to said second deflection direction.
12. A method as in claim 7 , wherein said charged particle beam has a cross-over between the mid-plane of said second deflector and said main lens, wherein said first deflection direction is antiparallel to said second deflection direction.
13. A method as in claim 7 , further comprising executing a set-up routine for determining excitations of said first and second deflectors required to provide conjugate blanking of said charged particle beam, said routine comprising:
(a) applying a time varying signal to said deflectors in addition to said deflector excitations, wherein said signal is not so large as to cause said beam to be blanked;
(b) monitoring said image at said substrate plane;
(c) adjusting deflector excitations;
(d) monitoring said image at said substrate plane;
(e) repeating steps (c) and (d) until movement of said image at said substrate plane is measured to be below a preset level.
14. A method as in claim 13 , wherein said deflector excitations are voltages.